{"id":5434,"date":"2026-08-07T06:55:34","date_gmt":"2026-08-06T21:55:34","guid":{"rendered":"https:\/\/www.aem.imr.tohoku.ac.jp\/?p=5434"},"modified":"2026-08-07T06:55:34","modified_gmt":"2026-08-06T21:55:34","slug":"jem-2100plus%ef%bc%9a%e9%9b%bb%e5%ad%90%e5%9b%9e%e6%8a%98%ef%bc%88%e5%9f%ba%e6%9c%ac%ef%bc%89","status":"publish","type":"post","link":"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/jem-2100plus%ef%bc%9a%e9%9b%bb%e5%ad%90%e5%9b%9e%e6%8a%98%ef%bc%88%e5%9f%ba%e6%9c%ac%ef%bc%89\/","title":{"rendered":"JEM-2100Plus: Electron Diffraction (Basic)"},"content":{"rendered":"\n

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.<\/em><\/p>\n\n\n\n

Original post date (Japanese version): June 22, 2024<\/em><\/p>\n\n\n\n

💡 This page is a quick manual for JEM-2100plus.\nContents are subject to change.\nPlease receive training before actually using the equipment.<\/p>\n\n\n

    \n
  1. Search field of view in image observation mode<\/strong><\/span>\n
      \n
    1. [TB] \u30c8\u30e9\u30c3\u30af\u30dc\u30fc\u30eb\u3067\u89b3\u5bdf\u5bfe\u8c61\u3092\u8996\u91ce\u4e2d\u5fc3\u3078\u79fb\u52d5<\/li>\n\n\n
    2. Focusing (coarse)<\/strong><\/span>have completed<\/li>\n<\/ol>\n<\/li>\n\n\n
    3. [SA] Selected field diaphragm insertion\/centering<\/strong><\/span><\/li>\n\n\n
    4. [PANEL-R : Function : SA DIFF] Go to diffraction mode<\/strong><\/span>\n
        \n
      1. [PANEL-L : APERTURE CONTROL :OL(OPEN)] Objective aperture: OPEN<\/li>\n\n\n
      2. [HCA] High contrast objective aperture: OPEN<\/li>\n<\/ol>\n<\/li>\n\n\n
      3. [PANEL-R : MAG\/CAM L] Camera length setting<\/strong><\/span>(Normal: 80cm)<\/li>\n\n\n
      4. [PANEL-L : BRIGHTNESS] Expand the beam (darken it\/bring it closer to parallel illumination)<\/strong><\/span><\/li>\n\n\n
      5. DIFF Focus adjustment<\/strong><\/span>\n
          \n
        1. [PANEL-R: DIFF FOCUS] Adjust to make the diffraction pattern clear<\/li>\n<\/ol>\n<\/li>\n\n\n
        2. spot centering<\/strong><\/span>\n
            \n
          1. [PANEL-L: DEF\/STIG: PLA] Projection lens alignment mode selection<\/li>\n\n\n
          2. [PANEL-L\/R: DEF\/STIG-X\/Y] Centering the transmitted wave to the center of the fluorescent screen<\/li>\n<\/ol>\n<\/li>\n\n\n
          3. IL astigmatism adjustment (if necessary)<\/strong><\/span>\n
              \n
            1. [TC: Alignment Panel : IL STIG] Projection lens astigmatism correction mode selection<\/li>\n\n\n
            2. [PANEL-L\/R: DEF\/STIG-X\/Y] [PANEL-R: DIFF FOCUS]\n
                \n
              1. Adjusted so that the spot size changes isotropically when changing DIFF Focus before and after crossover.<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n<\/li>\n\n\n
              2. \uff08\u64ae\u5f71\uff09\n
                  \n
                1. [Screen] Shorten the camera length for CCD camera photography. (Normal: 25cm)<\/li>\n\n\n
                2. [screen]spot centering<\/strong><\/span>do<\/li>\n\n\n
                3. [\u30b9\u30af\u30ea\u30fc\u30f3]\u3000\u30d3\u30fc\u30e0\u30b9\u30c8\u30c3\u30d1\u30fc\u3067\u900f\u904e\u6ce2\u3092\u906e\u853d\u3059\u308b\u3002<\/li>\n\n\n
                4. View the diffraction pattern with a CCD camera and adjust focus and brightness<\/li>\n\n\n
                5. take a photo<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n\n\n\n\n

                  *This post was created by an AI agent.<\/em><\/p>\n","protected":false},"excerpt":{"rendered":"

                  Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 This page is a quick manual for JEM-2100plus. Contents are subject to change. Please receive training before actually using the equipment. *This post was created … JEM-2100Plus: Electron Diffraction (Basic)<\/span><\/a><\/p>\n","protected":false},"author":11,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_locale":"en_US","_original_post":"https:\/\/www.aem.imr.tohoku.ac.jp\/?p=3211","footnotes":"","jetpack_post_was_ever_published":false},"categories":[1],"tags":[],"class_list":["post-5434","post","type-post","status-publish","format-standard","hentry","category-uncategorized","en-US"],"jetpack_featured_media_url":"","_links":{"self":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5434","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/users\/11"}],"replies":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/comments?post=5434"}],"version-history":[{"count":4,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5434\/revisions"}],"predecessor-version":[{"id":5796,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5434\/revisions\/5796"}],"wp:attachment":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/media?parent=5434"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/categories?post=5434"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/tags?post=5434"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}