{"id":5459,"date":"2026-08-07T06:55:35","date_gmt":"2026-08-06T21:55:35","guid":{"rendered":"https:\/\/www.aem.imr.tohoku.ac.jp\/?p=5459"},"modified":"2026-08-07T06:55:35","modified_gmt":"2026-08-06T21:55:35","slug":"jem-2100plus%ef%bc%9a%e7%b5%90%e5%83%8f%e3%83%a2%e3%83%bc%e3%83%89%e9%81%b8%e6%8a%9e","status":"publish","type":"post","link":"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/jem-2100plus%ef%bc%9a%e7%b5%90%e5%83%8f%e3%83%a2%e3%83%bc%e3%83%89%e9%81%b8%e6%8a%9e\/","title":{"rendered":"JEM-2100plus: Imaging Mode Selection"},"content":{"rendered":"\n<p class=\"wp-block-paragraph\"><em>Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.<\/em><\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><em>Original post date (Japanese version): June 22, 2024<\/em><\/p>\n\n\n\n<p class=\"has-background wp-block-paragraph\">&#x1f4a1; This page is a quick manual for the JEM-2100plus.\nThe contents are subject to change.\nPlease receive training in advance before actually using the equipment.<\/p>\n\n\n<p class=\"has-background wp-block-paragraph\">&#x1f4a1; Mode (Function) Change and Settings in TEM Mode\nSwitch the excitation of the first intermediate lens to select the image or diffraction pattern to display.<\/p>\n\n\n<h3 class=\"wp-block-heading\">Image Observation Mode (MAG)<\/h3>\n\n\n<p class=\"has-background wp-block-paragraph\">&#x1f4a1; <strong>Imaging mode to display normal magnified images<\/strong>\n(x2000)x8000 ~ x600K\nx2000~6000 has a different lens configuration (objective mini lens on), so the axis is prone to misalignment<\/p>\n\n\n<ol class=\"wp-block-list\">\n<li>[PANEL-R : FUNCTION : MAG1(MAG2)] Mode change\n<ol class=\"wp-block-list\">\n<li>MAG1 memorizes the previously selected magnification. MAG2 recalls the preset value.<\/li>\n<\/ol>\n<\/li>\n\n\n\n<li>Retract SA aperture (if necessary)<\/li>\n\n\n\n<li>Probe selection (if necessary)\n<ol class=\"wp-block-list\">\n<li>[PANEL-L: PROBE CONTROL] Illumination mode: TEM<\/li>\n\n\n<li>[PANEL-L: PROBE CONTROL : \u03b1SELECTOR] Normal: 2<\/li>\n\n\n<li>[PANEL-L: PROBE CONTROL : SPOT SIZE] Normal: 2<\/li>\n<\/ol>\n<\/li>\n\n\n\n<li>[PANEL-R: MAG\/CAM L] Magnification selection<\/li>\n\n\n\n<li>[PANEL-L: BRIGHTNESS] Brightness adjustment<\/li>\n\n\n\n<li>Focus\n<ol class=\"wp-block-list\">\n<li>[PANEL-R: STD FOCUS] Recall objective lens reference current<\/li>\n\n\n<li>[PANEL-SC: \u25bd\u25b3] Specimen height adjustment (Z adjustment)<\/li>\n\n\n<li>[PANEL-R: OBJ Focus] Objective lens focusing<\/li>\n<\/ol>\n<\/li>\n\n\n\n<li>Search for field of view.\n<ol class=\"wp-block-list\">\n<li>When taking pictures, perform the following items each time.\n<ol class=\"wp-block-list\">\n<li>Setting shooting conditions<\/li>\n\n\n<li>Astigmatism correction<\/li>\n\n\n<li>Focusing<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n<\/li>\n<\/ol>\n\n\n<h3 class=\"wp-block-heading\">Diffraction Mode (DIFF)<\/h3>\n\n\n<p class=\"has-background wp-block-paragraph\">&#x1f4a1; <strong>Imaging mode to display electron diffraction patterns<\/strong>\n<strong>Selected Area Electron Diffraction (SAD)<\/strong> \/ Nano Beam Diffraction (NBD) \/ Convergent Beam Electron Diffraction (CBED)<\/p>\n\n\n<ol class=\"wp-block-list\">\n<li>In image observation mode, move the observation target to the center of the field of view.<\/li>\n\n\n\n<li>Focusing (recommended)\n<ol class=\"wp-block-list\">\n<li>Recall objective lens reference current<\/li>\n\n\n<li>Specimen height adjustment (Z adjustment)<\/li>\n<\/ol>\n<\/li>\n\n\n\n<li>Insert selected area aperture\n<ol class=\"wp-block-list\">\n<li>Select aperture diameter<\/li>\n\n\n<li>Aperture centering<\/li>\n<\/ol>\n<\/li>\n\n\n\n<li>Brightness adjustment\n<ol class=\"wp-block-list\">\n<li>Keep it as dark as possible. (Close to parallel beam)<\/li>\n<\/ol>\n<\/li>\n\n\n\n<li>[PANEL-R : FUNCTION : DIFF] Mode change\n<ol class=\"wp-block-list\">\n<li>The diffraction pattern is displayed.<\/li>\n<\/ol>\n<\/li>\n\n\n\n<li>Retract objective aperture (if inserted)<\/li>\n\n\n\n<li>Select camera length<\/li>\n\n\n\n<li>Diffraction pattern centering\n<ol class=\"wp-block-list\">\n<li>SPOT ALIGN<\/li>\n<\/ol>\n<\/li>\n\n\n\n<li>Focusing<\/li>\n<\/ol>\n\n\n<h3 class=\"wp-block-heading\">Very Low Magnification Mode (LOW MAG)<\/h3>\n\n\n<p class=\"has-background wp-block-paragraph\">&#x1f4a1; Image observation mode at very low magnification\nx30 ~ x5000\n<strong>Since the objective lens is turned OFF, the influence of hysteresis is large.\nIf you want stable observation at high magnification, it is better not to use it.<\/strong><\/p>\n\n\n<ol class=\"wp-block-list\">\n<li>[PANEL-R : FUNCTION : LOW MAG] Mode change<\/li>\n\n\n\n<li>Retract SA aperture (if inserted)<\/li>\n\n\n\n<li>Retract objective aperture (if inserted)<\/li>\n\n\n\n<li>[PANEL-R: MAG\/CAM L] Magnification selection<\/li>\n\n\n\n<li>[PANEL-L: BRIGHTNESS] Brightness adjustment<\/li>\n\n\n\n<li>Adjust current axis<\/li>\n<\/ol>\n\n\n<ul class=\"wp-block-list\">\n<li>As a rule, LowMAG mode is used for rough field of view searching<\/li>\n\n\n\n<li>If a low-magnification image photo is required, use SEM.<\/li>\n\n\n\n<li>Astigmatism is corrected with the intermediate lens. (If necessary)<\/li>\n<\/ul>\n\n\n<h3 class=\"wp-block-heading\"><s>Selected Area Magnification Selection Mode (SA MAG)<\/s><\/h3>\n\n\n\n<p class=\"wp-block-paragraph\"><em>*This post was created by an AI agent.<\/em><\/p>\n","protected":false},"excerpt":{"rendered":"<p>Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 &#x1f4a1; This page is a quick manual for the JEM-2100plus. The contents are subject to change. Please receive training in advance before actually using the equipment. <a href=\"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/jem-2100plus%ef%bc%9a%e7%b5%90%e5%83%8f%e3%83%a2%e3%83%bc%e3%83%89%e9%81%b8%e6%8a%9e\/\" class=\"more-link\">&#8230;<span class=\"screen-reader-text\">  JEM-2100plus: Imaging Mode Selection<\/span><\/a><\/p>\n","protected":false},"author":11,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_locale":"en_US","_original_post":"https:\/\/www.aem.imr.tohoku.ac.jp\/?p=3202","footnotes":"","jetpack_post_was_ever_published":false},"categories":[1],"tags":[],"class_list":["post-5459","post","type-post","status-publish","format-standard","hentry","category-uncategorized","en-US"],"jetpack_featured_media_url":"","_links":{"self":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5459","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/users\/11"}],"replies":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/comments?post=5459"}],"version-history":[{"count":4,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5459\/revisions"}],"predecessor-version":[{"id":5760,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5459\/revisions\/5760"}],"wp:attachment":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/media?parent=5459"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/categories?post=5459"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/tags?post=5459"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}