{"id":5242,"date":"2026-08-04T13:40:05","date_gmt":"2026-08-04T04:40:05","guid":{"rendered":"https:\/\/www.aem.imr.tohoku.ac.jp\/?page_id=5242"},"modified":"2026-08-04T13:46:17","modified_gmt":"2026-08-04T04:46:17","slug":"transmission-electron-microscope-jeol-jem-2100plus","status":"publish","type":"page","link":"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/transmission-electron-microscope-jeol-jem-2100plus\/","title":{"rendered":"Transmission Electron Microscope JEOL JEM-2100Plus"},"content":{"rendered":"<p><em>*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.*<\/em><\/p>\n<div class=\"equipment-header\" style=\"text-align: center; margin-bottom: 2em;\">\n  <img decoding=\"async\" class=\"aligncenter size-medium\" src=\"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-content\/uploads\/2023\/01\/20220908_155931-1-e1674028243536.jpg\" alt=\"JEM-2100Plus appearance\" style=\"max-width: 100%; height: auto; border-radius: 8px; box-shadow: 0 4px 12px rgba(0,0,0,0.1);\" \/>\n<\/div>\n<h2 style=\"border-bottom: 2px solid #0056b3; padding-bottom: 6px; margin-top: 1.5em; color: #0056b3;\">Overview<\/h2>\n<div style=\"line-height: 1.8; font-size: 1.05em;\">\n<p>The JEOL <strong>JEM-2100Plus<\/strong> is a multipurpose 200 kV Transmission Electron Microscope (TEM) combining optical resolution with automated control systems.<\/p>\n<p>Equipped with a cool-beam electron source and the next-generation &#8216;TEMCenter&#8217; software, it performs high-resolution TEM imaging (point resolution 0.14 nm, lattice resolution 0.23 nm), electron diffraction (SAD, NBD, CBED), STEM imaging (BF\/DF), and EDS microanalysis with efficiency and precision.<\/p>\n<\/div>\n<h2 style=\"border-bottom: 2px solid #0056b3; padding-bottom: 6px; margin-top: 1.5em; color: #0056b3;\">Features<\/h2>\n<ul style=\"line-height: 1.8; padding-left: 1.2em;\">\n<li style=\"margin-bottom: 0.8em;\"><strong>Next-Generation TEMCenter Interface:<\/strong> A compact, intuitive GUI integrating microscope control, status displays, and image viewports for automated operations.<\/li>\n<li style=\"margin-bottom: 0.8em;\"><strong>High-Precision Piezo-Driven Goniometer:<\/strong> Full computer-controlled piezo stage providing smooth sub-nanometer specimen drift stability and positioning.<\/li>\n<li style=\"margin-bottom: 0.8em;\"><strong>Advanced Electron Diffraction Modes:<\/strong> Supports Selected Area Diffraction (SAD), Nano-Beam Electron Diffraction (NBD), and Convergent Beam Electron Diffraction (CBED) for crystallographic and strain analysis.<\/li>\n<li style=\"margin-bottom: 0.8em;\"><strong>Digital Montage &#038; Auto-Focus Systems:<\/strong> High-speed automated focusing and high-resolution panoramic montage image acquisition (equivalent to 5,000 \u00d7 5,000 pixels).<\/li>\n<\/ul>\n<h2 style=\"border-bottom: 2px solid #0056b3; padding-bottom: 6px; margin-top: 1.5em; color: #0056b3;\">Specifications<\/h2>\n<div style=\"background-color: #fff9e6; border-left: 4px solid #ff9800; padding: 10px 14px; margin: 1em 0; border-radius: 4px; font-size: 0.95em; line-height: 1.6;\">\n  <strong style=\"color: #d97706;\">[Specification Notice]<\/strong><br \/>\n  Actual equipment configurations or specifications may differ from standard manual specifications. Please consult the equipment manager for details regarding current capabilities and conditions of use.\n<\/div>\n<table style=\"width: 100%; border-collapse: collapse; margin-top: 1em; font-size: 0.95em;\">\n<tbody>\n<tr style=\"border-bottom: 1px solid #e0e0e0;\">\n<th style=\"width: 28%; padding: 10px; background-color: #f8f9fa; text-align: left; font-weight: bold; border-right: 1px solid #e0e0e0;\">Manufacturer<\/th>\n<td style=\"padding: 10px;\">JEOL Ltd.<\/td>\n<\/tr>\n<tr style=\"border-bottom: 1px solid #e0e0e0;\">\n<th style=\"width: 28%; padding: 10px; background-color: #f8f9fa; text-align: left; font-weight: bold; border-right: 1px solid #e0e0e0;\">Model<\/th>\n<td style=\"padding: 10px;\">JEM-2100Plus (Multipurpose TEM)<\/td>\n<\/tr>\n<tr style=\"border-bottom: 1px solid #e0e0e0;\">\n<th style=\"width: 28%; padding: 10px; background-color: #f8f9fa; text-align: left; font-weight: bold; border-right: 1px solid #e0e0e0;\">Electron Source<\/th>\n<td style=\"padding: 10px;\">Cool-beam electron gun system<\/td>\n<\/tr>\n<tr style=\"border-bottom: 1px solid #e0e0e0;\">\n<th style=\"width: 28%; padding: 10px; background-color: #f8f9fa; text-align: left; font-weight: bold; border-right: 1px solid #e0e0e0;\">Accelerating Voltage<\/th>\n<td style=\"padding: 10px;\">200 kV (selectable: 80, 100, 120, 160, 200 kV; min step 50 V)<\/td>\n<\/tr>\n<tr style=\"border-bottom: 1px solid #e0e0e0;\">\n<th style=\"width: 28%; padding: 10px; background-color: #f8f9fa; text-align: left; font-weight: bold; border-right: 1px solid #e0e0e0;\">Resolution (200 kV)<\/th>\n<td style=\"padding: 10px;\">Point resolution: 0.14 nm (1.4 \u00c5)<br \/>Lattice resolution: 0.23 nm (2.3 \u00c5)<\/td>\n<\/tr>\n<tr style=\"border-bottom: 1px solid #e0e0e0;\">\n<th style=\"width: 28%; padding: 10px; background-color: #f8f9fa; text-align: left; font-weight: bold; border-right: 1px solid #e0e0e0;\">Magnification (MAG Mode)<\/th>\n<td style=\"padding: 10px;\">\u00d72,000 to \u00d71,500,000 (LOWMAG: \u00d730 to \u00d76,000)<\/td>\n<\/tr>\n<tr style=\"border-bottom: 1px solid #e0e0e0;\">\n<th style=\"width: 28%; padding: 10px; background-color: #f8f9fa; text-align: left; font-weight: bold; border-right: 1px solid #e0e0e0;\">Max Specimen Tilt<\/th>\n<td style=\"padding: 10px;\">X \u00b135\u00b0 \/ Y \u00b130\u00b0<\/td>\n<\/tr>\n<tr style=\"border-bottom: 1px solid #e0e0e0;\">\n<th style=\"width: 28%; padding: 10px; background-color: #f8f9fa; text-align: left; font-weight: bold; border-right: 1px solid #e0e0e0;\">Analytical Capabilities<\/th>\n<td style=\"padding: 10px;\">Bright-field\/Dark-field TEM, STEM (BF\/DF), Electron Diffraction (SAD\/NBD\/CBED), EDS<\/td>\n<\/tr>\n<tr style=\"border-bottom: 1px solid #e0e0e0;\">\n<th style=\"width: 28%; padding: 10px; background-color: #f8f9fa; text-align: left; font-weight: bold; border-right: 1px solid #e0e0e0;\">Location<\/th>\n<td style=\"padding: 10px;\">Room 3-103<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"excerpt":{"rendered":"<p>*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* Overview The JEOL JEM-2100Plus is a multipurpose 200 kV Transmission Electron Microscope (TEM) combining optical resolution with automated control systems. Equipped with a cool-beam electron source and the next-generation &#8216;TEMCenter&#8217; software, it performs high-resolution <a href=\"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/transmission-electron-microscope-jeol-jem-2100plus\/\" class=\"more-link\">&#8230;<span class=\"screen-reader-text\">  Transmission Electron Microscope JEOL JEM-2100Plus<\/span><\/a><\/p>\n","protected":false},"author":11,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_locale":"en_US","_original_post":"5240","footnotes":""},"class_list":["post-5242","page","type-page","status-publish","hentry","en-US"],"_links":{"self":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/5242","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/users\/11"}],"replies":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/comments?post=5242"}],"version-history":[{"count":2,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/5242\/revisions"}],"predecessor-version":[{"id":5251,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/5242\/revisions\/5251"}],"wp:attachment":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/media?parent=5242"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}