{"id":5413,"date":"2026-08-07T06:55:32","date_gmt":"2026-08-06T21:55:32","guid":{"rendered":"https:\/\/www.aem.imr.tohoku.ac.jp\/?p=5413"},"modified":"2026-08-07T06:55:32","modified_gmt":"2026-08-06T21:55:32","slug":"jem-2100plus%ef%bc%9a%e6%a5%b5%e5%be%ae%e9%9b%bb%e5%ad%90%e5%9b%9e%e6%8a%98","status":"publish","type":"post","link":"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/jem-2100plus%ef%bc%9a%e6%a5%b5%e5%be%ae%e9%9b%bb%e5%ad%90%e5%9b%9e%e6%8a%98\/","title":{"rendered":"JEM-2100plus: Micro-Area Electron Diffraction"},"content":{"rendered":"\n<p class=\"wp-block-paragraph\"><em>Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.<\/em><\/p>\n\n\n<p class=\"wp-block-paragraph\"><em>Original post date (Japanese version): June 22, 2024<\/em><\/p>\n\n\n<p class=\"has-background wp-block-paragraph\">&#x1f4a1; Converge the electron beam on the specimen and acquire a diffraction pattern from a region narrower than the selected area aperture.<\/p>\n\n\n<h3 class=\"wp-block-heading\">NBD\/CBD<\/h3>\n\n\n<ol class=\"wp-block-list\">\n<li><span><strong>Display the image using the normal method.<\/strong><\/span><\/li>\n\n\n<li><span><strong>Change irradiation mode<\/strong><\/span>\n<ol class=\"wp-block-list\">\n<li>[PANEL-L:PROBE CONTROL:NBD\/CBD] Change to probe irradiation mode<\/li>\n<\/ol>\n<\/li>\n\n\n<li><span><strong>Converge and center the beam<\/strong><\/span>\n<ol class=\"wp-block-list\">\n<li>[PANEL-L : BRIGHTNESS] Converge the beam on the fluorescent screen.<\/li>\n\n\n<li>[PANEL-L : DEF\/STIG : BRIGHT TILT] Select Bright Field irradiation mode<\/li>\n\n\n<li>[PANEL-L\/R: SHIFT-X\/Y] Move the beam to the center of the fluorescent screen using Beam Shift<\/li>\n<\/ol>\n<\/li>\n\n\n<li><span><strong>Centering the condenser lens aperture<\/strong><\/span>\n<ol class=\"wp-block-list\">\n<li>[PANEL-L : BRIGHTNESS] Spread the beam to about the same size as the screen<\/li>\n\n\n<li>[CLA: Aperture selection knob] Select the diameter of the condenser aperture.<\/li>\n\n\n<li>[CLA: Aperture position adjustment knob: Front-back\/Left-right] Move the aperture to the center of the screen.<\/li>\n<\/ol>\n<\/li>\n\n\n<li><span><strong>Irradiation system adjustment 1<\/strong><\/span>\n<ol class=\"wp-block-list\">\n<li><span><strong>HT Wobbler On<\/strong><\/span>\n<ol class=\"wp-block-list\">\n<li>[TC : Wobbler Controller : HT] or [PANEL-R: HT WOBB] On<\/li>\n\n\n<li>Acceleration voltage fluctuates and the image expands\/contracts<\/li>\n<\/ol>\n<\/li>\n\n\n<li><span><strong>Irradiation system adjustment (Condenser mini lens)<\/strong><\/span>\n<ol class=\"wp-block-list\">\n<li>[PANEL-L : DEF\/STIG : BRIGHT TILT] or [TC : Alignment Panel : Deflector : Bright Tilt] Select Bright Field irradiation mode<\/li>\n\n\n<li>[PANEL-L\/R: DEF\/STIG-X\/Y] Adjust Beam-Tilt + [PANEL-L\/R: Shift-X\/Y] Beam-Shift so that the convergence of the electron beam becomes isotropic at the center of the fluorescent screen.<\/li>\n<\/ol>\n<\/li>\n\n\n<li><span><strong>HT Wobbler Off<\/strong><\/span>\n<ol class=\"wp-block-list\">\n<li>[TC : Wobbler Controller : HT] or [PANEL-R: HT WOBB] Off<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n<\/li>\n\n\n<li><span><strong>Irradiation system adjustment 2<\/strong><\/span>\n<ol class=\"wp-block-list\">\n<li>[PANEL-L:PROBE CONTROL:TEM] Change to TEM irradiation mode<\/li>\n\n\n<li>[PANEL-L\/R: SHIFT-X\/Y] Move the beam to the center of the fluorescent screen using Beam Shift<\/li>\n\n\n<li>[PANEL-L:PROBE CONTROL:NBD\/CBD] Change to probe irradiation mode<\/li>\n\n\n<li>Repeat the above to minimize the deviation of the electron beam<\/li>\n\n\n<li>[PANEL-L:PROBE CONTROL:TEM] Change to TEM irradiation mode<\/li>\n<\/ol>\n<\/li>\n\n\n<li><span><strong>Insert and center the condenser lens aperture<\/strong><\/span><\/li>\n\n\n<li><span><strong>Specify measurement location<\/strong><\/span>\n<ol class=\"wp-block-list\">\n<li>[PANEL-L : BRIGHTNESS] Converge the beam on the fluorescent screen.<\/li>\n\n\n<li>[PANEL-L\/R: SHIFT-X\/Y] Move the beam to the measurement location using Beam Shift.<\/li>\n<\/ol>\n<\/li>\n\n\n<li><span><strong>Display electron diffraction<\/strong><\/span>\n<ol class=\"wp-block-list\">\n<li>[PANEL-R : Function : SA DIFF] <span><strong>Change to diffraction mode<\/strong><\/span><\/li>\n\n\n<li>[PANEL-R : MAG\/CAM L] <span><strong>Set camera length<\/strong><\/span><\/li>\n\n\n<li>Spot centering\n<ol class=\"wp-block-list\">\n<li>[PANEL-L : DEF\/STIG : PLA] Select Projector Lens Alignment mode<\/li>\n\n\n<li>[PANEL-L\/R: DEF\/STIG-X\/Y] Center the transmitted wave to the center of the fluorescent screen<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n\n\n<h3 class=\"wp-block-heading\">Simplified Method<\/h3>\n\n\n<ol class=\"wp-block-list\">\n<li><span><strong>Display DIFF using the normal method<\/strong><\/span>\n<ol class=\"wp-block-list\">\n<li>Adjust diff focus in advance<\/li>\n<\/ol>\n<\/li>\n\n\n<li><span><strong>Display the image using the normal method.<\/strong><\/span><\/li>\n\n\n<li><span><strong>Irradiate the measurement location with beam<\/strong><\/span>\n<ol class=\"wp-block-list\">\n<li>[CLA#4(\u03a610um)] Insert and center a small CL aperture<\/li>\n\n\n<li>[PANEL-L : PROBE CONTROL : SPOT SIZE] 5: Decrease SPOT size<\/li>\n\n\n<li>[PANEL-L : BRIGHTNESS] Converge the beam on the fluorescent screen.<\/li>\n\n\n<li>Adjust CL-STIG\n<ol class=\"wp-block-list\">\n<li>[PANEL-L : DEF\/STIG : COND STIG] Select Condenser Lens Astigmatism adjustment mode<\/li>\n\n\n<li>[PANEL-L\/R: DEF\/STIG-X\/Y] (Cond STIG) Adjust so that the beam is maximally converged<\/li>\n<\/ol>\n<\/li>\n\n\n<li>[PANEL-L\/R: SHIFT-X\/Y] Move the beam to the measurement location using Beam Shift.\n<ul class=\"wp-block-list\">\n<li>It is better to move the specimen rather than moving the beam from the center of the screen as much as possible.<\/li>\n<\/ul>\n<\/li>\n<\/ol>\n<\/li>\n\n\n<li><span><strong>Display electron diffraction<\/strong><\/span>\n<ol class=\"wp-block-list\">\n<li>[PANEL-R : Function : SA DIFF] <span><strong>Change to diffraction mode<\/strong><\/span><\/li>\n\n\n<li>[PANEL-R : MAG\/CAM L] <span><strong>Set camera length<\/strong><\/span><\/li>\n\n\n<li>Spot centering\n<ol class=\"wp-block-list\">\n<li>[PANEL-L : DEF\/STIG : PLA] Select Projector Lens Alignment mode<\/li>\n\n\n<li>[PANEL-L\/R: DEF\/STIG-X\/Y] Center the transmitted wave to the center of the fluorescent screen<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n\n\n<p class=\"wp-block-paragraph\"><em>*This post was created by an AI agent.<\/em><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 &#x1f4a1; Converge the electron beam on the specimen and acquire a diffraction pattern from a region narrower than the selected area aperture. NBD\/CBD Simplified Method *This <a href=\"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/jem-2100plus%ef%bc%9a%e6%a5%b5%e5%be%ae%e9%9b%bb%e5%ad%90%e5%9b%9e%e6%8a%98\/\" class=\"more-link\">&#8230;<span class=\"screen-reader-text\">  JEM-2100plus: Micro-Area Electron Diffraction<\/span><\/a><\/p>\n","protected":false},"author":11,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_locale":"en_US","_original_post":"https:\/\/www.aem.imr.tohoku.ac.jp\/?p=3223","footnotes":"","jetpack_post_was_ever_published":false},"categories":[1],"tags":[],"class_list":["post-5413","post","type-post","status-publish","format-standard","hentry","category-uncategorized","en-US"],"jetpack_featured_media_url":"","_links":{"self":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5413","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/users\/11"}],"replies":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/comments?post=5413"}],"version-history":[{"count":4,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5413\/revisions"}],"predecessor-version":[{"id":5752,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5413\/revisions\/5752"}],"wp:attachment":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/media?parent=5413"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/categories?post=5413"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/tags?post=5413"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}