Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): September 5, 2022 When using the facilities and equipment managed by our division, an application for use is required, but please be aware that the application procedure differs depending … Important Notes and Requests Regarding Usage Applications
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): October 30, 2023 About Training For an overview of the training items, please see here. Legend ◎ Mandatory ● Recommended ○ Elective (for beginners) △ Elective (for intermediate users) … TEM Training Details and Syllabus
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): October 20, 2022 To all users, Thank you for always using the Division of Analytical Electron Microscopy, IMR. Our division is preparing for the operation of the transmission electron … Notice Regarding the Operation Start Date of JEM-2100plus
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): November 5, 2023 A video showing the insertion and removal of the specimen holder for the JEM-2100plus has been uploaded. When observing bulk ferromagnetic specimens, perform the insertion and … Manual Video: JEM-2100plus – Specimen Holder Insertion and Removal
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): November 14, 2023 This video shows how to use the pumping station for the specimen holder of the JEM-ARM200F STEM corrector model. The pumping station for the W corrector … Manual Video: JEM-ARM200F (S) – Pumping Station for Specimen Holder
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): August 7, 2023 To all users, Thank you for always using the Division of Analytical Electron Microscopy, IMR. Due to the closure of the workplace, our division will be … Summer Holiday Closure Notice (August 2023)
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): October 22, 2023 To all campus users, Thank you for your continued use of our division.In order to accurately understand the usage status of each piece of equipment and … Request for User Registration (Campus Only)
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): January 20, 2023 The Division of Analytical Electron Microscopy, IMR is implementing remote access for experimental equipment. Here we introduce the initiatives of our division. Background of Remote Support … Remote Access Setup for Experimental Equipment
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): October 29, 2023 This page summarizes the standard training items necessary for operating a TEM.The standard training based on this page is currently in preparation, and the contents are … TEM Training Syllabus and Modules
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): November 22, 2023 This is the specimen loading and unloading method for the JEM-ARM200F STEM corrector machine. JEM-ARM200F Manual Video List *This post was created by an AI agent.
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): November 16, 2023 This video shows how to use the plasma cleaner for the JEM-ARM200F STEM corrector model. Always perform cleaning when inserting a specimen into the electron microscope. … Manual Video: JEM-ARM200F (S) – Plasma Cleaner Operation
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): April 1, 2024 To all users Thank you very much for always using the Division of Analytical Electron Microscopy, IMR. As previously announced, due to the transfer of technical … Notice Regarding TEM Workshops (For Campus Users)
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): March 27, 2024 To all users Thank you for your continued use and support of the Division of Analytical Electron Microscopy, IMR. Additionally, we would like to express our … Report on Emergency User Survey Results
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): November 28, 2023 We have introduced a manual manipulator for handling TEM specimens. It can be used for precise work, such as mounting FIB specimens onto a TEM holder. … Manipulator Operation Guide
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): November 10, 2023 This video shows the insertion and removal of the specimen holder for the JEM-ARM200F STEM corrector model. When observing bulk ferromagnetic specimens, insert and remove the … Manual Video: JEM-ARM200F (S) – Specimen Holder Insertion and Removal
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): November 22, 2023 JEM-ARM200F STEM Corrector Model ACD (Anti-Contamination Device) Cryogen Replenishment JEM-ARM200F STEM Corrector Model ACD Heating JEM-ARM200F Manual Video List *This post was created by an AI … Manual Video: JEM-ARM200F (S) – Anti-Contamination Device (ACD) Operation
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): March 21, 2024 To all users Thank you very much for always using the Division of Analytical Electron Microscopy, IMR.Due to the transfer of technical staff, our facility will … Urgent Questionnaire Request: Future Structure of the Division of Analytical Electron Microscopy, IMR
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): December 27, 2023 We are currently working on creating video manuals for the equipment managed by our facility, but as this work is being done in between equipment management … Reference: Aberration Correction Using Ronchigram
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): December 19, 2023 This is an explanation of how to register (sign up) as a user for the reservation management system. The target audience for this video is limited … Manual Video: Signup Guide for the Reservation System
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): December 2, 2023 This is the beam generation method for the JEM-ARM200F STEM corrector machine. Before performing this operation, complete the electron microscope step-up and holder insertion. Contents of … Manual Video: JEM-ARM200F (S) – Electron Beam Alignment
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 This is the quick operation manual for the equipment managed by our facility. It will be published sequentially as it becomes ready. 💡 Note JEM-2100plus JEM-ARM200F … Quick Operation Manual
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 3, 2024 1. The materials for the TEM Workshop (JEM-2100plus Basic License) have been published. The additional items this time are as follows: Since the 5th session of … TEM Seminar: JEM-2100plus Basic License Certification Exam and Additional Training
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): April 15, 2024 To all campus users We will be holding a TEM workshop as detailed below. Those who wish to attend should apply using the form below. Application … TEM Workshop (JEM-2100plus: Basic License: Apr-Jun 2024) Application Form
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 (Day 1) Fundamentals 1: Up to Beam Generation (Day 2) Fundamentals 2: Adjustments and Field of View Search Mainly on the Screen (Day 3) Beginner 1: … JEM-2100plus Quick Operation Manual
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 Division of Analytical Electron Microscopy, IMR – Notice Note 💡 This page mainly posts preliminary information directly from the on-site staff. However, please note that this … Notice Note
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 Specimen Mounting ~ Beam Generation/Stop ~ Specimen Removal *This post was created by an AI agent.
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 Step-up: 160kV (Standby) -> 200kV (Operation) Step-down: 200kV (Operation) -> 160kV (Standby) *This post was created by an AI agent.
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 Specimens and specimen holders are fragile, so handle them with care. Specimen Mounting Specimen Removal 💡 Reverse procedure of specimen mounting *This post was created … JEM-2100plus: Specimen Mounting (Double Tilt Holder)
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 Handle the specimen and specimen holder carefully, as they are easily damaged. Specimen Mounting Specimen Removal 💡 Reverse procedure of specimen mounting *This post was … JEM-2100plus: Specimen Mounting (Single Tilt Holder)
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 This page is a quick manual for the JEM-2100plus. The contents are subject to change. Please receive training in advance before actually using the equipment. … JEM-2100plus: Aperture Control
