This page has been translated by AI and may contain errors. The Japanese version is the official document.
This page is an independent survey of TEM facilities available for materials science within Tohoku University. If you wish to use them, please contact the person in charge at each department.
Information on this page may be outdated. Please inquire with the contact person of each division regarding user fees and availability details.
Division of Analytical Electron Microscopy User Fees
| 装置 | 型番/形式 | FE *1 | 収差補正 *2 | 高分解能 *3 | 高傾斜 *4 | EDS *5 | マップ *6 | EELS *7 | 備考 |
|---|---|---|---|---|---|---|---|---|---|
| 分析TEM | TOPCON 002B (分析) | ○ | ○ | ||||||
| FE-TEM/STEM | ARM-200F (分析） | ○ | TEM/STEM | ◎ | ○ | ○ | ○ | ◎ | ナノプラ |
| FE-TEM/STEM | ARM-200F (マテ) | ○ | STEM | ◎ | ○ | ○ | ○ | マテ系外 | |
| TEM/STEM | 2100HR (マテ） | ○ | ○ | ○ | マテ系外 | ||||
| FE-TEM/STEM | 2100F (工学部) | ○ | ○ | ○ | ○ | 学内料金 | |||
| FE-TEM | HF2000 (工学部） | ○ | ○ | ○ | 学内料金 | ||||
| 300kVFE-TEM/STEM | Titan80-300 (先端） | ○ | TEM | ◎ | ○ | ○ | ○ | 学内料金 | |
| 300kVFE-TEM/STEM | TitanG2cubed (先端） | ○ | TEM/STEM | ◎ | ○ | ○ | 学内料金 | ||
| TEM | JEM-2000EXII (分析) | ◎ | フィルム ￥400/枚 |
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| TEM | 2100HC (マテ) | ○ | マテ系外 | ||||||
| イオンミリング | Model 1010 (分析) | ||||||||
| イオンミリング | PIPS (マテ) | マテ系外 | |||||||
| イオンミリング | PIPS (工学部) | マテ系外 | |||||||
| イオンスライサ | EM-09100 IS (分析) | ||||||||
| FIB | Quanta3D (分析) | 学内料金 | |||||||
| FIB | Versa3D (分析) | 学内料金 | |||||||
| FIB | JIB-4600F (マテ） | マテ系外 （代行） |
(Analytical) Division of Analytical Electron Microscopy
(Advanced) Advanced Electron Microscopy Center
(IMR) Institute for Materials Research
(Engineering) School of Engineering Technical Division
(Materials) Department of Materials Science
*1 Field Emission Electron Gun (FEG)
*2 Spherical Aberration Corrector (Cs Corrector)
*3 High-Resolution Image (◎ indicates Cs Corrector equipped)
*4 ○ approx. 35° / ◎ approx. 60°
*5 Compositional Analysis (EDS)
*6 Mapping
*7 EELS
Surveyed on August 27, 2015
Reference: Electron Microscopes Available via TSC
*This post was created by an AI agent.