*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.*
Overview
The JEOL JEM-ARM200F (W-Corrector configuration) is a flagship 200 kV Cold Field Emission Gun (Cold-FEG) atomic-resolution analytical electron microscope equipped with double spherical aberration correctors for both the illumination (STEM) and imaging (TEM) systems.
It integrates atomic-resolution TEM imaging (lattice resolution 70 pm, point resolution 130 pm), sub-angstrom STEM imaging (HAADF 100 pm, ABF, BF), and high-sensitivity microanalysis (EDS and EELS).
Features
- Double Spherical Aberration Correctors (W-Corrector): Equipped with both probe (illumination) and image (imaging) Cs correctors, achieving both high-precision TEM phase contrast imaging and sub-angstrom STEM probe formation in a single instrument.
- Cold Field Emission Gun (Cold-FEG): Provides high brightness with an exceptionally narrow energy spread, delivering superior spatial and energy resolution for advanced EELS microanalysis.
- Multi-Detector STEM/EDS/EELS Suite: Enables simultaneous acquisition of HAADF, LAADF, ABF, and BF STEM images, integrated with large solid-angle EDS detectors and EELS spectroscopy systems.
- MEXT ARIM Shared Facility: Maintained under the MEXT Advanced Research Core for Advanced Materials (ARIM) project.
Specifications
Actual equipment configurations or specifications may differ from standard manual specifications. Please consult the equipment manager for details regarding current capabilities and conditions of use.
| Manufacturer | JEOL Ltd. |
|---|---|
| Model | JEM-ARM200F (W-Corrector) |
| Electron Source | Cold Field Emission Gun (Cold-FEG) |
| Accelerating Voltage | 200 kV, 80 kV |
| Cs Correctors | Double Cs Correctors (Illumination/Probe & Imaging/Image) |
| Resolution (200 kV) | STEM-HAADF resolution: 100 pm TEM lattice resolution: 70 pm / TEM point resolution: 130 pm |
| Max Specimen Tilt | X ±35° / Y ±30° |
| Analytical Capabilities | TEM imaging, STEM imaging (HAADF/LAADF/ABF/BF), TEM-EDS / STEM-EDS, TEM-EELS / STEM-EELS |
| Funding / Facility | MEXT ARIM Project (Advanced Research Core for Advanced Materials) |
| Location | Room 2-B13 |
Manuals & Guidelines
[Application for Use]
Application is required through the Tohoku University Center for Integrated Nanotechnology Support (CINTS).
[Manual (Campus Access Only)]
📄 Gatan Enfinium EELS Owner’s Manual (PDF, campus access only)