Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.
Original post date (Japanese version): October 29, 2023
This page summarizes the standard training items necessary for operating a TEM.
The standard training based on this page is currently in preparation, and the contents are subject to change.
For an overview of the training and usage permission, please see here.
The knowledge and skills required for using the obtained data, such as data analysis and image interpretation, differ depending on the specimen and the purpose of the experiment.
Reference: ARIM-IMR Tutorial Series (Introduction to Transmission Electron Microscopy and Materials Science)
For details on the training items, please see here.
Training Categories
- Basic: Items related to procedures and safety. Guidance.
- Common: Common items necessary for using TEM/STEM.
- TEM: Items necessary for using TEM mode and electron diffraction mode.
- STEM: Items necessary for using STEM mode.
- Special: Special experiments.
Mandatory and Elective Skills
- Mandatory skills: Skills required to operate the equipment safely and without causing trouble such as breakdowns.
- Elective skills: Skills selected according to the specimen and the purpose of the experiment.
Stages of Training: “Taken” and “Mastered”
- Taken: The stage at which an explanation of the contents has been received for each training item.
- Mastered: The stage at which it has been confirmed that the contents of the training item can be performed without assistance from the staff.
Main Training Items by Equipment
| ＃ | ARM200F-W | ARM200F-S | 2100plus | 2000EXII | 002B | 項目 | 主な内容 | 備考 |
|---|---|---|---|---|---|---|---|---|
| 基本１ | ◎ | ◎ | ◎ | ◎ | ◎ | 手続き | 利用申請：使用予約：予約システム：費用： | |
| 基本２ | ● | ● | ● | ● | ● | 安全：電離放射線 | 放射線発生装置である電子顕微鏡を安全に取り扱うための教育訓練。（推奨） | 所属部局の教育訓練を受講してください |
| 基本３ | ◎ | ◎ | ◎ | ● | ● | 安全：高圧ガス | 試料室のリークやプラズマクリーナーで使用する高圧ガスを安全に取り扱うための教育訓練。 | 所属部局の教育訓練を受講してください |
| 基本４ | ◎ | ◎ | ● | ● | ◎ | 安全：寒剤 | 試料汚染防止装置（ACD)・EDS検出器で使用する液体窒素を安全に取り扱うための教育訓練。 | 所属部局の教育訓練を受講してください |
| 共通1 | ◎ | ◎ | ◎ | ◎ | ◎ | 設備：装置概要 | 当該装置の構成要素、周辺機器、設置場所を確認。 | |
| 共通2 | ◎ | ◎ | ◎ | ◎ | ◎ | 試料交換 | 薄膜試料のホルダへの着脱。ホルダ・試料のクリーニング。ホルダの鏡筒への挿抜 | 最も故障やトラブルの多いポイント |
| 共通3a | ◎ | ◎ | ◎ | ◎ | ◎ | 共通 | 開始/終了時の状態確認・中断・再開・データ取出・ログ記録 | |
| 共通3b | ● | ● | ◎ | ● | ● | 共通・加速電圧 | 加速電圧ON/OFF | |
| 共通3c | ◎ | ◎ | ◎ | ◎ | ◎ | 共通・エミッション | エミッションOn/OFF | |
| 共通3d | ◎ | ◎ | ● | ※ | – | ACD | LN2補給・ACDヒート | |
| TEM1 | ◎ | ◎ | ◎ | ◎ | ◎ | TEM基礎 | 設定読込・試料移動・ビーム調整・倍率変更・モード選択・像撮影・ | |
| TEM2 | ○ | ○ | ○ | ○ | ○ | DIFF:基礎 | 制限視野電子回折・回折パターン撮影 | |
| TEM3 | ○ | ○ | ○ | ○ | ○ | DIFF：方位微調整 | 単結晶基板の晶帯軸入射・2波励起（最も近い方位のみ） | |
| TEM4 | ○ | ○ | ○ | ○ | ○ | DIFF方位出し（易） | 方位出し（単結晶・粗大粒） | |
| TEM5 | △ | △ | △ | △ | △ | DIFF：方位出し（並） | 方位出し（多結晶） | |
| TEM6 | ○ | ○ | ○ | ○ | ○ | TEM:BF | TEM（明視野法） | |
| TEM7 | △ | △ | △ | △ | △ | TEM:DF | TEM（暗視野法） | |
| TEM8 | △ | △ | △ | – | △ | TEM:HREM | TEM（高分解能法） | |
| TEM9a | ▲ | ▲ | ▲ | ▲ | ▲ | DIFF:NBD | TEM（NBD） | |
| TEM9b | ▲ | ▲ | ▲ | ▲ | ▲ | DIFF:CBD | TEM（CBD） | |
| TEM10 | ※ | – | – | – | – | TEMコレクタ調整 | TEMコレクタ調整 | |
| STEM１ | ○ | ○ | ○ | – | ○ | STEM基礎 | 設定読込・検出器選択・カメラ長選択・絞り選択・像表示・BF/ADF・中低倍・像記録 | |
| STEM２ | △ | △ | – | – | – | STEM（高分解能） | STEM（高倍・含ロンチグラム調整） | |
| STEM３ | ○ | ○ | △ | – | △ | STEM-EDS | 点分析・マッピング | |
| STEM４ | ▲ | ▲ | – | – | – | STEM-EELS | STEM-EELS | |
| STEM５ | ※ | ※ | – | – | – | STEMコレクタ調整 | STEMコレクタ調整 | |
| 特殊1 | ★ | ★ | – | – | – | STEMトモグラフィ | ||
| 特殊2 | – | – | – | ★ | – | 試料加熱（バルク） | ||
| 特殊3 | ★ | ★ | ★ | – | – | 試料加熱（Prototips） | ||
| 特殊4 | ★ | ★ | ★ | ★ | – | 試料冷却 |
Legend
◎ Mandatory ● Recommended ○ Elective (for beginners) △ Elective (for intermediate users) ▲ Elective (for advanced users) ★ Special ※ For administrators – Not set
*This post was created by an AI agent.