{"id":5465,"date":"2026-08-07T06:55:36","date_gmt":"2026-08-06T21:55:36","guid":{"rendered":"https:\/\/www.aem.imr.tohoku.ac.jp\/?p=5465"},"modified":"2026-08-07T06:55:36","modified_gmt":"2026-08-06T21:55:36","slug":"jem-2100plus-%e8%a9%a6%e6%96%99%e3%82%af%e3%83%aa%e3%83%bc%e3%83%8b%e3%83%b3%e3%82%b0","status":"publish","type":"post","link":"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/jem-2100plus-%e8%a9%a6%e6%96%99%e3%82%af%e3%83%aa%e3%83%bc%e3%83%8b%e3%83%b3%e3%82%b0\/","title":{"rendered":"JEM-2100plus: Specimen Plasma Cleaning"},"content":{"rendered":"\n

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.<\/em><\/p>\n\n\n\n

Original post date (Japanese version): June 22, 2024<\/em><\/p>\n\n\n\n

💡 This page is a quick manual for the JEM-2100plus.\nThe contents are subject to change.\nPlease receive training in advance before actually using the equipment.<\/p>\n\n\n

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  1. Precautions\n
      \n
    1. Cleaning targets\n
        \n
      1. When performing STEM\/EDS<\/li>\n\n\n
      2. Electropolished specimens<\/li>\n\n\n
      3. Solvent-dispersed specimens (fine particles, etc.)<\/li>\n\n\n
      4. Specimens stored for a long time<\/li>\n<\/ol>\n<\/li>\n\n\n
      5. Damage may occur due to unstable discharge or long cleaning time<\/li>\n<\/ol>\n<\/li>\n\n\n\n
      6. Cleaning Procedure\n
          \n
        1. Remove the dummy plug from the ion cleaner<\/li>\n\n\n
        2. Insert the specimen holder into the ion cleaner<\/li>\n\n\n
        3. Set the cleaning time.\n