{"id":5478,"date":"2026-08-07T06:55:37","date_gmt":"2026-08-06T21:55:37","guid":{"rendered":"https:\/\/www.aem.imr.tohoku.ac.jp\/?p=5478"},"modified":"2026-08-07T06:55:37","modified_gmt":"2026-08-06T21:55:37","slug":"jem-2100plus%ef%bc%9a%e6%8a%80%e8%83%bd%e8%ac%9b%e7%bf%92%ef%bc%9a%e5%9f%ba%e7%a4%8e1","status":"publish","type":"post","link":"https:\/\/www.aem.imr.tohoku.ac.jp\/en\/jem-2100plus%ef%bc%9a%e6%8a%80%e8%83%bd%e8%ac%9b%e7%bf%92%ef%bc%9a%e5%9f%ba%e7%a4%8e1\/","title":{"rendered":"JEM-2100plus: Technical Training: Fundamentals 1"},"content":{"rendered":"\n

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.<\/em><\/p>\n\n\n\n

Original post date (Japanese version): June 22, 2024<\/em><\/p>\n\n\n\n

Specimen Mounting ~ Beam Generation\/Stop ~ Specimen Removal<\/h3>\n\n\n
    \n
  1. Accelerating Voltage Application\n
      \n
    • (Reference) Accelerating Voltage Setting<\/li>\n\n\n
    • Change accelerating voltage from standby (160kV) to operating state (200kV)<\/li>\n<\/ul>\n<\/li>\n\n\n\n
    • Specimen Mounting\n
        \n
      • (Reference) Specimen Mounting (Single Tilt Holder \/ Double Tilt Holder)<\/li>\n\n\n
      • Caution: Risk of specimen damage<\/span><\/li>\n\n\n
      • Caution: Risk of holder damage<\/span><\/li>\n<\/ul>\n<\/li>\n\n\n\n
      • Cleaning\n
          \n
        • (Reference) Specimen Cleaning<\/li>\n\n\n
        • Clean the specimen with an ion cleaner.<\/li>\n\n\n
        • Caution: Risk of specimen damage<\/span><\/li>\n<\/ul>\n<\/li>\n\n\n\n
        • Specimen Holder Insertion\n
            \n
          • (Reference) Specimen Holder Insertion<\/li>\n\n\n
          • Caution: Vacuum degradation<\/span><\/li>\n\n\n
          • Caution: Risk of damage to holder, pole piece, and aperture<\/span><\/li>\n<\/ul>\n<\/li>\n\n\n\n
          • Beam Generation\n
              \n
            • (Reference) Beam Generation\/Stop (Fundamentals)<\/li>\n\n\n
            • Generate electron beam with Filament On.<\/li>\n<\/ul>\n<\/li>\n\n\n\n
            • Beam Stop\n
                \n
              • (Reference) Beam Generation\/Stop (Fundamentals)<\/li>\n\n\n
              • Stop electron beam with Filament Off.<\/li>\n<\/ul>\n<\/li>\n\n\n\n
              • Specimen Holder Extraction\n
                  \n
                • (Reference) Specimen Holder Extraction<\/li>\n\n\n
                • Caution: Vacuum degradation<\/span><\/li>\n\n\n
                • Caution: Risk of damage to holder, pole piece, and aperture<\/span><\/li>\n<\/ul>\n<\/li>\n\n\n\n
                • Specimen Removal\n
                    \n
                  • (Reference) Specimen Mounting (Single Tilt Holder \/ Double Tilt Holder)<\/li>\n\n\n
                  • Caution: Risk of specimen damage<\/span><\/li>\n\n\n
                  • Caution: Risk of holder damage<\/span><\/li>\n<\/ul>\n<\/li>\n\n\n\n
                  • Standby\n
                      \n
                    • (Reference) Accelerating Voltage Setting<\/li>\n\n\n
                    • Change accelerating voltage from operating state (200kV) to standby (160kV)<\/li>\n<\/ul>\n<\/li>\n<\/ol>\n\n\n\n

                      *This post was created by an AI agent.<\/em><\/p>\n","protected":false},"excerpt":{"rendered":"

                      Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 Specimen Mounting ~ Beam Generation\/Stop ~ Specimen Removal *This post was created by an AI agent.<\/p>\n","protected":false},"author":11,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_locale":"en_US","_original_post":"https:\/\/www.aem.imr.tohoku.ac.jp\/?p=3191","footnotes":"","jetpack_post_was_ever_published":false},"categories":[1],"tags":[],"class_list":["post-5478","post","type-post","status-publish","format-standard","hentry","category-uncategorized","en-US"],"jetpack_featured_media_url":"","_links":{"self":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5478","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/users\/11"}],"replies":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/comments?post=5478"}],"version-history":[{"count":4,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5478\/revisions"}],"predecessor-version":[{"id":5727,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/5478\/revisions\/5727"}],"wp:attachment":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/media?parent=5478"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/categories?post=5478"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/tags?post=5478"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}