*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.*<\/p>\n
The Division of Analytical Electron Microscopy, IMR conducted periodic maintenance and power facility improvements on its transmission electron microscopes from October 19 to 23, 2026.<\/p>\n
As part of this work, Constant Voltage Constant Frequency (CVCF) power supply systems were newly installed and expanded for two JEM-ARM200F atomic resolution scanning transmission electron microscopes, enhancing the stability of the power supply infrastructure.<\/p>\n
A CVCF system regulates commercial power to suppress voltage fluctuations, momentary drops, and frequency variations, delivering clean and stable electricity to precision instruments. In this maintenance, the power distribution configurations for both instruments were upgraded as follows:<\/p>\n
Previously, a single CVCF unit was installed to power the electron microscope main unit, while the Cs correctors received power directly from the industrial power line. This configuration posed potential concerns regarding the stability of instrument operation under power fluctuations.<\/p>\n
In this maintenance, an additional CVCF unit was installed. As a result, both the electron microscope main unit and the Cs correctors are now powered via dedicated CVCF units independently (operating with two CVCF units in total).<\/p>\n
Previously, this instrument was powered from the general lighting\/commercial power line.<\/p>\n
In this maintenance, a new CVCF unit was installed, reconfiguring the system so that both the microscope main unit and the Cs corrector are supplied through the CVCF. Because the new unit has sufficient power capacity, a single CVCF covers both the main unit and the corrector.<\/p>\n
This power supply upgrade is not intended to directly enhance instrument resolution. Its primary objective is to reduce the impact of voltage and frequency fluctuations, thereby improving the operational stability of the electron microscopes and corrector control systems.<\/p>\n
In particular, we expect this improvement to reduce unexpected malfunctions and unstable operations caused by external power disturbances.<\/p>\n
*Note: The actual stabilization effects will be continuously verified and evaluated through ongoing routine operations. This notice does not assert that all operational irregularities have been resolved or that instrument baseline performance has increased.<\/em><\/p>\n Note: Part of the expenses for this CVCF installation was supported by the Director’s Discretionary Expenses.<\/p>\n The maintenance work and startup verification have been completed, and both instruments are currently available for normal use.<\/p>\n We will continue our maintenance efforts to maintain a stable, high-quality observation environment for all users.<\/p>\n","protected":false},"excerpt":{"rendered":" *Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* The Division of Analytical Electron Microscopy, IMR conducted periodic maintenance and power facility improvements on its transmission electron microscopes from October 19 to 23, 2026. As part of this work, Constant Voltage Constant Frequency … Improvements to Power Supply Equipment for ARM200F Instruments<\/span><\/a><\/p>\n","protected":false},"author":11,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_locale":"en_US","_original_post":"6189","footnotes":"","jetpack_post_was_ever_published":false},"categories":[3,4],"tags":[],"class_list":["post-6191","post","type-post","status-publish","format-standard","hentry","category-notice","category-maintenance","en-US"],"jetpack_featured_media_url":"","_links":{"self":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/6191","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/users\/11"}],"replies":[{"embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/comments?post=6191"}],"version-history":[{"count":1,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/6191\/revisions"}],"predecessor-version":[{"id":6192,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/posts\/6191\/revisions\/6192"}],"wp:attachment":[{"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/media?parent=6191"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/categories?post=6191"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.aem.imr.tohoku.ac.jp\/wp-json\/wp\/v2\/tags?post=6191"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}4. Funding Acknowledgement<\/h3>\n
5. Routine Operations<\/h3>\n