To Those Requesting Analytical Services: Advance Consultation and Planned Utilization Request

*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* [Important] Key Takeaways and Summary (For Those with Urgent Needs) Currently, requests for analytical services (technical support including sample preparation, TEM observation, and analysis) associated with our facility are heavily congested. If you have … To Those Requesting Analytical Services: Advance Consultation and Planned Utilization Request

Maintenance and Configuration Update for JEM-002B

*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* The Division of Analytical Electron Microscopy, IMR conducted periodic maintenance and reconfigured the instrument setup for the JEM-002B analytical transmission electron microscope (Topcon EM-002B, Room 1-105) between October 19 and 23, 2026. Along with … Maintenance and Configuration Update for JEM-002B

Improvements to Power Supply Equipment for ARM200F Instruments

*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* The Division of Analytical Electron Microscopy, IMR conducted periodic maintenance and power facility improvements on its transmission electron microscopes from October 19 to 23, 2026. As part of this work, Constant Voltage Constant Frequency … Improvements to Power Supply Equipment for ARM200F Instruments

Notice Regarding Technical Support on Holidays and Weekends

*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* Thank you for using the shared equipment and technical support services of the Analytical Research Core for Advanced Materials (ARCAM), IMR. This notice outlines our policy and basic conditions regarding technical support (commissioned processing, … Notice Regarding Technical Support on Holidays and Weekends

[Restored] Report on Access Restrictions Due to Emergency Security Measures (AEM-FS Restrictions Ongoing)

*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* Thank you for using the website of the Division of Analytical Electron Microscopy (AEM), Institute for Materials Research (IMR), Tohoku University. From October 21 to 22, 2026, we implemented emergency security measures in response … [Restored] Report on Access Restrictions Due to Emergency Security Measures (AEM-FS Restrictions Ongoing)

[Facility & Tool Introduction] Safe and Reliable Sample Mounting on TEM Holders: Introducing the Manual Manipulator to Prevent Failure Risks

*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* In TEM observation, mounting thin-foil specimens prepared by FIB (Focused Ion Beam) onto a TEM holder is one of the most nerve-wracking tasks. If a specimen is accidentally damaged or lost during mounting on … [Facility & Tool Introduction] Safe and Reliable Sample Mounting on TEM Holders: Introducing the Manual Manipulator to Prevent Failure Risks

TEM Observation, Sample Preparation, and Usage Fees: Frequently Asked Questions (FAQ)

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. About this article This article is a piece written by AI, summarizing informal impressions from day-to-day operations and answers to questions we frequently receive. We hope you find it useful as background reading, but … TEM Observation, Sample Preparation, and Usage Fees: Frequently Asked Questions (FAQ)

How Much Does TEM Analysis Cost? — Cost and Usage Guide for TEM Sample Preparation, Observation, and Analysis

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. About this article This article is a piece written by AI, summarizing informal impressions from day-to-day operations and answers to questions we frequently receive. We hope you find it useful as background reading, but … How Much Does TEM Analysis Cost? — Cost and Usage Guide for TEM Sample Preparation, Observation, and Analysis

Notice of Experimental Launch: AEM Chatbot (Beta) on Our Website

*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* We have experimentally launched a chatbot (AEM Chatbot Beta) on the official website of the Division of Analytical Electron Microscopy, IMR (https://www.aem.imr.tohoku.ac.jp/) to support website navigation and user inquiries. ■ Overview A chat widget … Notice of Experimental Launch: AEM Chatbot (Beta) on Our Website

How to Use the Common Login Account

*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* This guide explains how to set up and use your Common Login Account (Single Sign-On / SSO) to securely access various services provided by the Division of Analytical Electron Microscopy, IMR, and the Analytical … How to Use the Common Login Account

[Equipment Trouble] Notice of Equipment Shutdown Due to Lightning Power Fluctuation and Potential Impact on Machine Time After Summer Recess

*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* During an inspection around 8:00 AM on Saturday, August 8, 2026, we confirmed that two Transmission Electron Microscopes (TEMs) in Room 1-105 had completely shut down, along with errors occurring on several other instruments. … [Equipment Trouble] Notice of Equipment Shutdown Due to Lightning Power Fluctuation and Potential Impact on Machine Time After Summer Recess

TEM Observation of Ferromagnetic Samples: Precautions and Division Policy

We frequently receive inquiries regarding TEM observation of ferromagnetic materials. Many institutions decline to accept ferromagnetic samples for observation as a matter of policy, out of concern for instrument protection. This is a reasonable and defensible position from the standpoint of protecting the equipment. At the same time, some researchers genuinely need to observe ferromagnetic … TEM Observation of Ferromagnetic Samples: Precautions and Division Policy

Addition of Vacuum Gauge

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): March 31, 2015 A vacuum gauge has been installed on the column of the JEM-2000EXII (allowing monitoring of the vacuum level when loading/unloading the specimen holder). *This post was … Addition of Vacuum Gauge

Policy on Handling of User Information and Acquired Data for Equipment Use

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 29, 2021 To All Users When using equipment managed by our division, it is assumed that user, project, and equipment usage information, as well as acquired data, will … Policy on Handling of User Information and Acquired Data for Equipment Use

Changes to Usage Procedures Following the Abolition of Seal Impression Requirements

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): April 8, 2021 To All Users Thank you for always using the Division of Analytical Electron Microscopy, IMR. To simplify administrative procedures and as part of recent efforts to … Changes to Usage Procedures Following the Abolition of Seal Impression Requirements

Division Policy Response to the Declaration of a State of Emergency

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): March 24, 2021 To All In response to the recent declaration of a state of emergency specific to Miyagi Prefecture and Sendai City regarding the novel coronavirus (COVID-19), our … Division Policy Response to the Declaration of a State of Emergency

Shared Equipment Use Support Program for Early-Career Researchers (Campus Only)

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): September 29, 2020 You can use the “Shared Equipment Use Support Program for Early-Career Researchers (Campus Only)” at our division. Support Details Exemption of half of the equipment usage … Shared Equipment Use Support Program for Early-Career Researchers (Campus Only)

Distinction Between Contracted Experiments and Collaborative Research

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): July 10, 2020 Our division accepts “Contracted Experiments” only for simple experimental tasks. Requests requiring academic judgment will be handled as collaborative research. Please consult us directly for details. … Distinction Between Contracted Experiments and Collaborative Research

Policy Considerations Regarding Equipment Usage (Fees, Publication of Results, and Technical Support) (For Campus Users, 2022 Provisional Edition)

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): March 30, 2022 This page contains content currently under consideration (as of 2022/03/30). To all users, Thank you for always using the equipment managed by the Division of Analytical … Policy Considerations Regarding Equipment Usage (Fees, Publication of Results, and Technical Support) (For Campus Users, 2022 Provisional Edition)

Policy Considerations Regarding the “Advanced User Slot” (Provisional Title) (For Campus Users)

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): April 12, 2022 To all users, Thank you for your continued use of the Division of Analytical Electron Microscopy. As noted recently in the “Policy Considerations Regarding Equipment Usage”, … Policy Considerations Regarding the “Advanced User Slot” (Provisional Title) (For Campus Users)