Technical information (in preparation)

Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version.

This page is a summary of useful information when using our office (currently under preparation)

How to use TEM

  1. JEM-2100plus
  2. JEM-ARM200F
  3. JEM-2000EXII
  4. EM-002B

Training

  1. Sample attachment/detachment
  2. Boosting, beam output, irradiation system axis adjustment, pause, termination
  3. Camera operation (display/recording)
  4. TEM: Medium and low magnification observation
  5. TEM: DIFF1 (if orientation is not required)
  6. TEM: DIFF2 (for orientation fine adjustment/coarse grains)
  7. TEM: DIFF3 (for important orientation/coarse grains)
  8. TEM: DIFF4 (NBD/CBED)
  9. STEM: Medium and low magnification observation
  10. STEM：EDS
  11. STEM：EELS
  12. STEM: High-resolution observation 1 (fine particles, single atoms, no orientation required)
  13. STEM: High-resolution observation 2 (bulk crystal sample/required orientation)

Specimen preparation related

  1. Ion milling (plane)
  2. Ion milling (cross section)
  3. Ion slicer
  4. Electrolytic polishing
  5. FIB
  6. Suspension method

Useful software (free/paid)

  1. ReciPro
  2. CrysTBox
  3. ImageJ
  4. Vesta
  5. GMS/DigitalMicrograph Software (GATAN)
  6. Analysis Station(Offline version) (JEOL)

Other technical information

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