Equipment list

Equipment Categories
TEM/STEM
TEM sample holder
FIB/SEM
Ion Polishing
TEM sample related equipment
Electron microscope related equipment
Other devices
Software
Equipment Categories
TEM/STEM
TEM sample holder
FIB/SEM
Ion Polishing
TEM sample related equipment
Electron microscope related equipment
Other devices
Software

Transmission electron microscopy (TEM/STEM)

Division S/TEM S/TEM S/TEM TEM TEM
Appearance dsc_000001-1
Name JEM-ARM200F
W Collector		 JEM-ARM200F
STEM Collector		 JEM-2100plus EM-002B JEM-2000EXII
Function TEM/STEM/EDS/EELS TEM /STEM/EDS/EELS TEM/STEM/EDS TEM/STEM/EDS TEM
Location 2-B13 2-B14 3-103 1-105 1-105
Funding Source / Origin Nanotech. Plat.*1 Faculty of Engineering In-house laboratory Director’s Discretionary Fund HVEM*2
Notes EDS malfunction
High voltage malfunction up to 160kV
CL fixed aperture dirty		 Slightly unstable lens

TEM sample holder

Classification Sample heating holder Sample cooling holder Sample heating holder Sample cooling holder
Appearance
Photo
Coming Soon
Name EM-SHH(4) / EM-SHTH
Function For JEM-2000EXII For JEM-2000EXII For ARM200F/2100plus
Protchips		 ARM200F/2100plus For
For bulk
Location 1-105 1-105 2-B14 2-B14
Funding Source / Origin HVEM*2 HVEM*2 Faculty of Engineering Faculty of Engineering
Notes Adjusting Adjusting
Division Two-axis tilt holder for analysis Reinforced specification analysis two-axis tilt holder Single-axis tilt holder Holder for tomography
Appearance
Photo
Coming Soon
Name
Function For ARM200F/2100plus For ARM200F/2100plus For ARM200F/2100plus For ARM200F/2100plus
Location 3-103,2-B13 2-B13,2-B14 3-103,2-B13,2-B14 2-B14
Funding Source / Origin ・HVEM*2
・In-house laboratory		 ・Nanotech. Plat.*1
・Faculty of Engineering		 ・Nanotech. Plat.*1
・Faculty of Engineering
・In-house laboratory		 Nanotech. Plat.*1
Notes Multiple units; origins differ Multiple units; origins differ Multiple units; origins differ

FIB/SEM

Division FIB/SEM FIB/SEM FIB/SEM
Appearance
Name Versa 3D Quanta 3D AMBER X
Function ・Dual beam Ga-FIB
・Combined SEM/FIB processing
・Micro sampling with EasyLift		 ・Dual beam Ga-FIB
・Combined SEM/FIB processing
・Micro sampling with Omniprobe		 ・Dual beam Xe plasma FIB
・Combined SEM/FIB processing
・TOF-SIMS capable
Location 2-613 2-613 2 -612
Funding Source / Origin Nanotech. Plat.*1 Advanced Electron Microscopy Center*2 ARIM
Notes

Ion Polishing

Classification Low-acceleration milling Ion milling Ion milling Ion slicer
Appearance
Name Gentle Mill 3 model 1010 PIPS II（B） EM-09100IS
Function Low energy plasma milling Auto stop
Sample cooling		 Automatic stop
Sample cooling		 Cross-section sample preparation
Location 2-613 1-105 1-105 1-105
Funding Source / Origin Nanotech. Plat.*1 HVEM*2 Nanotech. Plat.*1 ARIM
Notes Discontinued (out of service due to failure; disposal in progress)
Classification Disc punch Lap grinder Low speed cutter Dimple grinder Diamond wire saw
Appearance
Name Homemade Marteau Gatan 656 CS-203
Function
Location 1-105 1-105 1-105 1-105 1-105
Funding Source / Origin Advanced Electron Microscopy Center*2 National University Reform Reinforcement Promotion Subsidy
Notes
Classification Automatic polishing machine Hot plate Ultrasonic disc punching machine Electrolytic polishing equipment
Appearance
Photo
Coming Soon
Name Homemade
Features Φ3mm disk
Location 1-105 1-105 1-105
Funding Source / Origin National University Reform Reinforcement Promotion Subsidy In-house laboratory
Notes Rental only
Division Optical microscope Optical microscope Optical microscope
Appearance
Photo
Coming Soon
Name Digital microscope Stereo microscope Optical microscope
Features
Location 1-105,2-B13,2-B14,2-613,3-103 1-105 1-105
Funding Source / Origin
Notes
Classification Osmium coater Carbon coater Ion cleaner Ion cleaner Ion cleaner
Appearance
Photo
Coming Soon
Name NEOC-PRO
Function
Location 1-111 2-613 3-103 2-B13 2-B14
Funding Source / Origin Designated National University fund Nanotech. Plat.*1
Notes Adjusting
Classification Plasma etching equipment Plasma cleaner Plasma cleaner
Appearance
Name Solarus Solarus
Function Gas type: Ar,H2,O2 Gas type: Ar,H2,O2
Location 1-105 2-B13 2-B14
Funding Source / Origin AIMR Nanotech. Plat.*1
Notes Out of order/unrepairable

Other devices

Classification Multipurpose X-ray diffractometer Thermal analyzer
Appearance
Name SmartLab 9SW Thermo plus EVO Ⅱ
Function XRD DSC/TG-DTA
Location 2-613 2-613
Funding Source / Origin Nanotech. Plat. Molecular Synthesis PF*1 Nanotech. Plat. Molecular Synthesis PF*1
Notes

Software

Note: The "Funding Source / Origin" column shows the name of the organization at the time the equipment was transferred to our division.

*1 Nanotech. Plat. = Nanotechnology Platform, formerly a MEXT/JST shared-facility program; currently named ARIM (Advanced Research Infrastructure for Materials and Nanotechnology).

*2 HVEM = the High-Voltage Electron Microscope Laboratory; currently named TCEM (Tohoku Center for Electron Microscopy).

Note: A blank "Funding Source / Origin" cell may indicate a low-cost purchase (not separately recorded) or an origin that is currently unknown.

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