{"id":5415,"date":"2026-08-07T06:55:33","date_gmt":"2026-08-06T21:55:33","guid":{"rendered":"https:\/\/www.aem.imr.tohoku.ac.jp\/?p=5415"},"modified":"2026-08-07T06:55:33","modified_gmt":"2026-08-06T21:55:33","slug":"jem-2100plus%ef%bc%9a%e6%9a%97%e8%a6%96%e9%87%8e%e5%83%8f%e8%a6%b3%e5%af%9f","status":"publish","type":"post","link":"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/jem-2100plus%ef%bc%9a%e6%9a%97%e8%a6%96%e9%87%8e%e5%83%8f%e8%a6%b3%e5%af%9f\/","title":{"rendered":"JEM-2100Plus: Dark Field Image Observation"},"content":{"rendered":"\n<p class=\"wp-block-paragraph\"><em>Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.<\/em><\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><em>Original post date (Japanese version): June 22, 2024<\/em><\/p>\n\n\n\n<h3 class=\"wp-block-heading\">Dark field image (on axis)<\/h3>\n\n\n<p class=\"has-background wp-block-paragraph\">&#x1f4a1; This page is a quick manual for JEM-2100plus.\nContents are subject to change.\nPlease receive training before actually using the equipment.<\/p>\n\n\n<ol class=\"wp-block-list\">\n<li><span><strong>Display the statue in the usual way.<\/strong><\/span>\n<ul class=\"wp-block-list\">\n<li>(Reference) Image observation diffraction (basic) Focus<\/li>\n<\/ul>\n<\/li>\n\n\n<li><span><strong>[PANEL-L: DEF\/STIG: BRIGHT TILT] or [TC: Alignment Panel: Deflector: Bright Tilt] Bright field irradiation mode selection<\/strong><\/span><\/li>\n\n\n<li><span><strong>[PANEL-R : Function : SA DIFF] Go to diffraction mode<\/strong><\/span>\n<ol class=\"wp-block-list\">\n<li>DIFF display on screen\n<ul class=\"wp-block-list\">\n<li>Display DIFF in the usual way. (Reference) Electron diffraction (basic)<\/li>\n<\/ul>\n<\/li>\n\n\n<li>Camera length specification<\/li>\n\n\n<li>spot centering<\/li>\n\n\n<li>DIFF display on camera<\/li>\n\n\n<li>Mark the position of the transmitted wave (center of the fluorescent screen)<\/li>\n<\/ol>\n<\/li>\n\n\n<li><span><strong>Preparation (DarkTilt reset)<\/strong><\/span>\n<ol class=\"wp-block-list\">\n<li>[TEM Center: Top menu] Control \u2192 Illumination System\n<ol class=\"wp-block-list\">\n<li>Illumination System Controller (for JEM Administrators) is displayed.<\/li>\n<\/ol>\n<\/li>\n\n\n<li>[TC: Illumination System Controller: Image Field: Dark1~Dark5] Select DarkTilt number<\/li>\n\n\n<li>[TC: Alignment Panel: Deflector: Dark Tilt] Select dark field irradiation mode.<\/li>\n\n\n<li>[TC: Alignment Panel:Neutralize Selected Alignment]Reset DarkTilt (match BrightTilt)\n<ul class=\"wp-block-list\">\n<li>Confirm that the transmitted wave is at the center of the fluorescent screen (mark position)<\/li>\n<\/ul>\n<\/li>\n\n\n<li>Reset all necessary DarkTilts.<\/li>\n<\/ol>\n<\/li>\n\n\n<li><span><strong>BeamTilt\u3092\u30e1\u30e2\u30ea<\/strong><\/span>\n<ol class=\"wp-block-list\">\n<li>[TC: Illumination System Controller: Image Field: Dark1~Dark5] Select DarkTilt number<\/li>\n\n\n<li>[PANEL-L\/R: DEF\/STIG-X\/Y] Use Beam-Tilt to move the diffraction spot used for imaging to the position of the transmitted wave (center of the fluorescent screen).<\/li>\n\n\n<li>Set all necessary DarkTilts.<\/li>\n<\/ol>\n<\/li>\n\n\n<li><span><strong>Insert OL aperture<\/strong><\/span>\n<ol class=\"wp-block-list\">\n<li>[TC: Alignment Panel: Deflector: Bright Tilt] Bright field irradiation mode selection<\/li>\n\n\n<li>Insert the smallest OL<\/li>\n\n\n<li>Center the OL (extend the exposure time if it is difficult to see)<\/li>\n<\/ol>\n<\/li>\n\n\n<li><span><strong>show statue<\/strong><\/span>\n<ol class=\"wp-block-list\">\n<li>[PANEL-R : Function : MAG1] <span><strong>Go to image observation mode<\/strong><\/span>\n<ol class=\"wp-block-list\">\n<li>[PANEL-L: DEF\/STIG: BRIGHT TILT] or [TC: Alignment Panel: Deflector: Bright Tilt] Bright field irradiation mode selection<\/li>\n\n\n<li>remove SA<\/li>\n\n\n<li>A bright field image is displayed (quite dark at this point)<\/li>\n<\/ol>\n<\/li>\n\n\n<li>[PANEL-L: BRIGHTNESS] Focus the beam to a brightness that makes it easy to observe bright-field images<\/li>\n\n\n<li>Display image with camera\n<ol class=\"wp-block-list\">\n<li>[GMS : TEM Imaging : View] (Exposure : 0.1sec) Camera insertion\/(BF) display<\/li>\n\n\n<li>[PANEL-R: DIFF FOCUS] Focusing<\/li>\n<\/ol>\n<\/li>\n\n\n<li>[TC: Illumination System Controller: Image Field: Dark1~5] Select DarkTilt number\n<ol class=\"wp-block-list\">\n<li>DF is displayed<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n<\/li>\n\n\n<li><span><strong>photograph<\/strong><\/span>\n<ol class=\"wp-block-list\">\n<li>[GMS : TEM Imaging : Capture]  (Exposure : 5~10sec) <\/li>\n<\/ol>\n<\/li>\n<\/ol>\n\n\n<h3 class=\"wp-block-heading\">Dark field image (off-axis)<\/h3>\n\n\n<ol class=\"wp-block-list\">\n<li><span><strong>Display the statue in the usual way.<\/strong><\/span>\n<ul class=\"wp-block-list\">\n<li>(Reference) Image observation diffraction (basic) Focus<\/li>\n<\/ul>\n<\/li>\n\n\n<li><span><strong>[PANEL-R : Function : SA DIFF] Go to diffraction mode<\/strong><\/span>\n<ul class=\"wp-block-list\">\n<li>Display DIFF in the usual way. (Reference) Electron diffraction (basic)<\/li>\n<\/ul>\n<\/li>\n\n\n<li><span><strong>Diffraction wave selection<\/strong><\/span>\n<ol class=\"wp-block-list\">\n<li>[PANEL-L: BRIGHTNESS] Narrow down the beam to a brightness that makes it easy to observe DIFF.\n<ol class=\"wp-block-list\">\n<li>Also set DIFF Focus<\/li>\n<\/ol>\n<\/li>\n\n\n<li>Insert OLA (electric) or HCA (manual)<\/li>\n\n\n<li>Choose a small enough aperture (usually the smallest)<\/li>\n\n\n<li>Move the aperture to the position of the diffracted wave<\/li>\n<\/ol>\n<\/li>\n\n\n<li><span><strong>show statue<\/strong><\/span>\n<ol class=\"wp-block-list\">\n<li>[PANEL-R : Function : MAG1] <span><strong>Go to image observation mode<\/strong><\/span><\/li>\n\n\n<li>Remove [SA]\n<ol class=\"wp-block-list\">\n<li>A dark field image is displayed.<\/li>\n<\/ol>\n<\/li>\n\n\n<li>[GMS : TEM Imaging : View] (Exposure : ~1sec) Camera insertion\/(DF) display<\/li>\n<\/ol>\n<\/li>\n\n\n<li><span><strong>photograph<\/strong><\/span>\n<ol class=\"wp-block-list\">\n<li>[GMS : TEM Imaging : Capture]  (Exposure : 5~10sec) <\/li>\n<\/ol>\n<\/li>\n<\/ol>\n\n\n\n\n<p class=\"wp-block-paragraph\"><em>*This post was created by an AI agent.<\/em><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 Dark field image (on axis) &#x1f4a1; This page is a quick manual for JEM-2100plus. Contents are subject to change. Please receive training before actually using the <a href=\"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/jem-2100plus%ef%bc%9a%e6%9a%97%e8%a6%96%e9%87%8e%e5%83%8f%e8%a6%b3%e5%af%9f\/\" class=\"more-link\">&#8230;<span class=\"screen-reader-text\">  JEM-2100Plus: Dark Field Image Observation<\/span><\/a><\/p>\n","protected":false},"author":11,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_locale":"en_US","_original_post":"https:\/\/www.aem.imr.tohoku.ac.jp\/?p=3222","footnotes":"","jetpack_post_was_ever_published":false},"categories":[1],"tags":[],"class_list":["post-5415","post","type-post","status-publish","format-standard","hentry","category-uncategorized","en-US"],"jetpack_featured_media_url":"","_links":{"self":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5415","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/users\/11"}],"replies":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/comments?post=5415"}],"version-history":[{"count":4,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5415\/revisions"}],"predecessor-version":[{"id":5786,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5415\/revisions\/5786"}],"wp:attachment":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/media?parent=5415"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/categories?post=5415"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/tags?post=5415"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}