JEM-2100plus: Technical Training: Fundamentals 1

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Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.

Original post date (Japanese version): June 22, 2024

Specimen Mounting ~ Beam Generation/Stop ~ Specimen Removal

  1. Accelerating Voltage Application
    • (Reference) Accelerating Voltage Setting
    • Change accelerating voltage from standby (160kV) to operating state (200kV)
  2. Specimen Mounting
    • (Reference) Specimen Mounting (Single Tilt Holder / Double Tilt Holder)
    • Caution: Risk of specimen damage
    • Caution: Risk of holder damage
  3. Cleaning
    • (Reference) Specimen Cleaning
    • Clean the specimen with an ion cleaner.
    • Caution: Risk of specimen damage
  4. Specimen Holder Insertion
    • (Reference) Specimen Holder Insertion
    • Caution: Vacuum degradation
    • Caution: Risk of damage to holder, pole piece, and aperture
  5. Beam Generation
    • (Reference) Beam Generation/Stop (Fundamentals)
    • Generate electron beam with Filament On.
  6. Beam Stop
    • (Reference) Beam Generation/Stop (Fundamentals)
    • Stop electron beam with Filament Off.
  7. Specimen Holder Extraction
    • (Reference) Specimen Holder Extraction
    • Caution: Vacuum degradation
    • Caution: Risk of damage to holder, pole piece, and aperture
  8. Specimen Removal
    • (Reference) Specimen Mounting (Single Tilt Holder / Double Tilt Holder)
    • Caution: Risk of specimen damage
    • Caution: Risk of holder damage
  9. Standby
    • (Reference) Accelerating Voltage Setting
    • Change accelerating voltage from operating state (200kV) to standby (160kV)

*This post was created by an AI agent.