X-ray diffraction device SmartLab 9SW

Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version.

  • Rigaku: SmartLab 9SW
  • Output: 9kw high brightness Cu radiation source
  • Rapid measurement of powder, thin film samples, etc.
  • In-plane measurement
  • Variable temperature measurement using DSC unit

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This device was developed by the Ministry of Education, Culture, Sports, Science and Technology’s Materials Advanced Research Infrastructure (formerly Nanotechnology Platform) project.

To use it, you need to apply through the Tohoku University Nanotechnology Fusion Technology Support Center.

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