Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): March 31, 2015 A vacuum gauge has been installed on the column of the JEM-2000EXII (allowing monitoring of the vacuum level when loading/unloading the specimen holder). *This post was … Addition of Vacuum Gauge
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 29, 2021 To All Users When using equipment managed by our division, it is assumed that user, project, and equipment usage information, as well as acquired data, will … Policy on Handling of User Information and Acquired Data for Equipment Use
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): March 24, 2021 To All In response to the recent declaration of a state of emergency specific to Miyagi Prefecture and Sendai City regarding the novel coronavirus (COVID-19), our … Division Policy Response to the Declaration of a State of Emergency
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): July 10, 2020 Our division accepts “Contracted Experiments” only for simple experimental tasks. Requests requiring academic judgment will be handled as collaborative research. Please consult us directly for details. … Distinction Between Contracted Experiments and Collaborative Research
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 26, 2021 To All Users In our division, we restrict the number of people entering a room simultaneously according to the BCP level to prevent the spread of … Entry Restrictions During the High-Humidity Rainy Season
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): September 17, 2022 To All Users For the convenience of equipment users, our division provides a data storage service using a file server, which is widely used. However, we … Suspension of Accounts for Long-Term Unused File Server Storage
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): September 29, 2020 You can use the “Shared Equipment Use Support Program for Early-Career Researchers (Campus Only)” at our division. Support Details Exemption of half of the equipment usage … Shared Equipment Use Support Program for Early-Career Researchers (Campus Only)
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): April 8, 2021 To All Users Thank you for always using the Division of Analytical Electron Microscopy, IMR. To simplify administrative procedures and as part of recent efforts to … Changes to Usage Procedures Following the Abolition of Seal Impression Requirements
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): October 30, 2023 About Training For an overview of the training items, please see here. Legend ◎ Mandatory ● Recommended ○ Elective (for beginners) △ Elective (for intermediate users) … TEM Training Details and Syllabus
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): December 27, 2021 To all users, Thank you for always using the Division of Analytical Electron Microscopy, IMR. Due to the closure of the workplace, our division will be … Notice of Facility Closure During the New Year Holiday Period
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): March 30, 2022 This page contains content currently under consideration (as of 2022/03/30). To all users, Thank you for always using the equipment managed by the Division of Analytical … Policy Considerations Regarding Equipment Usage (Fees, Publication of Results, and Technical Support) (For Campus Users, 2022 Provisional Edition)
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): October 18, 2022 To All Users Thank you for always using the Division of Analytical Electron Microscopy, IMR. This academic year, our division will newly install two transmission electron … Notice of New Electron Microscope Installations
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): September 5, 2022 When using the facilities and equipment managed by our division, an application for use is required, but please be aware that the application procedure differs depending … Important Notes and Requests Regarding Usage Applications
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): April 12, 2022 To all users, Thank you for your continued use of the Division of Analytical Electron Microscopy. As noted recently in the “Policy Considerations Regarding Equipment Usage”, … Policy Considerations Regarding the “Advanced User Slot” (Provisional Title) (For Campus Users)
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): October 20, 2022 To all users, Thank you for always using the Division of Analytical Electron Microscopy, IMR. Our division is preparing for the operation of the transmission electron … Notice Regarding the Operation Start Date of JEM-2100plus
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): January 20, 2023 The Division of Analytical Electron Microscopy, IMR is implementing remote access for experimental equipment. Here we introduce the initiatives of our division. Background of Remote Support … Remote Access Setup for Experimental Equipment
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): November 5, 2023 A video showing the insertion and removal of the specimen holder for the JEM-2100plus has been uploaded. When observing bulk ferromagnetic specimens, perform the insertion and … Manual Video: JEM-2100plus – Specimen Holder Insertion and Removal
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): November 14, 2023 This video shows how to use the pumping station for the specimen holder of the JEM-ARM200F STEM corrector model. The pumping station for the W corrector … Manual Video: JEM-ARM200F (S) – Pumping Station for Specimen Holder
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): August 7, 2023 To all users, Thank you for always using the Division of Analytical Electron Microscopy, IMR. Due to the closure of the workplace, our division will be … Summer Holiday Closure Notice (August 2023)
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): October 22, 2023 To all campus users, Thank you for your continued use of our division.In order to accurately understand the usage status of each piece of equipment and … Request for User Registration (Campus Only)
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): October 29, 2023 This page summarizes the standard training items necessary for operating a TEM.The standard training based on this page is currently in preparation, and the contents are … TEM Training Syllabus and Modules
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): November 10, 2023 This video shows the insertion and removal of the specimen holder for the JEM-ARM200F STEM corrector model. When observing bulk ferromagnetic specimens, insert and remove the … Manual Video: JEM-ARM200F (S) – Specimen Holder Insertion and Removal
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): November 22, 2023 JEM-ARM200F STEM Corrector Model ACD (Anti-Contamination Device) Cryogen Replenishment JEM-ARM200F STEM Corrector Model ACD Heating JEM-ARM200F Manual Video List *This post was created by an AI … Manual Video: JEM-ARM200F (S) – Anti-Contamination Device (ACD) Operation
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): November 16, 2023 This video shows how to use the plasma cleaner for the JEM-ARM200F STEM corrector model. Always perform cleaning when inserting a specimen into the electron microscope. … Manual Video: JEM-ARM200F (S) – Plasma Cleaner Operation
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): November 22, 2023 This is the specimen loading and unloading method for the JEM-ARM200F STEM corrector machine. JEM-ARM200F Manual Video List *This post was created by an AI agent.
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): November 28, 2023 We have introduced a manual manipulator for handling TEM specimens. It can be used for precise work, such as mounting FIB specimens onto a TEM holder. … Manipulator Operation Guide
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): March 27, 2024 To all users Thank you for your continued use and support of the Division of Analytical Electron Microscopy, IMR. Additionally, we would like to express our … Report on Emergency User Survey Results
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): April 1, 2024 To all users Thank you very much for always using the Division of Analytical Electron Microscopy, IMR. As previously announced, due to the transfer of technical … Notice Regarding TEM Workshops (For Campus Users)
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): December 19, 2023 This is an explanation of how to register (sign up) as a user for the reservation management system. The target audience for this video is limited … Manual Video: Signup Guide for the Reservation System
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): December 27, 2023 We are currently working on creating video manuals for the equipment managed by our facility, but as this work is being done in between equipment management … Reference: Aberration Correction Using Ronchigram
