*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* Overview The TESCAN AMBER X is a focused ion beam (FIB) system combining an SEM equipped with a high-brightness Schottky electron gun and a dual-beam Xe plasma FIB. Its Ga-free plasma ion source enables … Continue reading Plasma Focused Ion Beam System TESCAN AMBER X