{"id":5124,"date":"2026-08-02T15:46:36","date_gmt":"2026-08-02T06:46:36","guid":{"rendered":"https:\/\/www.aem.imr.tohoku.ac.jp\/?page_id=5124"},"modified":"2026-08-02T15:46:36","modified_gmt":"2026-08-02T06:46:36","slug":"tem-available-on-campus-for-materials-science","status":"publish","type":"page","link":"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/tem-available-on-campus-for-materials-science\/","title":{"rendered":"TEM Available On-Campus (for Materials Science)"},"content":{"rendered":"\n

This page has been translated by AI and may contain errors. The Japanese version<\/a> is the official document.<\/p>\n\n\n\n

This page is an independent survey of TEM facilities available for materials science within Tohoku University. If you wish to use them, please contact the person in charge at each department.<\/p>\n\n\n\n

Information on this page may be outdated.<\/strong> Please inquire with the contact person of each division regarding user fees and availability details.<\/p>\n\n\n\n

Division of Analytical Electron Microscopy User Fees<\/a><\/p>\n\n\n\n\n\n\n\t\n\n\t\n\t\n\t\n\t\n\t\n\t\n\t\n\t\n\t\n\t\n\t\n\t\n\t\n\t\n\t\n\t\n\t\n\t\n\t\n\t\n\t
\u88c5\u7f6e<\/th>\u578b\u756a\/\u5f62\u5f0f<\/th>FE*1<\/th>\u53ce\u5dee\u88dc\u6b63*2<\/th>\u9ad8\u5206\u89e3\u80fd*3<\/th>\u9ad8\u50be\u659c*4<\/th>EDS*5<\/th>\u30de\u30c3\u30d7*6<\/th>EELS*7<\/th>\u5099\u8003<\/th>\n<\/tr>\n<\/thead>\n
\u5206\u6790TEM<\/td>TOPCON 002B(\u5206\u6790)<\/td>\u00a0<\/td>\u00a0<\/td>\u25cb<\/td>\u00a0<\/td>\u25cb<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\n<\/tr>\n
FE-TEM\/STEM<\/td>ARM-200F(\u5206\u6790\uff09<\/td>\u25cb<\/td>TEM\/STEM<\/td>\u25ce<\/td>\u25cb<\/td>\u25cb<\/td>\u25cb<\/td>\u25ce<\/td>\u00a0\u30ca\u30ce\u30d7\u30e9<\/td>\n<\/tr>\n
FE-TEM\/STEM<\/td>ARM-200F(\u30de\u30c6)<\/td>\u25cb<\/td>STEM<\/td>\u25ce<\/td>\u00a0<\/td>\u25cb<\/td>\u25cb<\/td>\u25cb<\/td>\u30de\u30c6\u7cfb\u5916<\/td>\n<\/tr>\n
TEM\/STEM<\/td>2100HR(\u30de\u30c6\uff09<\/td>\u00a0<\/td>\u00a0<\/td>\u25cb<\/td>\u00a0<\/td>\u25cb<\/td>\u25cb<\/td>\u00a0<\/td>\u30de\u30c6\u7cfb\u5916<\/td>\n<\/tr>\n
FE-TEM\/STEM<\/td>2100F(\u5de5\u5b66\u90e8)<\/td>\u25cb<\/td>\u00a0<\/td>\u25cb<\/td>\u00a0<\/td>\u25cb<\/td>\u25cb<\/td>\u00a0<\/td>\u5b66\u5185\u6599\u91d1<\/td>\n<\/tr>\n
FE-TEM<\/td>HF2000(\u5de5\u5b66\u90e8\uff09<\/td>\u25cb<\/td>\u00a0<\/td>\u25cb<\/td>\u00a0<\/td>\u25cb<\/td>\u00a0<\/td>\u00a0<\/td>\u5b66\u5185\u6599\u91d1<\/td>\n<\/tr>\n
300kVFE-TEM\/STEM<\/td>Titan80-300(\u5148\u7aef\uff09<\/td>\u25cb<\/td>TEM<\/td>\u25ce<\/td>\u00a0<\/td>\u25cb<\/td>\u25cb<\/td>\u25cb<\/td>\u5b66\u5185\u6599\u91d1<\/td>\n<\/tr>\n
300kVFE-TEM\/STEM<\/td>TitanG2cubed(\u5148\u7aef\uff09<\/td>\u25cb<\/td>TEM\/STEM<\/td>\u25ce<\/td>\u00a0<\/td>\u25cb<\/td>\u25cb<\/td>\u00a0<\/td>\u5b66\u5185\u6599\u91d1<\/td>\n<\/tr>\n
\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\n<\/tr>\n
TEM<\/td>JEM-2000EXII(\u5206\u6790)<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u25ce<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u30d5\u30a3\u30eb\u30e0\uffe5400\/\u679a<\/td>\n<\/tr>\n
TEM<\/td>2100HC(\u30de\u30c6)<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u25cb<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u30de\u30c6\u7cfb\u5916<\/td>\n<\/tr>\n
\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\n<\/tr>\n
\u30a4\u30aa\u30f3\u30df\u30ea\u30f3\u30b0<\/td>Model 1010(\u5206\u6790)<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\n<\/tr>\n
\u30a4\u30aa\u30f3\u30df\u30ea\u30f3\u30b0<\/td>PIPS(\u30de\u30c6)<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u30de\u30c6\u7cfb\u5916<\/td>\n<\/tr>\n
\u30a4\u30aa\u30f3\u30df\u30ea\u30f3\u30b0<\/td>PIPS(\u5de5\u5b66\u90e8)<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u30de\u30c6\u7cfb\u5916<\/td>\n<\/tr>\n
\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\n<\/tr>\n
\u30a4\u30aa\u30f3\u30b9\u30e9\u30a4\u30b5<\/td>EM-09100 IS(\u5206\u6790)<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\n<\/tr>\n
\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\n<\/tr>\n
FIB<\/td>Quanta3D(\u5206\u6790)<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u5b66\u5185\u6599\u91d1<\/td>\n<\/tr>\n
FIB<\/td>Versa3D(\u5206\u6790)<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u5b66\u5185\u6599\u91d1<\/td>\n<\/tr>\n
FIB<\/td>JIB-4600F(\u30de\u30c6\uff09<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u00a0<\/td>\u30de\u30c6\u7cfb\u5916\uff08\u4ee3\u884c\uff09<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n\n\n\n\n

<\/p>\n\n\n\n

(Analytical) Division of Analytical Electron Microscopy
(Advanced) Advanced Electron Microscopy Center
(IMR) Institute for Materials Research
(Engineering) School of Engineering Technical Division
(Materials) Department of Materials Science<\/p>\n\n\n\n

*1 Field Emission Electron Gun (FEG)
*2 Spherical Aberration Corrector (Cs Corrector)
*3 High-Resolution Image (\u25ce indicates Cs Corrector equipped)
*4 \u25cb approx. 35\u00b0 \/ \u25ce approx. 60\u00b0
*5 Compositional Analysis (EDS)
*6 Mapping
*7 EELS<\/p>\n\n\n\n

Surveyed on August 27, 2015<\/p>\n\n\n\n

Reference: Electron Microscopes Available via TSC<\/a><\/p>\n\n\n*This post was created by an AI agent.","protected":false},"excerpt":{"rendered":"

This page has been translated by AI and may contain errors. The Japanese version is the official document. This page is an independent survey of TEM facilities available for materials science within Tohoku University. If you wish to use them, please contact the person in charge at each department. Information on this page may be … TEM Available On-Campus (for Materials Science)<\/span><\/a><\/p>\n","protected":false},"author":11,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_locale":"en_US","_original_post":"https:\/\/aem.imr.tohoku.ac.jp\/wordpress\/?page_id=319","footnotes":""},"class_list":["post-5124","page","type-page","status-publish","hentry","en-US"],"_links":{"self":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/5124","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/users\/11"}],"replies":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/comments?post=5124"}],"version-history":[{"count":1,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/5124\/revisions"}],"predecessor-version":[{"id":5129,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/5124\/revisions\/5129"}],"wp:attachment":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/media?parent=5124"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}