Thank you for your interest in utilizing the Division of Analytical Electron Microscopy (AEM), Institute for Materials Research (IMR), Tohoku University.

At present, we are receiving a large concentration of requests for technical support, including TEM sample preparation, observation, and microanalysis, resulting in extended waiting periods before work can begin.

The objective of this announcement is not to discourage or suppress service requests, but to provide prospective users with essential information regarding current congestion factors, key considerations across the workflow, and realistic alternatives (including self-service and external facilities) to help you plan your research schedule and thesis preparations smoothly.

1. Anticipated Congestion Toward Year-End and Fiscal Year-End

Demand for sample preparation, observation, and analysis is currently concentrated, requiring substantial time for technical staff to accommodate each case.

Looking ahead from autumn into winter and toward the end of the fiscal year (November to March), experiment requests are anticipated to surge for the following milestones:

• Data collection for graduation, master’s, and doctoral dissertations
• New academic journal submissions and additional experiments for peer-review revisions
• Data acquisition for upcoming academic conference presentations and project reports

If inquiries or requests are submitted immediately before deadlines, there is a very high probability that we will be unable to complete the required work in time. For research projects with fixed deadlines, we kindly ask that you formulate your experimental plans with ample margin and consult with us as early as possible.

2. TEM Sample Preparation and FIB Bottleneck

For request-based sample preparation associated with our facility, Focused Ion Beam (FIB) processing serves as the standard methodology, with the exception of dispersion samples such as powders and nanoparticles.

Please note that sample preparation via Ar ion milling or ion slicer techniques has been suspended as a routine request-based service due to the absence of dedicated technical staff since FY2024 (these instruments are currently operated primarily by technical support staff for maintenance and operation verification).

At present, our FIB instruments (Versa 3D, Quanta 3D, and AMBER X) are heavily booked for both self-service and request-based processing. As announced on October 27, 2026, work on new requests is expected to commence no earlier than December 2026.

Consequently, when requesting a full workflow encompassing FIB preparation from bulk specimens followed by TEM observation, the specimen preparation stage represents the primary bottleneck for the overall schedule.

For details on FIB instrument operating status and reservation calendar policies, please refer to the following announcement:
FIB Instrument Congestion and Planned Utilization Request (Published October 27, 2026)

3. Requesting TEM Observation and Analysis (Staff Capacity vs. Instrument Availability)

Regarding Transmission Electron Microscopes (TEM/STEM) themselves, machine time is relatively accessible for self-service users who hold valid operational licenses.

However, technical staff performing observation proxies and analytical support are currently juggling numerous concurrent commitments, making immediate accommodation of requested experiments extremely difficult.

A crucial point to note is that open slots on the reservation calendar do not equate to technical staff availability for service requests.

Even when days appear vacant on the instrument calendar, staff are engaged in other ongoing processing jobs, user support, or facility maintenance tasks, meaning that requested experiments cannot simply be scheduled into those slots immediately.

Furthermore, even for specimens that do not require FIB preparation (such as pre-thinned specimens or dispersion samples), experiments may require extended durations depending on analytical difficulty, such as:

• Beam-sensitive specimens (organic materials, polymers, certain halides/oxides, etc.)
• High-resolution observation requiring precise crystallographic zone-axis alignment
• Specimens requiring extensive time to search for regions of interest or optimize conditions

For challenging observations, it is common that only one specimen can be adequately addressed within a full day’s machine time. If data collection across multiple specimens is required, multiple days of staff commitment must be scheduled, further extending the turnaround time. Please develop realistic plans aligned with the quantity and characteristics of your specimens.

4. Recommended Self-Service and Preliminary Screening

To enhance experimental efficiency and reduce waiting times, we strongly encourage users to utilize self-service operation for any steps that can be performed within your own research group.

In particular, for dispersed specimens such as powders and nanoparticles, researchers can often prepare (drop-cast and dry) samples onto TEM support grids in their own laboratories.

Furthermore, when inserting dispersion specimens into a TEM, it is not uncommon to find severe particle agglomeration or inadequate distribution density. Even when planning to request advanced high-resolution observation or elemental mapping from staff, we recommend conducting prior self-service screening on a general-purpose TEM whenever possible to verify specimen quality.

• User preparation of specimens on TEM grids
• Self-service preliminary inspection of dispersion state and foil thickness
• Pre-selection of optimal grids and specimens prior to formal analysis

Selecting suitable specimens in advance drastically cuts down on trial-and-error and unproductive machine time during formal staff sessions, accelerating final data delivery.

*We recognize that not all researchers possess operational licenses for self-service; this recommendation is offered wherever feasible within your laboratory setup.

5. Other Electron Microscopy Facilities on Campus (Options for Consideration)

If our projected waiting times do not align with your research schedule, or if you require immediate data, exploring other electron microscopy facilities across Tohoku University is a viable alternative.

Several shared or departmental facilities exist within Tohoku University:

• Tohoku Center for Electron Microscopy (TCEM)
• School of Engineering Electron Microscopy Facilities (Aobayama Campus)
• Department of Materials Science Facilities, School of Engineering

For an overview and comparative summary of on-campus TEM equipment, please consult our reference guide:
TEMs Available on Campus (for Materials)

Please note that the above facilities primarily cater to metals, inorganic materials, and device specimens. For biological specimens, organic compounds, and soft materials that require cryogenic preservation or are susceptible to severe electron beam damage, consulting specialized facilities such as the Cryo-Electron Microscopes at the Institute of Multidisciplinary Research for Advanced Materials (IMRAM) is also recommended.

6. Utilizing Nationwide Facilities via the ARIM Network

Beyond on-campus resources, researchers may consider utilizing shared equipment across universities and institutes nationwide through the Ministry of Education, Culture, Sports, Science and Technology (MEXT) Advanced Research Infrastructure for Materials (ARIM) network.

If your research project permits external facility utilization, state-of-the-art electron microscopes and nanofabrication systems across 26 participating institutions throughout Japan are accessible.

You can search registered facilities and technical support menus via the official search portal:
ARIM Japan Shared Facility Search System

*Terms of use, user eligibility, and support categories (instrument use, technical service, collaborative research, etc.) vary by institution; please verify details directly with the respective facility.

7. Advance Consultation and Information to Prepare

Technical staff resources available for analytical requests are limited, with a physical ceiling on the number of projects that can be accommodated simultaneously.

Consequently, even with early consultation, we cannot guarantee that experiments can be scheduled on your exact preferred dates due to congestion or instrument status. Furthermore, as emphasized above, the waiting time until work commences differs from the total duration required to complete data collection.

For critical research milestones with immovable deadlines — especially degree theses and paper submissions — early consultation during the planning stages is essential.

Information to Organize Prior to Consultation

To facilitate smooth evaluation and scheduling, we kindly ask that you prepare the following information when making an inquiry:

1. Research Objective and Background: What specific scientific question needs to be addressed?
2. Specimen Details: Material composition, shape, dimensions, quantity, conductivity/magnetism, and handling cautions (air exposure, beam sensitivity, etc.).
3. Requested Observation and Analysis: TEM morphology, high-resolution STEM, EDS elemental analysis, electron diffraction, etc.
4. Required Deadline: Thesis submission date, conference date, submission deadline, etc.
5. Scope Feasible on User Side: Feasibility of specimen preparation, grid mounting, or preliminary self-screening.

8. Contact and Consultation Channels

Inquiries and consultation requests for analytical services (technical services, observation support, etc.) utilizing our facilities are received by the ARIM Project Unit, Analytical Research Core for Advanced Materials (ARCAM).

Technical Support and Request Consultation Window:
ARIM Project Unit, Analytical Research Core for Advanced Materials (ARCAM), Institute for Materials Research, Tohoku University
ARIM Project Unit: Inquiries and Access
Consultation Request Form (Google Forms)

General Guide to Shared Facility Utilization:
CINTS (Center for Integrated Network of Technical Support, Tohoku University)

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The Division of Analytical Electron Microscopy, IMR conducted periodic maintenance and reconfigured the instrument setup for the JEM-002B analytical transmission electron microscope (Topcon EM-002B, Room 1-105) between October 19 and 23, 2026.

Along with replacing consumable parts, auxiliary equipment was streamlined during this maintenance. Please be advised that Energy Dispersive X-ray Spectroscopy (EDS) analysis and Scanning Transmission Electron Microscopy (STEM) observation are no longer available on the JEM-002B. We appreciate your understanding and cooperation.

1. Sputter Ion Pump (SIP) Replacement

To sustain ultra-high vacuum in the microscope column, the sputter ion pump (SIP) was replaced with a new unit as the previous pump reached the end of its operational lifespan. This replacement ensures the long-term integrity and reliability of the ultra-high vacuum pumping system.

2. Decommissioning of EDS Detector and STEM Units

To ensure long-term sustainability and operational efficiency, the following auxiliary units were decommissioned and removed:

• Removal of the EDS Detector:
  The installed EDS detector was a liquid-nitrogen-cooled system requiring continuous liquid nitrogen replenishment and rigorous routine management. Considering detection sensitivity constraints and a decline in usage frequency in recent years, the detector was decommissioned. Consequently, EDS point analysis and elemental mapping on the JEM-002B have been discontinued.
• Removal of STEM-Related Equipment:
  In conjunction with the EDS removal, the STEM control and detection hardware was also removed. Previously, slight electrical noise originating from the STEM circuitry induced minute electron beam vibrations. Decommissioning this hardware eliminated the beam vibration, resulting in improved beam stability during TEM imaging. Please note that STEM imaging is also no longer available.

3. Post-Maintenance Performance Verification

In post-maintenance performance testing, high-quality TEM images were verified. Lattice fringe imaging demonstrated a resolution of approximately 1 Å (0.1 nm).

*Note: The resolution mentioned above represents an empirical result observed during post-maintenance verification and does not revise or constitute a manufacturer-guaranteed baseline resolution specification.

4. Summary of Currently Available Capabilities

Following this reconfiguration, the functional capabilities of the JEM-002B are summarized below:

5. Alternative Instruments for EDS Elemental Analysis

Users requiring microarea EDS analysis or elemental mapping in conjunction with TEM observation are encouraged to consider the following EDS-equipped instruments available at our facility:

• JEM-2100Plus: General-purpose 200 kV TEM equipped with an EDS detector (available for self-operation upon obtaining a basic operator license).
• JEM-ARM200F (Double Corrector / STEM Corrector): High-performance analytical instruments supporting high-sensitivity EDS analysis and atomic-resolution STEM imaging.

For detailed specifications, licensing requirements, and application procedures for each instrument, please consult the Equipment List page or individual instrument pages. If you have questions regarding analytical feasibility or specimen suitability, please contact our technical staff.

The Division of Analytical Electron Microscopy, IMR conducted periodic maintenance and power facility improvements on its transmission electron microscopes from October 19 to 23, 2026.

As part of this work, Constant Voltage Constant Frequency (CVCF) power supply systems were newly installed and expanded for two JEM-ARM200F atomic resolution scanning transmission electron microscopes, enhancing the stability of the power supply infrastructure.

1. Target Instruments

• JEM-ARM200F (Double Corrector) (Room 1-103)
• JEM-ARM200F (STEM Corrector) (Room 1-104)

2. Overview of CVCF Installation and Expansion

A CVCF system regulates commercial power to suppress voltage fluctuations, momentary drops, and frequency variations, delivering clean and stable electricity to precision instruments. In this maintenance, the power distribution configurations for both instruments were upgraded as follows:

JEM-ARM200F (Double Corrector)

Previously, a single CVCF unit was installed to power the electron microscope main unit, while the Cs correctors received power directly from the industrial power line. This configuration posed potential concerns regarding the stability of instrument operation under power fluctuations.

In this maintenance, an additional CVCF unit was installed. As a result, both the electron microscope main unit and the Cs correctors are now powered via dedicated CVCF units independently (operating with two CVCF units in total).

JEM-ARM200F (STEM Corrector)

Previously, this instrument was powered from the general lighting/commercial power line.

In this maintenance, a new CVCF unit was installed, reconfiguring the system so that both the microscope main unit and the Cs corrector are supplied through the CVCF. Because the new unit has sufficient power capacity, a single CVCF covers both the main unit and the corrector.

3. Objectives of Power Equipment Improvements

This power supply upgrade is not intended to directly enhance instrument resolution. Its primary objective is to reduce the impact of voltage and frequency fluctuations, thereby improving the operational stability of the electron microscopes and corrector control systems.

In particular, we expect this improvement to reduce unexpected malfunctions and unstable operations caused by external power disturbances.

*Note: The actual stabilization effects will be continuously verified and evaluated through ongoing routine operations. This notice does not assert that all operational irregularities have been resolved or that instrument baseline performance has increased.

4. Funding Acknowledgement

Note: Part of the expenses for this CVCF installation was supported by the Director’s Discretionary Expenses.

5. Routine Operations

The maintenance work and startup verification have been completed, and both instruments are currently available for normal use.

We will continue our maintenance efforts to maintain a stable, high-quality observation environment for all users.

Thank you for using the shared equipment and technical support services of the Analytical Research Core for Advanced Materials (ARCAM), IMR.

This notice outlines our policy and basic conditions regarding technical support (commissioned processing, assisted observation, etc.) on holidays and weekends handled by the ARIM Project Unit.

Basic Policy

As a general rule, technical support services are provided during standard working hours on regular weekdays.

However, for technical support handled by the ARIM Project Unit, exceptional support on holidays and weekends may be arranged only when there are compelling research needs and when the technical staff’s availability and instrument schedules can be accommodated.

Conditions and Important Notes

If you are requesting technical support on holidays or weekends, please note the following conditions:

• Exceptional Basis: Holiday/weekend support is not a standard standing service, but an exceptional arrangement made only when specific conditions are met.
• Feasibility Determination: Availability depends on staff scheduling and instrument maintenance. Requests cannot always be accommodated.
• Surcharge Rates Apply: In addition to standard instrument usage and technical support fees, prescribed holiday surcharges will apply.
• Advance Consultation Required: Requests must be consulted and coordinated well in advance.
• Scope of Application: This notice applies specifically to technical support handled by the ARIM Project Unit and is not a general policy for all instruments or self-use operations within the Division of Analytical Electron Microscopy.

Inquiries and Consultations

For details regarding eligibility, specific conditions, and surcharge rates for holiday technical support, please inquire during your initial consultation.

Contact:
ARIM Project Unit, Analytical Research Core for Advanced Materials (ARCAM), IMR
Inquiries and Access (ARIM Project Unit)

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We are currently experiencing severe congestion and high demand for our Focused Ion Beam (FIB) instruments.

To help users plan their experiments with sufficient lead time, we would like to provide an update on the current operational status and important notices regarding reservations and commissioned processing.

Target Instruments

• Versa 3D (Ga Focused Ion Beam System)
• Quanta 3D (Ga Focused Ion Beam System)
• AMBER X (Xe Plasma Focused Ion Beam System)

Current Congestion Status (As of October 27, 2026)

As of October 27, 2026, the FIB instruments are heavily booked with ongoing tasks. Securing machine time on short notice is currently extremely difficult.

Under present projections, new self-use and commissioned processing requests are likely to be scheduled from December 2026 onwards at the earliest.

*Please note that this timeline is an estimate based on current progress and instrument availability. It does not guarantee a fixed commencement date.

Processing Schedule and Workflow for Commissioned Work

For commissioned FIB processing (e.g., TEM specimen preparation, cross-sectional milling), our technical staff coordinate multiple requests to optimize workflow efficiency and safety based on specimen properties, processing techniques, and machine status.

Consequently, individual processing tasks are not necessarily assigned fixed slots on the public reservation calendar in advance. Operational schedules and processing order may be flexibly adjusted depending on ongoing progress.

Therefore, even if the calendar appears to have open slots, numerous requests may already be queued and waiting for processing. We appreciate your understanding.

Checking the Reservation Calendar

The reservation system has recently been updated to display operational statuses (operation sections) alongside standard reservations, helping you gauge machine utilization.

For details on the updated calendar display, please refer to our related announcement:
Improvements to the Equipment Reservation Calendar Display

Equipment Reservation System

Requests for Planned Use

When planning experiments or sample preparation involving FIB, please take note of the following points:

• Early Planning: Please consult with us and establish your schedule well in advance of your required deadlines.
• Checking Availability Ahead of Time: Check the reservation calendar and current machine load before fixing experiment schedules.
• Clarify Request Details: Prepare details including sample types, required milling geometries, quantity, and target completion dates beforehand.
• Processing Time vs. Queue Waiting Time: Please distinguish between the time required for actual processing and the queue waiting period before work can commence.
• Understanding Schedule Constraints: Due to severe congestion, we may not always be able to accommodate urgent requests.

Inquiries and Applications

Applications and inquiries regarding the use and technical support for these FIB instruments (Versa 3D, Quanta 3D, and AMBER X) are handled by the ARIM Project Unit.

Contact:
ARIM Project Unit, Analytical Research Core for Advanced Materials (ARCAM), IMR
Inquiries and Access (ARIM Project Unit)

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Thank you for using the equipment reservation system of the Division of Analytical Electron Microscopy, IMR.

We are pleased to announce an improvement to the reservation calendar display to make the operational schedule and status of each instrument clearer and easier to check.

Background: Reservation Information and Operation Status

Previously, the public reservation calendar mainly displayed confirmed reservations registered by users.

However, even when no user reservations are registered on a specific day, instruments may not be available for general use due to regular maintenance, inspection, outsourced services, or administrative adjustments. This occasionally made it difficult for users to assess instrument availability in advance.

To address this, we have enhanced the calendar display so that the operation section (operational status) assigned to each instrument and date—which was previously managed internally—can now be viewed directly on the schedule.

*Please note that this is not the introduction of new reservation rules or restrictions, but a visual improvement designed to make existing operational information more accessible to users.

Information Displayed on the Calendar

In addition to reservation counts, you can now see operational status indicators for each date, such as:

• Booked: Reservations are scheduled (may include operational notes, such as evening use).
• Maintenance / Adjustment: Days scheduled for maintenance, inspection, or operational adjustments.
• Suspended / Closed: Days when general use is suspended or closed.
• Other Adjustments: Days allocated for outsourced work or specific operational requirements.

By hovering over (or tapping) the status icons, you can view operational notes provided by instrument managers regarding scheduled tasks and time slots.

Notes for Users

This improvement allows users to better anticipate instrument availability and scheduling constraints when planning experiments. We encourage you to check the calendar before scheduling your work.

Please note that the calendar display does not guarantee immediate availability. For confirmation of specific dates or special arrangements, please contact the respective instrument manager as usual.

The equipment reservation system can be accessed below:
Equipment Reservation System

Related Announcement

For information regarding the current congestion status and planning for FIB instruments, please refer to the following announcement:
Congestion Status of FIB Instruments and Request for Planned Use

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Thank you for using the website of the Division of Analytical Electron Microscopy (AEM), Institute for Materials Research (IMR), Tohoku University.

From October 21 to 22, 2026, we implemented emergency security measures in response to a security issue concerning our web system (PHP). As this was an urgent response prioritizing safety, we were unable to provide prior notice. We sincerely apologize for any inconvenience caused to our users.

Following the application of necessary security patches and operational verification, the AEM website has been fully restored and is available for normal use.

The timeline of actions taken and the current operational status are reported below.

Timeline of Emergency Measures

• Wednesday, October 21, approx. 18:00 JST
  Implemented off-campus (external) access restrictions to ensure system security.
• Wednesday, October 21, approx. 21:00 JST
  Temporarily suspended the relevant web server.
• Thursday, October 22, Morning (from approx. 06:30 JST)
  Applied security patches, restarted servers, verified system operations, and sequentially resumed services.
• Thursday, October 22, around Midday JST
  Emergency upstream network isolation was implemented at the university network level to isolate unpatched servers across the university.
• Thursday, October 22, approx. 14:00 JST
  As all required countermeasures and operational checks were already completed on the AEM side, normal public access was fully restored following the lift of the university-wide restriction.

Current Operational Status

• AEM Website (https://www.aem.imr.tohoku.ac.jp/):
  Restored and operating normally.
• AEM-FS (File Sharing and Data Retrieval Service):
  [Access Restrictions Ongoing]
  Regarding AEM-FS, access restrictions (including off-campus access) remain in place for security reasons, as vendor-provided firmware updates are still pending. Normal operation will resume as soon as the updates and verifications are completed. A further notice will be posted when the service is fully restored.

We appreciate your understanding and cooperation as we continue to maintain the security and stability of our systems.

Contact

Division of Analytical Electron Microscopy, Institute for Materials Research, Tohoku University
(ARIM Project Unit Office)

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Dear users,

[October 7, 2026] Registration of the equipment managed by the Division in CFC SHARE has been completed. This page follows up on our July 1, 2026 announcement, “Revision to the Guidelines for the Shared Equipment Use Support Program for Early-Career Researchers,” and explains how we operate now that registration is complete and what we ask users to do.

Key Points

• [Self-use users of the Analysis Slot (分析枠) from within the university] Everyone who makes equipment reservations in the Division’s reservation system under their own name, including students, needs their own CFC SHARE user account and must submit an equipment use application in CFC SHARE for equipment managed by the Division. It is not enough for only the head of the laboratory to register.
• In CFC SHARE, it is sufficient to apply for one piece of equipment that you plan to use. You do not need to apply for every piece of equipment one by one.
• CFC SHARE is not used for reserving equipment managed by the Division. Please continue to make and check reservations, and change them, through the Division’s reservation site.
• The conventional application for use of the Division is still required. For the time being (roughly within this fiscal year), please continue to state your payment funding source in that application.

1. Registration of Our Equipment in CFC SHARE Is Complete

As announced on July 1, 2026, the Shared Equipment Use Support Program for Early-Career Researchers changed on October 1, 2026, and eligible equipment is now limited to equipment registered in CFC (CFC SHARE-registered equipment). For details of the program, and to check whether you are eligible, please see the following page (Tohoku University access only).
Shared Equipment Use Support Program for Early-Career Researchers

We have been working to register the equipment managed by the Division in CFC SHARE, and the registration is now complete. Accordingly, users who plan to continue using equipment managed by the Division are asked to register as a CFC SHARE user and submit an equipment use application in CFC SHARE. Whether or not you are eligible for the Shared Equipment Use Support Program for Early-Career Researchers, if you fall under Section 2, you need your own CFC SHARE user registration.

2. Who This Mainly Applies To

The Division has two application routes: the Analysis Slot (分析枠) and the ARIM (CINTS) Slot (ARIM（CINTS）枠). The CFC SHARE registration and application guidance on this page is aimed mainly at users of the Analysis Slot.

Currently, the Analysis Slot accepts only users who meet all of the following conditions:

• The user is a member of the university (on-campus user).
• The user has already obtained the Division’s license.
• The user is a self-use user.

Every self-use user who actually reserves equipment under their own name in the Division’s reservation system, including students, also needs their own user account in CFC SHARE. Please note that it is not the case that only the laboratory head (the person responsible for payment) needs to register in CFC SHARE.

The ARIM (CINTS) Slot follows a different application route from the Analysis Slot. This page does not cover the detailed procedures for the ARIM (CINTS) Slot.

3. Why CFC SHARE Registration Is Needed

From now on, CFC SHARE is required for the following two purposes:

• Transfer of usage fees
• Use of the Shared Equipment Use Support Program for Early-Career Researchers (for those eligible for the program)

At present, CFC SHARE alone cannot handle everything that the Division’s operation requires, such as accepting projects, managing machine time, reserving equipment and checking reservation status. The Division therefore uses its own system together with CFC SHARE (see Sections 8 and 9 below).

4. Those Who Are Asked to Register Early

If any of the following applies to you, please complete the procedures as soon as possible.

• Those who have already submitted an application for use of the Division this fiscal year and are registered as the person responsible for payment
• Those who wish to use the Shared Equipment Use Support Program for Early-Career Researchers (for those eligible for the program)
• Those who will serve as the “responsible person for usage” in CFC SHARE for a laboratory whose users include students (the responsible person must be registered in CFC SHARE before a student can apply; see Section 6)

5. Registering as a CFC SHARE User (Logging In)

Open CFC SHARE and log in with “学内利用者　東北大IDでログイン” (On-campus user: Log in with Tohoku University ID; labeled “Tohoku Univ. Log-in” on the screen). If you have not yet registered as a CFC SHARE user, follow the on-screen instructions to register.

• CFC SHARE: https://share.cfc.tohoku.ac.jp/share/

*The CFC SHARE screens shown on this page are in Japanese; English labels appear alongside them on the actual screens.

6. How to Apply for Use of Our Equipment in CFC SHARE

After logging in, apply for use of the equipment managed by the Division as follows. This is a separate procedure from the conventional application for use of the Division (see Section 9).

Step 1: Open “Equipment” (設備一覧)

From the menu at the top of the screen, open “設備一覧 (Equipment)”.

Step 2: Select the Management Group “20_金研_分析コア_電顕”

In the search conditions, select 20_金研_分析コア_電顕 from “Management Group (管理グループ)”. (Typing “20” narrows down the candidates.)

Step 3: Click “Search”

After selecting the management group, click “Search (検索)”.

Step 4: Choose the Equipment You Plan to Use

The equipment managed by the Division is listed in the search results. Click at least one piece of equipment that you plan to use.

Step 5: Click “Equipment Use Application” on the Detail Screen

On the equipment detail screen, click “利用申請 (Equipment Use Application)”.

Step 6: Specify the Responsible Person for Usage

On the application screen, specify the responsible person for usage and payment.

• If you are the responsible person yourself: click “Set yourself as the responsible (自分を責任者にする)”.
• If someone else (for example, the laboratory head) is the responsible person: click “Search the responsible (責任者検索)”, then search for and select that person.

Please also read “About the Responsible Person for Usage” below.

Step 7: Enter the Research Project and Payment Budget, Then Click “Apply”

Select or enter the required items on the screen, such as the research project and the budget for payment, and click “Apply (申請)” at the bottom of the screen.

Step 8: Confirm Your Application

A confirmation dialog is displayed. Check the content and click “OK” to submit the application.

After the application is completed, CFC SHARE displays a message stating that you will be notified after approval by the responsible person (if one was specified) and the equipment manager. Please wait until the approval is complete.

About the Responsible Person for Usage

Users who do not manage a budget themselves, such as students, must specify a person who holds a budget as the “responsible person for usage” in CFC SHARE.

• As explained on the CFC SHARE screen, only users who hold a budget in the financial accounting system and are registered in CFC SHARE can be specified as the responsible person.
• If the person you want to specify is not yet registered in CFC SHARE, that person must first log in to CFC SHARE with their Tohoku University ID and complete their own user registration.
• In particular, those who have already submitted an application for use of the Division this fiscal year and are registered as the person responsible for payment, heads of laboratories whose users include students, and those who plan to use the Shared Equipment Use Support Program for Early-Career Researchers are asked to register in CFC SHARE as soon as possible.

7. Applying for One Piece of Equipment You Plan to Use Is Enough

For linked management between the Division’s reservation system and CFC SHARE, all equipment managed by the Division must eventually be set as available for use. However, as long as at least one equipment use application has been submitted in CFC SHARE for equipment managed by the Division, the Division’s administrators can set up the remaining equipment.

Therefore, you do not need to apply for every piece of equipment managed by the Division one by one. Please apply in CFC SHARE for one piece of equipment that you plan to use.

8. CFC SHARE Is Not Used for Reservations

CFC SHARE is not used as a reservation system for equipment managed by the Division.

At present, CFC SHARE alone cannot handle everything that the Division’s operation requires, such as accepting projects and managing machine time. For this reason, the Division’s own system continues to be used for reserving equipment managed by the Division and checking reservation status.

• Even if a “Reservation” label or button is displayed in CFC SHARE, please do not use it to reserve equipment managed by the Division.
• To make a reservation, check reservation status, or change or adjust a reservation, please continue to use the Division’s reservation site as before.
• Usage records in CFC SHARE are registered by the Division’s administrators based on actual use. Users do not need to enter usage records in CFC SHARE.

An “equipment use application in CFC SHARE” and an “equipment reservation” are different things. Submitting an application in CFC SHARE does not reserve the equipment.

9. The Conventional Application for Use of the Division Is Still Required

Separately from registration and application in CFC SHARE, the conventional application for use of the Division of Analytical Electron Microscopy, IMR is still required. The move to CFC SHARE does not make the conventional application unnecessary.

• Equipment use application in CFC SHARE: an application made in CFC SHARE to use equipment managed by the Division (Section 6 of this page)
• Conventional application for use of the Division: the application you have always submitted to the Division

Both procedures are required, so please take care not to confuse them.

10. For Now, Please Also State the Payment Funding Source in the Division’s Application

In the conventional application for use of the Division, you are asked to specify the funding source for the usage fees. Until the Division’s own system has been updated for CFC SHARE, roughly within this fiscal year, please continue to state the funding source in the application for use of the Division as before. (Please do this in addition to selecting the payment budget in your CFC SHARE application.)

Related post: Revision to the Guidelines for the Shared Equipment Use Support Program for Early-Career Researchers (July 1, 2026)

Please contact the Division

Thank you for your cooperation.

Division of Analytical Electron Microscopy, IMR

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■ Overview
The Division of Analytical Electron Microscopy, IMR (Room 1-105) will be closed during the period shown below.

■ Details
– Closure period: September 19 (Sat) – September 24 (Thu), 2026
– This includes September 21 (Mon, Respect for the Aged Day), September 22 (Tue, Citizens’ Holiday), and September 23 (Wed, Autumnal Equinox Day).
– September 24 (Thu) is a regular weekday, but the Division will remain closed as staff will be unavailable.
– Operations resume: September 25 (Fri), 2026

■ Notes
– We will be unable to respond to inquiries or provide access during this period.
– Depending on the instrument, some downtime before/after the closure may be needed for adjustment, so availability may differ by instrument. Please contact us for details on individual instruments.
– If you need to reach us during the closure, please contact the ARIM Project Unit Office (Room 2-606).
– For urgent matters, please contact us again after operations resume.

■ Contact
Division of Analytical Electron Microscopy, IMR (During the closure, please contact the ARIM Project Unit Office, Room 2-606)

In TEM observation, mounting thin-foil specimens prepared by FIB (Focused Ion Beam) onto a TEM holder is one of the most nerve-wracking tasks.

If a specimen is accidentally damaged or lost during mounting on the holder, the loss goes far beyond the specimen itself:

• Remaking Cost and Time
  Even if fabricated in-house, it incurs tens of thousands of yen and more than a month of waiting for machine time reservations. For samples outsourced to external vendors, fabrication costs of several hundred thousand yen and long delivery times will be wasted.
• Cancelled Observation and Incurred Instrument Fees
  If the specimen is damaged, observation for that day must be cancelled, yet fees for the reserved TEM instrument time will still be charged.
• No Warranty for Damage or Loss
  Even for expensive externally fabricated samples, our Division cannot provide any compensation or warranty for damage during sample mounting. This places immense pressure on our staff, and for highly critical specimens, we may ask users to mount them themselves.

Manual Handling Involves Risks Regardless of Eyesight or Experience

Even young researchers and students who feel confident in their eyesight or manual dexterity should never let their guard down:

• Difficulty seeing tweezer tips due to presbyopia or myopia
• Sudden hand slips or sneezes while holding a specimen
• Trembling fingers caused by the immense pressure of “I must not fail”

As long as we rely solely on human manual dexterity, it is extremely difficult to completely eliminate accidental human error.

Zero Failures After Introduction: The Manual Manipulator in Our Division

To prevent these risks and ensure that anyone can mount samples safely and reliably, our Division is equipped with a dedicated manual manipulator (Rabbitol-XYZ Fine).

• Precise Control in Microns with Fine Adjustment Knobs
  XYZ dial controls allow users to approach the target position slowly and steadily without being affected by intuition or hand tremor.
• Outstanding Stability Through Fixture Clamping
  The specimen is firmly held even if unexpected vibrations occur during the operation, drastically reducing the risk of dropping or accidental contact.
• Staff Experience
  From the direct experience of our staff who previously struggled with fine handling due to presbyopia, this is a highly reliable tool: “Since introducing this manipulator, sample mounting failures have been reduced to zero.”

[Important] Pay Close Attention to Operating Procedures

While the manipulator is a very powerful tool, “incorrect operating sequences (order of moving axes, approach direction, etc.) can crush or catch and damage the specimen.”

Please keep the following points in mind:

1. Do Not Practice on Actual Critical Samples First
   Before handling expensive or critical samples, always practice with dummy specimens or practice grids to get a feel for the movement of each axis.
2. Verify Procedures Step-by-Step
   Never rush. Check the direction of knob rotation against the microscope field of view and operate carefully.
3. Ask Staff on Your First Use
   For first-time users, our staff will guide you through the correct operation procedures and key precautions to prevent damage.

Demonstration of Operation (Reference Video)

Please watch the product video below to see fine positioning in action:

Summary: Learn How to Use It Before Important Observations!

The manipulator is available for all users of our Division.

To avoid wasting precious machine time and to safely bring valuable samples into TEM observation, we strongly recommend practicing and mastering this tool beforehand. If you are interested, please feel free to contact the staff of the Division of Analytical Electron Microscopy, IMR.

* Product reference: Micro Support Co., Ltd. Rabbitol-XYZ Fine (Product specification reference link; not directly affiliated with our Division)