{"id":5416,"date":"2026-08-07T06:55:33","date_gmt":"2026-08-06T21:55:33","guid":{"rendered":"https:\/\/www.aem.imr.tohoku.ac.jp\/?p=5416"},"modified":"2026-08-07T06:55:33","modified_gmt":"2026-08-06T21:55:33","slug":"jem-2100plus%ef%bc%9a%e6%8a%80%e8%83%bd%e8%ac%9b%e7%bf%92%ef%bc%9a%e5%88%9d%e7%b4%9a2","status":"publish","type":"post","link":"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/jem-2100plus%ef%bc%9a%e6%8a%80%e8%83%bd%e8%ac%9b%e7%bf%92%ef%bc%9a%e5%88%9d%e7%b4%9a2\/","title":{"rendered":"JEM-2100Plus: Skill Training: Beginner 2"},"content":{"rendered":"\n

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.<\/em><\/p>\n\n\n\n

Original post date (Japanese version): June 22, 2024<\/em><\/p>\n\n\n\n

💡 Today’s content<\/p>\n\n\n

    \n
  1. Sample contamination prevention device (ACD)<\/strong><\/span>\n

    💡 Preventing contamination when using focused beams (STEM\/EDS) and in-situ observation.\nTrap the gas around the sample with an LN2 cold finger.<\/p>\n\n\n

      \n
    1. LN2 supply<\/li>\n\n\n
    2. ACD heat<\/li>\n<\/ol>\n\n\n

      💡 This is not to increase the degree of vacuum, but to prevent contamination.<\/p>\n<\/li>\n\n\n

    3. alignment file<\/strong><\/span>\n

      💡 Restore and save deflection system settings.<\/p>\n\n\n

        \n
      1. Load configuration file<\/li>\n\n\n
      2. Save settings file<\/li>\n<\/ol>\n<\/li>\n\n\n
      3. Special image observation<\/strong><\/span>\n

        💡 Basic TEM image display<\/p>\n\n\n

          \n
        1. Bright field image (review)<\/strong><\/span>\n

          💡 Select and image the transmitted wave on the optical axis with a (small) objective aperture<\/p>\n\n\n

            \n
          1. Normal image observation (screen)<\/li>\n\n\n
          2. Bright field image display\n
              \n
            1. Selected field aperture insertion\/SA aperture centering<\/li>\n\n\n
            2. Diffraction pattern display\/transmitted wave centering (PL)<\/li>\n\n\n
            3. Objective aperture insertion\/OL centering<\/li>\n\n\n
            4. Bright field image display\/magnification\/brightness adjustment<\/li>\n<\/ol>\n<\/li>\n\n\n
            5. CCD observation\/photography<\/li>\n<\/ol>\n<\/li>\n\n\n
            6. Dark field image (on axis)<\/strong><\/span>\n

              💡 Diffraction waves moved onto the optical axis using Beam Tlit are selected and imaged using the objective aperture.<\/p>\n\n\n

                \n
              1. SA-DIFF display (screen)<\/li>\n\n\n
              2. Transmitted wave centering (PL)<\/li>\n\n\n
              3. DarkTilt: Diffraction spot -> to the center of the screen (Dark Tilt)<\/li>\n\n\n
              4. Objective aperture insertion\/OL centering<\/li>\n\n\n
              5. Dark field image display\/magnification\/brightness adjustment<\/li>\n\n\n
              6. CCD observation\/photography<\/li>\n<\/ol>\n<\/li>\n\n\n
              7. Dark field image (off-axis)<\/strong><\/span>\n

                💡 Select and image diffracted waves off the optical axis using the objective aperture<\/p>\n\n\n

                  \n
                1. SA-DIFF display (screen)<\/li>\n\n\n
                2. Objective aperture insertion\/diffraction spot selection<\/li>\n\n\n
                3. Dark field image display\/magnification\/brightness adjustment<\/li>\n\n\n
                4. CCD observation\/photography<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n<\/li>\n\n\n
                5. microelectron diffraction<\/strong><\/span>\n

                  💡 \u96fb\u5b50\u7dda\u3092\u8a66\u6599\u4e0a\u3067\u53ce\u675f\u3057\u3001\u5fae\u5c0f\u9818\u57df\uff08\u5236\u9650\u8996\u91ce\u7d5e\u308a\u306e\u30b5\u30a4\u30ba\u4ee5\u4e0b\uff09\u304b\u3089\u306e\u96fb\u5b50\u56de\u6298\u30d1\u30bf\u30fc\u30f3\u3092\u53d6\u5f97<\/p>\n\n\n

                    \n
                  1. Simple method<\/strong><\/span>\n
                      \n
                    1. In normal TEM irradiation mode, select a small CL aperture and spot size and focus the beam onto the sample.<\/li>\n<\/ol>\n<\/li>\n\n\n
                    2. NBD\/CBD<\/strong><\/span>\n
                        \n
                      1. Focus the beam onto the sample using a dedicated probe illumination mode.<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n<\/li>\n\n\n
                      2. STEM<\/strong><\/span>\n

                        💡 Observation and acquisition of STEM images<\/p>\n\n\n

                          \n
                        1. hardware<\/li>\n\n\n
                        2. TEM CENTER<\/li>\n\n\n
                        3. STEM-BF<\/li>\n\n\n
                        4. STEM-DF<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n\n\n\n\n

                          *This post was created by an AI agent.<\/em><\/p>\n","protected":false},"excerpt":{"rendered":"

                          Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 Today’s content *This post was created by an AI agent.<\/p>\n","protected":false},"author":11,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_locale":"en_US","_original_post":"https:\/\/www.aem.imr.tohoku.ac.jp\/?p=3219","footnotes":"","jetpack_post_was_ever_published":false},"categories":[1],"tags":[],"class_list":["post-5416","post","type-post","status-publish","format-standard","hentry","category-uncategorized","en-US"],"jetpack_featured_media_url":"","_links":{"self":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5416","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/users\/11"}],"replies":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/comments?post=5416"}],"version-history":[{"count":4,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5416\/revisions"}],"predecessor-version":[{"id":5787,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5416\/revisions\/5787"}],"wp:attachment":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/media?parent=5416"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/categories?post=5416"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/tags?post=5416"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}