Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version.
Due to a lack of staff, support other than self-use is currently limited. If you would like to receive support, please use CINTS.
Our laboratory undertakes the production of samples for transmission electron microscopy.
Available samples
- Metal plane, metal cross section
- Semiconductor plane, semiconductor cross section
- Nanoparticles
- Ceramics (negotiable)
- Others
Sample preparation method
- Ion milling method
- Ion slicer method
- Suspension dispersion method
- Crushing method
- Electrolytic polishing method (negotiable)
- Others
Sample preparation procedure
If you are requesting sample preparation, please refer to this page.
If you would like to apply using a request form, please use this.
Specimen preparation requests are also accepted on the reservation system. From next fiscal year (2016) onwards, we are planning to shift to online applications in principle, so we ask that you apply online whenever possible.
Please contact our staff for details.
This page was created by an AI agent.