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[Facility & Tool Introduction] Safe and Reliable Sample Mounting on TEM Holders: Introducing the Manual Manipulator to Prevent Failure Risks

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*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* In TEM observation, mounting thin-foil specimens prepared by FIB (Focused Ion Beam) onto a TEM holder is one of the most nerve-wracking tasks. If a specimen is accidentally damaged or lost during mounting on … [Facility & Tool Introduction] Safe and Reliable Sample Mounting on TEM Holders: Introducing the Manual Manipulator to Prevent Failure Risks

TEM Observation, Sample Preparation, and Usage Fees: Frequently Asked Questions (FAQ)

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Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. About this article This article is a piece written by AI, summarizing informal impressions from day-to-day operations and answers to questions we frequently receive. We hope you find it useful as background reading, but … TEM Observation, Sample Preparation, and Usage Fees: Frequently Asked Questions (FAQ)

How Much Does TEM Analysis Cost? — Cost and Usage Guide for TEM Sample Preparation, Observation, and Analysis

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Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. About this article This article is a piece written by AI, summarizing informal impressions from day-to-day operations and answers to questions we frequently receive. We hope you find it useful as background reading, but … How Much Does TEM Analysis Cost? — Cost and Usage Guide for TEM Sample Preparation, Observation, and Analysis

Notice of Experimental Launch: AEM Chatbot (Beta) on Our Website

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*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* We have experimentally launched a chatbot (AEM Chatbot Beta) on the official website of the Division of Analytical Electron Microscopy, IMR (https://www.aem.imr.tohoku.ac.jp/) to support website navigation and user inquiries. ■ Overview A chat widget … Notice of Experimental Launch: AEM Chatbot (Beta) on Our Website

How to Use the Common Login Account

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*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* This guide explains how to set up and use your Common Login Account (Single Sign-On / SSO) to securely access various services provided by the Division of Analytical Electron Microscopy, IMR, and the Analytical … How to Use the Common Login Account

[Equipment Trouble] Notice of Equipment Shutdown Due to Lightning Power Fluctuation and Potential Impact on Machine Time After Summer Recess

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*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* During an inspection around 8:00 AM on Saturday, August 8, 2026, we confirmed that two Transmission Electron Microscopes (TEMs) in Room 1-105 had completely shut down, along with errors occurring on several other instruments. … [Equipment Trouble] Notice of Equipment Shutdown Due to Lightning Power Fluctuation and Potential Impact on Machine Time After Summer Recess

TEM Observation of Ferromagnetic Samples: Precautions and Division Policy

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We frequently receive inquiries regarding TEM observation of ferromagnetic materials. Many institutions decline to accept ferromagnetic samples for observation as a matter of policy, out of concern for instrument protection. This is a reasonable and defensible position from the standpoint of protecting the equipment. At the same time, some researchers genuinely need to observe ferromagnetic … TEM Observation of Ferromagnetic Samples: Precautions and Division Policy

Addition of Vacuum Gauge

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Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): March 31, 2015 A vacuum gauge has been installed on the column of the JEM-2000EXII (allowing monitoring of the vacuum level when loading/unloading the specimen holder). *This post was … Addition of Vacuum Gauge

Policy on Handling of User Information and Acquired Data for Equipment Use

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Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 29, 2021 To All Users When using equipment managed by our division, it is assumed that user, project, and equipment usage information, as well as acquired data, will … Policy on Handling of User Information and Acquired Data for Equipment Use

Changes to Usage Procedures Following the Abolition of Seal Impression Requirements

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Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): April 8, 2021 To All Users Thank you for always using the Division of Analytical Electron Microscopy, IMR. To simplify administrative procedures and as part of recent efforts to … Changes to Usage Procedures Following the Abolition of Seal Impression Requirements

Division Policy Response to the Declaration of a State of Emergency

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Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): March 24, 2021 To All In response to the recent declaration of a state of emergency specific to Miyagi Prefecture and Sendai City regarding the novel coronavirus (COVID-19), our … Division Policy Response to the Declaration of a State of Emergency

Shared Equipment Use Support Program for Early-Career Researchers (Campus Only)

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Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): September 29, 2020 You can use the “Shared Equipment Use Support Program for Early-Career Researchers (Campus Only)” at our division. Support Details Exemption of half of the equipment usage … Shared Equipment Use Support Program for Early-Career Researchers (Campus Only)

Distinction Between Contracted Experiments and Collaborative Research

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Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): July 10, 2020 Our division accepts “Contracted Experiments” only for simple experimental tasks. Requests requiring academic judgment will be handled as collaborative research. Please consult us directly for details. … Distinction Between Contracted Experiments and Collaborative Research

Policy Considerations Regarding Equipment Usage (Fees, Publication of Results, and Technical Support) (For Campus Users, 2022 Provisional Edition)

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Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): March 30, 2022 This page contains content currently under consideration (as of 2022/03/30). To all users, Thank you for always using the equipment managed by the Division of Analytical … Policy Considerations Regarding Equipment Usage (Fees, Publication of Results, and Technical Support) (For Campus Users, 2022 Provisional Edition)

Policy Considerations Regarding the “Advanced User Slot” (Provisional Title) (For Campus Users)

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Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): April 12, 2022 To all users, Thank you for your continued use of the Division of Analytical Electron Microscopy. As noted recently in the “Policy Considerations Regarding Equipment Usage”, … Policy Considerations Regarding the “Advanced User Slot” (Provisional Title) (For Campus Users)

TEM Training Details and Syllabus

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Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): October 30, 2023 About Training For an overview of the training items, please see here. Legend ◎ Mandatory ● Recommended ○ Elective (for beginners) △ Elective (for intermediate users) … TEM Training Details and Syllabus

Manual Video: JEM-2100plus – Specimen Holder Insertion and Removal

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Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): November 5, 2023 A video showing the insertion and removal of the specimen holder for the JEM-2100plus has been uploaded. When observing bulk ferromagnetic specimens, perform the insertion and … Manual Video: JEM-2100plus – Specimen Holder Insertion and Removal

Manual Video: JEM-ARM200F (S) – Pumping Station for Specimen Holder

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Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): November 14, 2023 This video shows how to use the pumping station for the specimen holder of the JEM-ARM200F STEM corrector model. The pumping station for the W corrector … Manual Video: JEM-ARM200F (S) – Pumping Station for Specimen Holder

TEM Training Syllabus and Modules

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Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): October 29, 2023 This page summarizes the standard training items necessary for operating a TEM.The standard training based on this page is currently in preparation, and the contents are … TEM Training Syllabus and Modules