{"id":5427,"date":"2026-08-07T06:55:33","date_gmt":"2026-08-06T21:55:33","guid":{"rendered":"https:\/\/www.aem.imr.tohoku.ac.jp\/?p=5427"},"modified":"2026-08-07T06:55:33","modified_gmt":"2026-08-06T21:55:33","slug":"jem-2100plus%ef%bc%9a%e3%82%bd%e3%83%95%e3%83%88%e3%82%a6%e3%82%a7%e3%82%a2%ef%bc%9a%e9%9b%bb%e5%ad%90%e5%9b%9e%e6%8a%98","status":"publish","type":"post","link":"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/jem-2100plus%ef%bc%9a%e3%82%bd%e3%83%95%e3%83%88%e3%82%a6%e3%82%a7%e3%82%a2%ef%bc%9a%e9%9b%bb%e5%ad%90%e5%9b%9e%e6%8a%98\/","title":{"rendered":"JEM-2100Plus: Software: Electron Diffraction"},"content":{"rendered":"\n

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.<\/em><\/p>\n\n\n\n

Original post date (Japanese version): June 22, 2024<\/em><\/p>\n\n\n\n

Electron diffraction simulation<\/h3>\n\n\n

💡Electron diffraction simulation with Recipro<\/p>\n\n\n

    \n
  1. Preparation of crystal structure data<\/strong><\/span>\n
      \n
    1. Search for crystal structure data in literature.<\/li>\n\n\n
    2. You can also obtain the cif file from ICSD etc.<\/li>\n<\/ol>\n<\/li>\n\n\n
    3. Working with ReciPro<\/strong><\/span>\n
        \n
      1. boot<\/strong><\/span>\n
          \n
        1. Main window is displayed<\/li>\n<\/ol>\n<\/li>\n\n\n
        2. Crystal structure data input (if necessary)<\/strong><\/span>\n
            \n
          1. Enter crystal information directly (at the bottom of the window) or [File: Load crystal from CIF or AMC file]<\/li>\n\n\n
          2. Click \u2191Add to list\u2191\n
              \n
            1. added to list<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n<\/li>\n\n\n
            2. Crystal structure selection<\/strong><\/span>\n
                \n
              1. Select the structure to simulate from the crystal list\n
                  \n
                1. Crystal structure information is loaded<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n<\/li>\n\n\n
                2. Electron diffraction simulation<\/strong><\/span>\n
                    \n
                  1. Select the [Diffraction Simulator] button\n
                      \n
                    1. The diffraction simulator window will appear.<\/li>\n<\/ol>\n<\/li>\n\n\n
                    2. [Crystal structure button]\n
                        \n
                      1. Structure Viewer window is displayed<\/li>\n<\/ol>\n<\/li>\n\n\n
                      2. setting\n
                          \n
                        1. Default values \u200b\u200bare OK for the following\n
                            \n
                          1. screen<\/li>\n\n\n
                          2. Detector information<\/li>\n\n\n
                          3. center of screen<\/li>\n<\/ol>\n<\/li>\n\n\n
                          4. Simulation conditions\n
                              \n
                            1. Ray source: Electron beam energy 200kV\n
                                \n
                              1. Match TEM conditions<\/li>\n<\/ol>\n<\/li>\n\n\n
                              2. Incident beam: parallel<\/li>\n\n\n
                              3. Strength calculation: kinetic effects<\/li>\n\n\n
                              4. Spot shape: Gaussian function<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n<\/li>\n\n\n
                              5. Sample orientation specification\n
                                  \n
                                1. direct specification\n
                                    \n
                                  1. Zone axis\/crystal plane\/gonio tilt (Euler angle)<\/li>\n<\/ol>\n<\/li>\n\n\n
                                  2. Specify by dragging the mouse\n
                                      \n
                                    1. You can move the crystal orientation by dragging the mouse on the diffraction simulator or Structure Viewer.<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n\n\n

                                      Electron diffraction pattern indexing<\/h3>\n\n\n

                                      💡 CrysTBox<\/strong>\u00a0(Crystallographic Tool Box<\/em>) for indexing single-crystal diffraction patterns.<\/p>\n\n\n

                                        \n
                                      1. preparation<\/strong><\/span>\n
                                          \n
                                        1. Obtain electron diffraction pattern<\/strong><\/span>\n
                                            \n
                                          1. DM3\/DM4 format is easy to use.<\/li>\n\n\n
                                          2. A pattern as close to the zone axis as possible from a single phase is desirable.\n
                                              \n
                                            1. Even if they are mixed to some extent, people can distinguish them by looking at the crystal structure.Crystal structure<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n<\/li>\n\n\n
                                            2. Preparation of crystal structure data<\/strong><\/span>\n
                                                \n
                                              1. Search for crystal structure data in literature.<\/li>\n\n\n
                                              2. You can also obtain the cif file from ICSD etc. (recommended)<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n<\/li>\n\n\n
                                              3. Working with CrysTBox<\/strong><\/span>\n
                                                  \n
                                                1. boot<\/strong><\/span>\n
                                                    \n
                                                  1. Click on the CrysTBox icon to launch the application.\n
                                                      \n
                                                    1. CrysTBox Server window is displayed<\/li>\n<\/ol>\n<\/li>\n\n\n
                                                    2. Click the [diffractGUI] button\n
                                                        \n
                                                      1. \u3000CrysTBox DiffractGUI <\/strong>A window will appear.<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n<\/li>\n\n\n
                                                      2. Diffraction pattern reading<\/strong><\/span>\n
                                                          \n
                                                        1. Click the [Input image: Browse] button<\/li>\n\n\n
                                                        2. Load the electron diffraction pattern image file [dm3\/dm4].<\/li>\n<\/ol>\n<\/li>\n\n\n
                                                        3. Load crystal structure data<\/strong><\/span>\n
                                                            \n
                                                          1. Select File from the [Input image: Material] drop-down list<\/li>\n\n\n
                                                          2. Load cif file<\/li>\n<\/ol>\n<\/li>\n\n\n
                                                          3. indexing<\/strong><\/span>\n
                                                              \n
                                                            1. Click the [Procedure: Launch all] button\n
                                                                \n
                                                              1. The following will be executed automatically\n
                                                                  \n
                                                                1. Automatic extraction of diffraction spots<\/li>\n\n\n
                                                                2. Crystal lattice selection<\/li>\n\n\n
                                                                3. Zone axis search (indexing)<\/li>\n<\/ol>\n<\/li>\n\n\n
                                                                4. If the Rating is other than good\/excellent, consider the possibility that the quality of the diffraction pattern is poor or the assumed structure is incorrect.<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n\n\n\n\n

                                                                  *This post was created by an AI agent.<\/em><\/p>\n","protected":false},"excerpt":{"rendered":"

                                                                  Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 Electron diffraction simulation 💡Electron diffraction simulation with Recipro Electron diffraction pattern indexing 💡 CrysTBox\u00a0(Crystallographic Tool Box) for indexing single-crystal diffraction patterns. *This post was created by … JEM-2100Plus: Software: Electron Diffraction<\/span><\/a><\/p>\n","protected":false},"author":11,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_locale":"en_US","_original_post":"https:\/\/www.aem.imr.tohoku.ac.jp\/?p=3218","footnotes":"","jetpack_post_was_ever_published":false},"categories":[1],"tags":[],"class_list":["post-5427","post","type-post","status-publish","format-standard","hentry","category-uncategorized","en-US"],"jetpack_featured_media_url":"","_links":{"self":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5427","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/users\/11"}],"replies":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/comments?post=5427"}],"version-history":[{"count":3,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5427\/revisions"}],"predecessor-version":[{"id":5789,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5427\/revisions\/5789"}],"wp:attachment":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/media?parent=5427"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/categories?post=5427"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/tags?post=5427"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}