{"id":4934,"date":"2026-08-02T10:57:24","date_gmt":"2026-08-02T01:57:24","guid":{"rendered":"https:\/\/www.aem.imr.tohoku.ac.jp\/?page_id=4934"},"modified":"2026-08-02T11:57:02","modified_gmt":"2026-08-02T02:57:02","slug":"%e6%8a%80%e8%a1%93%e6%83%85%e5%a0%b1%ef%bc%88%e6%ba%96%e5%82%99%e4%b8%ad%ef%bc%89","status":"publish","type":"page","link":"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/%e6%8a%80%e8%a1%93%e6%83%85%e5%a0%b1%ef%bc%88%e6%ba%96%e5%82%99%e4%b8%ad%ef%bc%89\/","title":{"rendered":"Technical information (in preparation)"},"content":{"rendered":"\n
\n

Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version.<\/strong><\/p>\n<\/div><\/div>\n\n\n\n

This page is a summary of useful information when using our office (currently under preparation)<\/p>\n\n\n\n

How to use TEM<\/h4>\n\n\n\n
    \n
  1. JEM-2100plus<\/li>\n\n\n\n
  2. JEM-ARM200F<\/li>\n\n\n\n
  3. JEM-2000EXII<\/li>\n\n\n\n
  4. EM-002B<\/li>\n<\/ol>\n\n\n\n

    Training<\/h4>\n\n\n\n
      \n
    1. Sample attachment\/detachment<\/li>\n\n\n\n
    2. Boosting, beam output, irradiation system axis adjustment, pause, termination<\/li>\n\n\n\n
    3. Camera operation (display\/recording)<\/li>\n\n\n\n
    4. TEM: Medium and low magnification observation<\/li>\n\n\n\n
    5. TEM: DIFF1 (if orientation is not required)<\/li>\n\n\n\n
    6. TEM: DIFF2 (for orientation fine adjustment\/coarse grains)<\/li>\n\n\n\n
    7. TEM: DIFF3 (for important orientation\/coarse grains)<\/li>\n\n\n\n
    8. TEM: DIFF4 (NBD\/CBED)<\/li>\n\n\n\n
    9. STEM: Medium and low magnification observation<\/li>\n\n\n\n
    10. STEM\uff1aEDS<\/li>\n\n\n\n
    11. STEM\uff1aEELS<\/li>\n\n\n\n
    12. STEM: High-resolution observation 1 (fine particles, single atoms, no orientation required)<\/li>\n\n\n\n
    13. STEM: High-resolution observation 2 (bulk crystal sample\/required orientation)<\/li>\n<\/ol>\n\n\n\n

      Specimen preparation related<\/h4>\n\n\n\n
        \n
      1. Ion milling (plane)<\/li>\n\n\n\n
      2. Ion milling (cross section)<\/li>\n\n\n\n
      3. Ion slicer<\/li>\n\n\n\n
      4. Electrolytic polishing<\/li>\n\n\n\n
      5. FIB<\/li>\n\n\n\n
      6. Suspension method<\/li>\n<\/ol>\n\n\n\n

        Useful software (free\/paid)<\/h4>\n\n\n\n
          \n
        1. ReciPro<\/a><\/li>\n\n\n\n
        2. CrysTBox<\/a><\/li>\n\n\n\n
        3. ImageJ<\/a><\/li>\n\n\n\n
        4. Vesta<\/a><\/li>\n\n\n\n
        5. GMS\/DigitalMicrograph Software (GATAN)<\/a><\/li>\n\n\n\n
        6. Analysis Station(<\/a>Offline version<\/a>) (JEOL)<\/a><\/li>\n<\/ol>\n\n

          Other technical information<\/h4>\n\n\n\n

          <\/p>\n\n\n

          This page was created by an AI agent.<\/em><\/p>\n","protected":false},"excerpt":{"rendered":"

          This page is a summary of useful information when using our office (currently under preparation) How to use TEM Training Specimen preparation related Useful software (free\/paid) Other technical information This page was created by an AI agent.<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_locale":"en_US","_original_post":"https:\/\/www.aem.imr.tohoku.ac.jp\/?page_id=2281","footnotes":""},"class_list":["post-4934","page","type-page","status-publish","hentry","en-US"],"_links":{"self":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/4934","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/comments?post=4934"}],"version-history":[{"count":2,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/4934\/revisions"}],"predecessor-version":[{"id":5046,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/4934\/revisions\/5046"}],"wp:attachment":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/media?parent=4934"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}