{"id":5212,"date":"2026-08-04T13:16:27","date_gmt":"2026-08-04T04:16:27","guid":{"rendered":"https:\/\/www.aem.imr.tohoku.ac.jp\/?page_id=5212"},"modified":"2026-08-04T13:46:12","modified_gmt":"2026-08-04T04:46:12","slug":"atomic-resolution-analytical-electron-microscope-jem-arm200f-w-corrector","status":"publish","type":"page","link":"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/atomic-resolution-analytical-electron-microscope-jem-arm200f-w-corrector\/","title":{"rendered":"Atomic Resolution Analytical Electron Microscope JEM-ARM200F (W Corrector)"},"content":{"rendered":"<p><em>*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.*<\/em><\/p>\n<div class=\"equipment-header\" style=\"text-align: center; margin-bottom: 2em;\">\n  <img decoding=\"async\" class=\"aligncenter size-medium\" src=\"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-content\/uploads\/2016\/10\/DSC_000001-300x169.jpg\" alt=\"JEM-ARM200F W Corrector appearance\" style=\"max-width: 100%; height: auto; border-radius: 8px; box-shadow: 0 4px 12px rgba(0,0,0,0.1);\" \/>\n<\/div>\n<h2 style=\"border-bottom: 2px solid #0056b3; padding-bottom: 6px; margin-top: 1.5em; color: #0056b3;\">Overview<\/h2>\n<div style=\"line-height: 1.8; font-size: 1.05em;\">\n<p>The JEOL <strong>JEM-ARM200F (W-Corrector configuration)<\/strong> is a flagship 200 kV Cold Field Emission Gun (Cold-FEG) atomic-resolution analytical electron microscope equipped with double spherical aberration correctors for both the illumination (STEM) and imaging (TEM) systems.<\/p>\n<p>It integrates atomic-resolution TEM imaging (lattice resolution 70 pm, point resolution 130 pm), sub-angstrom STEM imaging (HAADF 100 pm, ABF, BF), and high-sensitivity microanalysis (EDS and EELS).<\/p>\n<\/div>\n<h2 style=\"border-bottom: 2px solid #0056b3; padding-bottom: 6px; margin-top: 1.5em; color: #0056b3;\">Features<\/h2>\n<ul style=\"line-height: 1.8; padding-left: 1.2em;\">\n<li style=\"margin-bottom: 0.8em;\"><strong>Double Spherical Aberration Correctors (W-Corrector):<\/strong> Equipped with both probe (illumination) and image (imaging) Cs correctors, achieving both high-precision TEM phase contrast imaging and sub-angstrom STEM probe formation in a single instrument.<\/li>\n<li style=\"margin-bottom: 0.8em;\"><strong>Cold Field Emission Gun (Cold-FEG):<\/strong> Provides high brightness with an exceptionally narrow energy spread, delivering superior spatial and energy resolution for advanced EELS microanalysis.<\/li>\n<li style=\"margin-bottom: 0.8em;\"><strong>Multi-Detector STEM\/EDS\/EELS Suite:<\/strong> Enables simultaneous acquisition of HAADF, LAADF, ABF, and BF STEM images, integrated with large solid-angle EDS detectors and EELS spectroscopy systems.<\/li>\n<li style=\"margin-bottom: 0.8em;\"><strong>MEXT ARIM Shared Facility:<\/strong> Maintained under the MEXT Advanced Research Core for Advanced Materials (ARIM) project.<\/li>\n<\/ul>\n<h2 style=\"border-bottom: 2px solid #0056b3; padding-bottom: 6px; margin-top: 1.5em; color: #0056b3;\">Specifications<\/h2>\n<div style=\"background-color: #fff9e6; border-left: 4px solid #ff9800; padding: 10px 14px; margin: 1em 0; border-radius: 4px; font-size: 0.95em; line-height: 1.6;\">\n  <strong style=\"color: #d97706;\">[Specification Notice]<\/strong><br \/>\n  Actual equipment configurations or specifications may differ from standard manual specifications. Please consult the equipment manager for details regarding current capabilities and conditions of use.\n<\/div>\n<table style=\"width: 100%; border-collapse: collapse; margin-top: 1em; font-size: 0.95em;\">\n<tbody>\n<tr style=\"border-bottom: 1px solid #e0e0e0;\">\n<th style=\"width: 28%; padding: 10px; background-color: #f8f9fa; text-align: left; font-weight: bold; border-right: 1px solid #e0e0e0;\">Manufacturer<\/th>\n<td style=\"padding: 10px;\">JEOL Ltd.<\/td>\n<\/tr>\n<tr style=\"border-bottom: 1px solid #e0e0e0;\">\n<th style=\"width: 28%; padding: 10px; background-color: #f8f9fa; text-align: left; font-weight: bold; border-right: 1px solid #e0e0e0;\">Model<\/th>\n<td style=\"padding: 10px;\">JEM-ARM200F (W-Corrector)<\/td>\n<\/tr>\n<tr style=\"border-bottom: 1px solid #e0e0e0;\">\n<th style=\"width: 28%; padding: 10px; background-color: #f8f9fa; text-align: left; font-weight: bold; border-right: 1px solid #e0e0e0;\">Electron Source<\/th>\n<td style=\"padding: 10px;\">Cold Field Emission Gun (Cold-FEG)<\/td>\n<\/tr>\n<tr style=\"border-bottom: 1px solid #e0e0e0;\">\n<th style=\"width: 28%; padding: 10px; background-color: #f8f9fa; text-align: left; font-weight: bold; border-right: 1px solid #e0e0e0;\">Accelerating Voltage<\/th>\n<td style=\"padding: 10px;\">200 kV, 80 kV<\/td>\n<\/tr>\n<tr style=\"border-bottom: 1px solid #e0e0e0;\">\n<th style=\"width: 28%; padding: 10px; background-color: #f8f9fa; text-align: left; font-weight: bold; border-right: 1px solid #e0e0e0;\">Cs Correctors<\/th>\n<td style=\"padding: 10px;\">Double Cs Correctors (Illumination\/Probe &#038; Imaging\/Image)<\/td>\n<\/tr>\n<tr style=\"border-bottom: 1px solid #e0e0e0;\">\n<th style=\"width: 28%; padding: 10px; background-color: #f8f9fa; text-align: left; font-weight: bold; border-right: 1px solid #e0e0e0;\">Resolution (200 kV)<\/th>\n<td style=\"padding: 10px;\">STEM-HAADF resolution: 100 pm<br \/>TEM lattice resolution: 70 pm \/ TEM point resolution: 130 pm<\/td>\n<\/tr>\n<tr style=\"border-bottom: 1px solid #e0e0e0;\">\n<th style=\"width: 28%; padding: 10px; background-color: #f8f9fa; text-align: left; font-weight: bold; border-right: 1px solid #e0e0e0;\">Max Specimen Tilt<\/th>\n<td style=\"padding: 10px;\">X \u00b135\u00b0 \/ Y \u00b130\u00b0<\/td>\n<\/tr>\n<tr style=\"border-bottom: 1px solid #e0e0e0;\">\n<th style=\"width: 28%; padding: 10px; background-color: #f8f9fa; text-align: left; font-weight: bold; border-right: 1px solid #e0e0e0;\">Analytical Capabilities<\/th>\n<td style=\"padding: 10px;\">TEM imaging, STEM imaging (HAADF\/LAADF\/ABF\/BF), TEM-EDS \/ STEM-EDS, TEM-EELS \/ STEM-EELS<\/td>\n<\/tr>\n<tr style=\"border-bottom: 1px solid #e0e0e0;\">\n<th style=\"width: 28%; padding: 10px; background-color: #f8f9fa; text-align: left; font-weight: bold; border-right: 1px solid #e0e0e0;\">Funding \/ Facility<\/th>\n<td style=\"padding: 10px;\">MEXT ARIM Project (Advanced Research Core for Advanced Materials)<\/td>\n<\/tr>\n<tr style=\"border-bottom: 1px solid #e0e0e0;\">\n<th style=\"width: 28%; padding: 10px; background-color: #f8f9fa; text-align: left; font-weight: bold; border-right: 1px solid #e0e0e0;\">Location<\/th>\n<td style=\"padding: 10px;\">Room 2-B13<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<h2 style=\"border-bottom: 2px solid #0056b3; padding-bottom: 6px; margin-top: 1.5em; color: #0056b3;\">Manuals &#038; Guidelines<\/h2>\n<div style=\"background-color: #f0f7ff; border-left: 4px solid #0056b3; padding: 12px 16px; margin-top: 1em; border-radius: 4px; line-height: 1.7;\">\n<p style=\"margin: 0 0 6px 0;\"><strong>[Application for Use]<\/strong><br \/>Application is required through the <a href=\"https:\/\/www.cints.tohoku.ac.jp\/\" target=\"_blank\" rel=\"noopener noreferrer\">Tohoku University Center for Integrated Nanotechnology Support (CINTS)<\/a>.<\/p>\n<p style=\"margin: 6px 0 0 0;\"><strong>[Manual (Campus Access Only)]<\/strong><br \/>&#x1f4c4; <a href=\"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-content\/uploads\/2026\/08\/Gatan_Enfinium_EELS_Owners_Manual.pdf\" class=\"mtli_attachment mtli_pdf\" target=\"_blank\" rel=\"noopener noreferrer\">Gatan Enfinium EELS Owner&#8217;s Manual (PDF, campus access only)<\/a><\/p>\n<\/div>\n","protected":false},"excerpt":{"rendered":"<p>*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* Overview The JEOL JEM-ARM200F (W-Corrector configuration) is a flagship 200 kV Cold Field Emission Gun (Cold-FEG) atomic-resolution analytical electron microscope equipped with double spherical aberration correctors for both the illumination (STEM) and imaging (TEM) <a href=\"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/atomic-resolution-analytical-electron-microscope-jem-arm200f-w-corrector\/\" class=\"more-link\">&#8230;<span class=\"screen-reader-text\">  Atomic Resolution Analytical Electron Microscope JEM-ARM200F (W Corrector)<\/span><\/a><\/p>\n","protected":false},"author":11,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_locale":"en_US","_original_post":"5210","footnotes":""},"class_list":["post-5212","page","type-page","status-publish","hentry","en-US"],"_links":{"self":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/5212","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/users\/11"}],"replies":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/comments?post=5212"}],"version-history":[{"count":4,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/5212\/revisions"}],"predecessor-version":[{"id":5247,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/5212\/revisions\/5247"}],"wp:attachment":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/media?parent=5212"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}