{"id":5373,"date":"2026-08-05T11:39:12","date_gmt":"2026-08-05T02:39:12","guid":{"rendered":"https:\/\/www.aem.imr.tohoku.ac.jp\/?p=5373"},"modified":"2026-08-05T11:39:12","modified_gmt":"2026-08-05T02:39:12","slug":"website-updates-using-an-ai-agent","status":"publish","type":"post","link":"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/website-updates-using-an-ai-agent\/","title":{"rendered":"Website Updates Using an AI Agent"},"content":{"rendered":"<p>*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.*<\/p>\n<p>Overview<br \/>\nThe Division of Analytical Electron Microscopy has been using an AI agent to help update this website. Updates had often been delayed due to staff shortages, but AI assistance now allows us to update the site far more efficiently, and we are working through a broader reorganization of the site, including expanding equipment introduction pages and reorganizing the Equipment List page.<\/p>\n<p>Details<br \/>\n&#8211; New equipment introduction pages have been created for equipment that was already listed on the Equipment List page but did not yet have a dedicated introduction page, based on manuals and specification information.<br \/>\n&#8211; The Equipment List page itself has also been reorganized, including consistent formatting, added funding-source\/origin information, and improved navigation.<\/p>\n<p>Recently created or updated pages (examples):<br \/>\n&#8211; Equipment List<\/p>\n<blockquote class=\"wp-embedded-content\" data-secret=\"CzC8epiHeV\"><p><a href=\"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/%e8%a3%85%e7%bd%ae%e4%b8%80%e8%a6%a7\/\">Equipment list<\/a><\/p><\/blockquote>\n<p><iframe loading=\"lazy\" class=\"wp-embedded-content\" sandbox=\"allow-scripts\" security=\"restricted\" style=\"position: absolute; visibility: hidden;\" title=\"\u201cEquipment list\u201d \u2014 AEM\uff5c\u91d1\u7814\u5206\u6790\u96fb\u9855\u5ba4\" src=\"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/%e8%a3%85%e7%bd%ae%e4%b8%80%e8%a6%a7\/embed\/#?secret=ijNcMyLYh6#?secret=CzC8epiHeV\" data-secret=\"CzC8epiHeV\" width=\"600\" height=\"338\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\"><\/iframe><br \/>\n&#8211; Transmission Electron Microscope JEOL JEM-2100Plus<\/p>\n<blockquote class=\"wp-embedded-content\" data-secret=\"hYNgfS1Zyl\"><p><a href=\"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/transmission-electron-microscope-jeol-jem-2100plus\/\">Transmission Electron Microscope JEOL JEM-2100Plus<\/a><\/p><\/blockquote>\n<p><iframe loading=\"lazy\" class=\"wp-embedded-content\" sandbox=\"allow-scripts\" security=\"restricted\" style=\"position: absolute; visibility: hidden;\" title=\"\u201cTransmission Electron Microscope JEOL JEM-2100Plus\u201d \u2014 AEM\uff5c\u91d1\u7814\u5206\u6790\u96fb\u9855\u5ba4\" src=\"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/transmission-electron-microscope-jeol-jem-2100plus\/embed\/#?secret=cYbr0ebqtw#?secret=hYNgfS1Zyl\" data-secret=\"hYNgfS1Zyl\" width=\"600\" height=\"338\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\"><\/iframe><br \/>\n&#8211; Focused Ion Beam System Thermo Fisher Scientific Versa 3D<\/p>\n<blockquote class=\"wp-embedded-content\" data-secret=\"pwsu9k2WSK\"><p><a href=\"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/focused-ion-beam-system-thermo-fisher-scientific-versa-3d\/\">Focused Ion Beam System Thermo Fisher Scientific Versa 3D<\/a><\/p><\/blockquote>\n<p><iframe loading=\"lazy\" class=\"wp-embedded-content\" sandbox=\"allow-scripts\" security=\"restricted\" style=\"position: absolute; visibility: hidden;\" title=\"\u201cFocused Ion Beam System Thermo Fisher Scientific Versa 3D\u201d \u2014 AEM\uff5c\u91d1\u7814\u5206\u6790\u96fb\u9855\u5ba4\" src=\"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/focused-ion-beam-system-thermo-fisher-scientific-versa-3d\/embed\/#?secret=gt6c9vi7ju#?secret=pwsu9k2WSK\" data-secret=\"pwsu9k2WSK\" width=\"600\" height=\"338\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\"><\/iframe><br \/>\n&#8211; Focused Ion Beam System Thermo Fisher Scientific Quanta 3D<\/p>\n<blockquote class=\"wp-embedded-content\" data-secret=\"DMoMy6EgRQ\"><p><a href=\"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/focused-ion-beam-system-thermo-fisher-scientific-quanta-3d\/\">Focused Ion Beam System Thermo Fisher Scientific Quanta 3D<\/a><\/p><\/blockquote>\n<p><iframe loading=\"lazy\" class=\"wp-embedded-content\" sandbox=\"allow-scripts\" security=\"restricted\" style=\"position: absolute; visibility: hidden;\" title=\"\u201cFocused Ion Beam System Thermo Fisher Scientific Quanta 3D\u201d \u2014 AEM\uff5c\u91d1\u7814\u5206\u6790\u96fb\u9855\u5ba4\" src=\"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/focused-ion-beam-system-thermo-fisher-scientific-quanta-3d\/embed\/#?secret=bArHk9AzNT#?secret=DMoMy6EgRQ\" data-secret=\"DMoMy6EgRQ\" width=\"600\" height=\"338\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\"><\/iframe><br \/>\n&#8211; Plasma Focused Ion Beam System TESCAN AMBER X<\/p>\n<blockquote class=\"wp-embedded-content\" data-secret=\"MQbPxYjGb8\"><p><a href=\"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/plasma-focused-ion-beam-system-tescan-amber-x\/\">Plasma Focused Ion Beam System TESCAN AMBER X<\/a><\/p><\/blockquote>\n<p><iframe loading=\"lazy\" class=\"wp-embedded-content\" sandbox=\"allow-scripts\" security=\"restricted\" style=\"position: absolute; visibility: hidden;\" title=\"\u201cPlasma Focused Ion Beam System TESCAN AMBER X\u201d \u2014 AEM\uff5c\u91d1\u7814\u5206\u6790\u96fb\u9855\u5ba4\" src=\"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/plasma-focused-ion-beam-system-tescan-amber-x\/embed\/#?secret=tAaQbTLClc#?secret=MQbPxYjGb8\" data-secret=\"MQbPxYjGb8\" width=\"600\" height=\"338\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\"><\/iframe><br \/>\n&#8211; Low-Energy Milling System Technoorg Linda Gentle Mill 3<\/p>\n<blockquote class=\"wp-embedded-content\" data-secret=\"wiZlmvQ48g\"><p><a href=\"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/low-energy-milling-system-technoorg-linda-gentle-mill-3\/\">Low-Energy Milling System Technoorg Linda Gentle Mill 3<\/a><\/p><\/blockquote>\n<p><iframe loading=\"lazy\" class=\"wp-embedded-content\" sandbox=\"allow-scripts\" security=\"restricted\" style=\"position: absolute; visibility: hidden;\" title=\"\u201cLow-Energy Milling System Technoorg Linda Gentle Mill 3\u201d \u2014 AEM\uff5c\u91d1\u7814\u5206\u6790\u96fb\u9855\u5ba4\" src=\"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/low-energy-milling-system-technoorg-linda-gentle-mill-3\/embed\/#?secret=dci79R2ieh#?secret=wiZlmvQ48g\" data-secret=\"wiZlmvQ48g\" width=\"600\" height=\"338\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\"><\/iframe><br \/>\n&#8211; Analytical Electron Microscope Topcon EM-002B<br \/>\nhttps:\/\/www.aem.imr.tohoku.ac.jp\/en\/%e8%a3%85%e7%bd%ae%e4%b8%80%e8%a6%a7\/002b\/<br \/>\n&#8211; Transmission Electron Microscope JEOL JEM-2000EXII<br \/>\nhttps:\/\/www.aem.imr.tohoku.ac.jp\/en\/%e8%a3%85%e7%bd%ae%e4%b8%80%e8%a6%a7\/2000exii\/<br \/>\n&#8211; Ion Slicer JEOL EM-09100IS<br \/>\nhttps:\/\/www.aem.imr.tohoku.ac.jp\/en\/%e8%a3%85%e7%bd%ae%e4%b8%80%e8%a6%a7\/%e3%82%a4%e3%82%aa%e3%83%b3%e3%82%b9%e3%83%a9%e3%82%a4%e3%82%b5%e3%83%bc\/<\/p>\n<p>Notes<br \/>\nAs these pages were created with AI assistance, actual equipment configurations or specifications may occasionally differ. If you notice any issues, please contact us using the information below.<\/p>\n<p>Contact<br \/>\nDivision of Analytical Electron Microscopy, IMR<\/p>\n","protected":false},"excerpt":{"rendered":"<p>*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* Overview The Division of Analytical Electron Microscopy has been using an AI agent to help update this website. Updates had often been delayed due to staff shortages, but AI assistance now allows us to <a href=\"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/website-updates-using-an-ai-agent\/\" class=\"more-link\">&#8230;<span class=\"screen-reader-text\">  Website Updates Using an AI Agent<\/span><\/a><\/p>\n","protected":false},"author":11,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_locale":"en_US","_original_post":"5371","footnotes":"","jetpack_post_was_ever_published":false},"categories":[3],"tags":[],"class_list":["post-5373","post","type-post","status-publish","format-standard","hentry","category-notice","en-US"],"jetpack_featured_media_url":"","_links":{"self":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5373","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/users\/11"}],"replies":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/comments?post=5373"}],"version-history":[{"count":1,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5373\/revisions"}],"predecessor-version":[{"id":5374,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5373\/revisions\/5374"}],"wp:attachment":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/media?parent=5373"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/categories?post=5373"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/tags?post=5373"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}