{"id":6044,"date":"2026-08-27T13:53:35","date_gmt":"2026-08-27T04:53:35","guid":{"rendered":"https:\/\/www.aem.imr.tohoku.ac.jp\/arim-data-registration-2\/"},"modified":"2026-08-27T14:22:12","modified_gmt":"2026-08-27T05:22:12","slug":"arim-data-registration-2","status":"publish","type":"page","link":"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/arim-data-registration-2\/","title":{"rendered":"Guidance on ARIM Data Registration (Equipment POPs & Required Data Files)"},"content":{"rendered":"

*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.*<\/p>\n

\n

To Users of ARIM Public Projects (with Data Submission)<\/h3>\n

When utilizing shared equipment in our facility under the “Public Projects (with Data Submission)”<\/strong> framework of the Advanced Research Infrastructure for Materials and Nanotechnology in Japan (ARIM) by MEXT, users are requested to submit and register measurement data (raw data, structured data, and metadata) after experimental sessions. We provide the equipment POPs displayed near each instrument online to assist you with data registration and file format verification.<\/p>\n<\/div>\n

\n

\n ⚠️<\/span> [Important] Note on Applicable Usage Frameworks
\n <\/h4>\n

Instruments in the Analytical Research Core for Advanced Materials (ARCAM) \/ Division of Analytical Electron Microscopy, IMR are operated under both the ARIM (CINTS) framework<\/strong> and the IMR Internal Analysis framework<\/strong> (internal research use and contract analysis).<\/p>\n

*Note: This data registration guidance and equipment POPs apply only when using equipment under the ARIM “Public Projects (with Data Submission)” framework. They do not apply to usage under internal analysis or other frameworks.<\/p>\n<\/div>\n

Guidance by User Category<\/h2>\n
\n
\n

Self-Operating Users (Hands-on Experiments)<\/h3>\n

After completing your measurement session, please refer to the equipment POPs to confirm which file formats (extensions) are required<\/strong> when uploading data to the ARIM data repository (DICE, etc.).<\/p>\n<\/p><\/div>\n

\n

Assisted \/ Technical Service Users<\/h3>\n

Even when facility staff perform data registration on your behalf, you can refer to these POPs to understand which specific measurement data files are subject to ARIM data registration<\/strong>.<\/p>\n<\/p><\/div>\n<\/div>\n

List of Equipment POPs & Required Data Files<\/h2>\n

Below is the list of required registration files and equipment POPs (PDF). Click the link to view or download each POP.
\n*Note: Equipment or measurement conditions for which data structuring scripts in RDE (Research Data Environment) are not yet prepared are currently not designated as required registration files; however, supported file formats for registration will be expanded sequentially.<\/span><\/p>\n\n\n\n\n\n\n\n\n\n\n
Local ID<\/th>\nInstrument Name & Model<\/th>\nManufacturer<\/th>\nRequired Files<\/th>\nEquipment POP (PDF)<\/th>\n<\/tr>\n<\/thead>\n
TU-504<\/td>\nAtomic Resolution Transmission Electron Microscope
JEM-ARM200F<\/strong><\/td>\n		JEOL Ltd.<\/td>\n.dm3<\/code> \/ .dm4<\/code>
(Image \/ Measurement Conditions File)<\/span><\/td>\n		📄 View POP<\/a><\/td>\n<\/tr>\n
TU-507<\/td>\nDual-Beam FIB System
Quanta 3D<\/strong><\/td>\n		Thermo Fisher Scientific<\/td>\n.tif<\/code>
(Captured Image \/ Measurement Conditions)<\/span><\/td>\n		📄 View POP<\/a><\/td>\n<\/tr>\n
TU-508<\/td>\nDual-Beam FIB System
Versa 3D<\/strong><\/td>\n		Thermo Fisher Scientific<\/td>\nOperational: .tif<\/code> (Image\/Conditions)
EDS: .emsa<\/code> (Spectrum\/Conditions)<\/td>\n		📄 View POP<\/a><\/td>\n<\/tr>\n
TU-515<\/td>\nIntelligent X-ray Diffraction System
SmartLab 9SW<\/strong><\/td>\n		Rigaku Corporation<\/td>\n.ras<\/code> \/ .rasx<\/code>
(Diffraction \/ Measurement Conditions)<\/span><\/td>\n		📄 View POP<\/a><\/td>\n<\/tr>\n
TU-517<\/td>\nTransmission Electron Microscope
JEM-2000EX\u2161<\/strong><\/td>\n		JEOL Ltd.<\/td>\n.dm3<\/code> \/ .dm4<\/code>
(Image \/ Conditions File)<\/span><\/td>\n		📄 View POP<\/a><\/td>\n<\/tr>\n
TU-520<\/td>\nTransmission Electron Microscope
JEM-2100Plus<\/strong><\/td>\n		JEOL Ltd.<\/td>\n.dm3<\/code> \/ .dm4<\/code>
(Image \/ Conditions File)<\/span><\/td>\n		📄 View POP<\/a><\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n

*POPs for other equipment will be added sequentially once prepared.<\/p>\n

Compliance and Important Notice on Equipment Usage<\/h2>\n
\n

1. Submission of User Reports<\/h3>\n

Users who utilize ARIM facilities are required to submit a User Report<\/strong> summarizing the experiments, measurements, and results by the specified deadline for the fiscal year. If you have special circumstances (such as pending patent applications or paper publications), a grace period for publication (up to 2 years) can be requested.<\/p>\n

For more details, please refer to ARIM Japan: User Report Guidelines<\/a>.<\/p>\n

2. Acknowledgments in Publications<\/h3>\n

When publishing research results obtained through ARIM support in papers, conference presentations, or press releases, please include the prescribed acknowledgment:<\/p>\n

\n [English Example]<\/strong>
\n (A part of) This work was supported by “Advanced Research Infrastructure for Materials and Nanotechnology in Japan (ARIM)” of the Ministry of Education, Culture, Sports, Science and Technology (MEXT). Proposal Number JPMXP12yyxx1234.\n <\/div>\n

3. Troubleshooting during Data Registration<\/h3>\n

If “Abnormal termination” is displayed during data upload, please recheck whether the submitted file matches the required file formats and extensions<\/strong>. If the problem persists, please contact support via the ARIM DICE Inquiry Form.<\/p>\n<\/div>\n","protected":false},"excerpt":{"rendered":"

*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* To Users of ARIM Public Projects (with Data Submission) When utilizing shared equipment in our facility under the “Public Projects (with Data Submission)” framework of the Advanced Research Infrastructure for Materials and Nanotechnology in … Guidance on ARIM Data Registration (Equipment POPs & Required Data Files)<\/span><\/a><\/p>\n","protected":false},"author":11,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_locale":"en_US","_original_post":"6042","footnotes":""},"class_list":["post-6044","page","type-page","status-publish","hentry","en-US"],"_links":{"self":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/6044","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/users\/11"}],"replies":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/comments?post=6044"}],"version-history":[{"count":2,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/6044\/revisions"}],"predecessor-version":[{"id":6055,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/6044\/revisions\/6055"}],"wp:attachment":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/media?parent=6044"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}