<\/p>\n\n\n\n
Operating status<\/a><\/p>\n\n\n\nTransmission electron microscopy (TEM\/STEM)<\/h3>\n\n\n\n\n\n\nDivision<\/th>S\/TEM<\/th>S\/TEM<\/th>S\/TEM<\/th>TEM<\/th>TEM<\/th><\/tr><\/thead>Appearance<\/td><\/td><\/td><\/td><\/td><\/td><\/tr>Name<\/td>JEM-ARM200F<\/a>W Collector<\/td>JEM-ARM200FSTEM Collector<\/td>JEM-2100plus<\/td>EM-002B<\/a><\/td>JEM-2000EX<\/a><\/td><\/tr>Function<\/td>TEM\/STEM\/EDS\/EELS<\/td>TEM \/STEM\/EDS\/EELS<\/td>TEM\/STEM\/EDS<\/td>TEM\/STEM\/EDS<\/td>TEM<\/td><\/tr>Location<\/td>2-B13<\/td>2-B14<\/td>3-103<\/td>1-105<\/td>1-105<\/td><\/tr>Maintenance classification (financial resources)<\/td>ARIM<\/td><\/td><\/td><\/td><\/td><\/tr>Notes<\/td><\/td><\/td><\/td>EDS malfunctionHigh voltage malfunction up to 160kVCL fixed aperture dirty<\/td>Slightly unstable lens<\/td><\/tr><\/tbody><\/table><\/figure>\n<\/div>\n<\/div>\n<\/div><\/div>\n\n\n\nTEM sample holder<\/h3>\n\n\n\n\n\nClassification<\/th>Sample heating holder<\/th>Sample cooling holder<\/th>Sample heating holder<\/th>Sample cooling holder<\/th><\/th><\/tr><\/thead>Appearance<\/td><\/td><\/td><\/td><\/td><\/td><\/tr>Name<\/td><\/td><\/td><\/td><\/td><\/td><\/tr>Function<\/td>For JEM-2000EXII<\/td>For JEM-2000EXII<\/td>For ARM200F\/2100plusProtchips<\/td>ARM200F\/2100plus ForFor bulk<\/td><\/td><\/tr>Location<\/td>1-105<\/td>1-105<\/td>2-B14<\/td>2-B14<\/td><\/td><\/tr>Notes<\/td><\/td><\/td>Adjusting<\/td>Adjusting<\/td><\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\nDivision<\/th>Two-axis tilt holder for analysis<\/th>Reinforced specification analysis two-axis tilt holder<\/th>Single-axis tilt holder<\/th>Holder for tomography<\/th><\/th><\/tr><\/thead>Appearance<\/td><\/td><\/td><\/td><\/td><\/td><\/tr>Name<\/td><\/td><\/td><\/td><\/td><\/td><\/tr>Function<\/td>For ARM200F\/2100plus<\/td>For ARM200F\/2100plus<\/td>For ARM200F\/2100plus<\/td>For ARM200F\/2100plus<\/td><\/td><\/tr>Location<\/td>3-103,2-B13<\/td>2-B13,2-B14<\/td>3-103,2-B13,2-B14<\/td>2-B14<\/td><\/td><\/tr>Notes<\/td><\/td><\/td><\/td><\/td><\/td><\/tr><\/tbody><\/table><\/figure>\n<\/div>\n<\/div>\n\n\n\nTEM sample preparation<\/h3>\n\n\n\nDivision<\/th>FIB<\/th>FIB<\/th>FIB<\/th>Low energy milling<\/th><\/th><\/tr><\/thead>Appearance<\/td><\/a><\/td><\/td><\/td><\/td><\/td><\/tr>Name<\/td>Thermo Fisher Scientific<\/a>Versa 3D<\/a><\/td>Thermo Fisher Scientific Quanta 3D<\/a><\/td>TESCAN AMBER X<\/td>Technoorg Linda Gentle Mill 3<\/td><\/td><\/tr>Function<\/td>\u30fbDual beam Ga-FIB\u30fbSEM (FE-SEM)\u30fbFIB (Ga ion gun)\u30fbMicro sampling\u30fbPt &C Protective film formation\u30fb3D image acquisition by serial sectioning method\u30fbBackscattered electron detector\u30fbEDS analysis<\/td>\u30fbDual beam Ga-FIB\u30fbSEM (W electron gun)\u30fbFIB (Ga ion gun)\u30fbMicro sampling\u30fbC & W protective film formation<\/td>\u30fbDual beam Xe plasma FIB\u30fbSEM (FE-SEM)\u30fbFIB (Xe plasma)\u30fbGa free\u30fbMicro sampling\u30fbPt &C protective film formation\u30fbTOF-SIMS using FIB as the primary ion source\u30fb3D image acquisition by serial sectioning\u30fbBackscattered electron detector\u30fbEDS analysis\u30fbRocking stage installed<\/td>\u30fbLow energy plasma milling\u30fbArgon ion broad beam\u30fbBeam current 5 to 80 \u03bcA\u30fbIon irradiation angle 0~6\u00b0<\/td><\/td><\/tr>Location<\/td>2-613<\/td>2-613<\/td>2 -612<\/td>2-613<\/td><\/td><\/tr>Maintenance classification (financial resources)<\/td>ARIM<\/td><\/td>ARIM<\/td>ARIM<\/td><\/td><\/tr>Notes<\/td><\/td><\/td>Preparing<\/td><\/td><\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\nClassification<\/th>Ion Milling<\/th>Ion Milling<\/s><\/th>Ion milling<\/th>Ion slicer<\/th>Electrolytic polishing equipment<\/th><\/tr><\/thead>Appearance<\/td><\/td><\/td><\/td><\/td><\/td><\/tr>Name<\/td>model 1010<\/a><\/td>PIPS II<\/a>(A)<\/s><\/td>PIPS II(B)<\/td>EM-09100IS<\/a><\/td><\/td><\/tr>Function<\/td>Auto stopSample cooling<\/td>Sample cooling<\/s><\/td>Automatic stopSample cooling<\/td>Cross-section sample preparation<\/td>Twin jet method<\/td><\/tr>Location<\/td>1-105<\/td>1-105<\/s><\/td>1-105<\/td>1-105<\/td><\/td><\/tr>Maintenance classification (financial resources)<\/td><\/td>*Entrusted management equipment<\/td>ARIM<\/td><\/td><\/td><\/tr>Notes<\/td><\/td>End<\/td><\/td><\/td>Rental only<\/mark><\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\nTEM sample related equipment<\/h3>\n\n\n\nClassification<\/th>Disc punch<\/th>Lap grinder<\/th>Low speed cutter<\/th>Dimple grinder<\/th>Diamond wire saw<\/th><\/tr><\/thead>Appearance<\/td><\/td><\/td><\/td><\/td><\/td><\/tr>Name<\/td>Homemade<\/td>Marteau<\/td><\/td>Gatan 656<\/td><\/td><\/tr>Function<\/td><\/td><\/td><\/td><\/td><\/td><\/tr>Location<\/td>1-105<\/td>1-105<\/td>1-105<\/td>1-105<\/td>1-105<\/td><\/tr>Notes<\/td><\/td><\/td><\/td><\/td><\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\nClassification<\/th>Automatic polishing machine<\/th>Hot plate<\/th>Ultrasonic disc punching machine<\/th><\/th><\/th><\/tr><\/thead>Appearance<\/td><\/td><\/td><\/td><\/td><\/td><\/tr>Name<\/td><\/td><\/td>Homemade<\/td><\/td><\/td><\/tr>Features<\/td><\/td><\/td>\u03a63mm disk<\/td><\/td><\/td><\/tr>Location<\/td>1-105<\/td>1-105<\/td>1-105<\/td><\/td><\/td><\/tr>Notes<\/td><\/td><\/td><\/td><\/td><\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\nDivision<\/th>Digital microscope<\/th>Stereo microscope<\/th>Optical microscope<\/th><\/th><\/th><\/tr><\/thead>Appearance<\/td><\/td><\/td><\/td><\/td><\/td><\/tr>Name<\/td><\/td><\/td><\/td><\/td><\/td><\/tr>Features<\/td><\/td><\/td><\/td><\/td><\/td><\/tr>Location<\/td>1-105,2-B13,2-B14,2-613,3-103<\/td>1-105<\/td>1-105<\/td><\/td><\/td><\/tr>Notes<\/td><\/td><\/td><\/td><\/td><\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\nElectron microscope related equipment<\/h3>\n\n\n\nClassification<\/th>Osmium coater<\/th>Carbon coater<\/th>Ion cleaner<\/th>Ion cleaner<\/th>Ion cleaner<\/th><\/tr><\/thead>Appearance<\/td><\/a><\/td><\/td><\/td><\/td><\/td><\/tr>Name<\/td>NEOC-PRO<\/a><\/td><\/td><\/td><\/td><\/td><\/tr>Function<\/td><\/td><\/td><\/td><\/td><\/td><\/tr>Location<\/td>1-111<\/td>2-613<\/td> 3-103<\/td>2-B13<\/td>2-B14<\/td><\/tr>Notes<\/td><\/td><\/td>Adjusting<\/td><\/td><\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\nClassification<\/th>Plasma etching equipment<\/th>Plasma cleaner<\/th>Plasma cleaner<\/th><\/th><\/th><\/tr><\/thead>Appearance<\/td><\/td><\/td><\/td><\/td><\/td><\/tr>Name<\/td><\/td>Solarus<\/td>Solarus<\/td><\/td><\/td><\/tr>Function<\/td><\/td>Gas type: Ar,H2,O2<\/td>Gas type: Ar,H2,O2<\/td><\/td><\/td><\/tr>Location<\/td>1-105<\/td>2-B13<\/td>2-B14<\/td><\/td><\/td><\/tr>Maintenance classification (financial resources)<\/td><\/td><\/td>ARIM<\/td><\/td><\/td><\/tr>Notes<\/td><\/td><\/td>Out of order\/unrepairable<\/td><\/td><\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\nOther devices<\/h3>\n\n\n\nClassification<\/th>Multipurpose X-ray diffractometer<\/th>Thermal analyzer<\/th><\/th><\/th><\/th><\/tr><\/thead>Appearance<\/td><\/td><\/td><\/td><\/td><\/td><\/tr>Name<\/td>SmartLab 9SW<\/a><\/td>Thermo plus EVO \u2161<\/a><\/td><\/td><\/td><\/td><\/tr>Function<\/td>XRD<\/td>DSC\/TG-DTA<\/td><\/td><\/td><\/td><\/tr>Location<\/td>2-613<\/td>2-613<\/td><\/td><\/td><\/td><\/tr>Maintenance classification (financial resources)<\/td>ARIM<\/td>ARIM<\/td><\/td><\/td><\/td><\/tr>Notes<\/td><\/td><\/td><\/td><\/td><\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\nSoftware<\/h3>\n\n\n\n\nCrystal structure modeling\/electron diffraction simulation<\/a><\/li>\n\n\n\nHigh-resolution electron microscope image simulation<\/li>\n<\/ul>\n\n\n\nThis page was created by an AI agent.<\/em><\/p>\n","protected":false},"excerpt":{"rendered":"Operating status Transmission electron microscopy (TEM\/STEM) Division S\/TEM S\/TEM S\/TEM TEM TEM Appearance Name JEM-ARM200FW Collector JEM-ARM200FSTEM Collector JEM-2100plus EM-002B JEM-2000EX Function TEM\/STEM\/EDS\/EELS TEM \/STEM\/EDS\/EELS TEM\/STEM\/EDS TEM\/STEM\/EDS TEM Location 2-B13 2-B14 3-103 1-105 1-105 Maintenance classification (financial resources) ARIM Notes EDS malfunctionHigh voltage malfunction up to 160kVCL fixed aperture dirty Slightly unstable lens TEM sample … Equipment list<\/span><\/a><\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":10,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_locale":"en_US","_original_post":"https:\/\/aem.imr.tohoku.ac.jp\/wordpress\/?page_id=74","footnotes":""},"class_list":["post-4975","page","type-page","status-publish","hentry","en-US"],"_links":{"self":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/4975","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/comments?post=4975"}],"version-history":[{"count":6,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/4975\/revisions"}],"predecessor-version":[{"id":5107,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/4975\/revisions\/5107"}],"wp:attachment":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/media?parent=4975"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}
This page was created by an AI agent.<\/em><\/p>\n","protected":false},"excerpt":{"rendered":"Operating status Transmission electron microscopy (TEM\/STEM) Division S\/TEM S\/TEM S\/TEM TEM TEM Appearance Name JEM-ARM200FW Collector JEM-ARM200FSTEM Collector JEM-2100plus EM-002B JEM-2000EX Function TEM\/STEM\/EDS\/EELS TEM \/STEM\/EDS\/EELS TEM\/STEM\/EDS TEM\/STEM\/EDS TEM Location 2-B13 2-B14 3-103 1-105 1-105 Maintenance classification (financial resources) ARIM Notes EDS malfunctionHigh voltage malfunction up to 160kVCL fixed aperture dirty Slightly unstable lens TEM sample … Equipment list<\/span><\/a><\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":10,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_locale":"en_US","_original_post":"https:\/\/aem.imr.tohoku.ac.jp\/wordpress\/?page_id=74","footnotes":""},"class_list":["post-4975","page","type-page","status-publish","hentry","en-US"],"_links":{"self":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/4975","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/comments?post=4975"}],"version-history":[{"count":6,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/4975\/revisions"}],"predecessor-version":[{"id":5107,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/4975\/revisions\/5107"}],"wp:attachment":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/media?parent=4975"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}
Operating status Transmission electron microscopy (TEM\/STEM) Division S\/TEM S\/TEM S\/TEM TEM TEM Appearance Name JEM-ARM200FW Collector JEM-ARM200FSTEM Collector JEM-2100plus EM-002B JEM-2000EX Function TEM\/STEM\/EDS\/EELS TEM \/STEM\/EDS\/EELS TEM\/STEM\/EDS TEM\/STEM\/EDS TEM Location 2-B13 2-B14 3-103 1-105 1-105 Maintenance classification (financial resources) ARIM Notes EDS malfunctionHigh voltage malfunction up to 160kVCL fixed aperture dirty Slightly unstable lens TEM sample … Equipment list<\/span><\/a><\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":10,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_locale":"en_US","_original_post":"https:\/\/aem.imr.tohoku.ac.jp\/wordpress\/?page_id=74","footnotes":""},"class_list":["post-4975","page","type-page","status-publish","hentry","en-US"],"_links":{"self":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/4975","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/comments?post=4975"}],"version-history":[{"count":6,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/4975\/revisions"}],"predecessor-version":[{"id":5107,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/4975\/revisions\/5107"}],"wp:attachment":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/media?parent=4975"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}
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