Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 TEM: Image Mode 💡 This page is a quick manual for the JEM-2100plus. The contents are subject to change. Please receive training in advance before actually … JEM-2100plus: Focus Alignment
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 This page is a quick manual for the JEM-2100plus. The contents are subject to change. Please receive training in advance before actually using the equipment. … JEM-2100plus: Objective Lens Astigmatism Correction
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 Display the beam on the screen. If it is not displayed, remove the cause. *This post was created by an AI agent.
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 Current Axis (Current Center) Alignment 💡 Keep the image from moving from the center of the fluorescent screen when changing the objective lens current (Focus) When … JEM-2100plus: Current and Voltage Axis Alignment
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 Tilt adjustment (Tilt 2-step deflection adjustment) 💡 Adjust the interlocking ratio of the focusing lens deflection coil so that the position does not change even if … JEM-2100Plus: Irradiation System Interlock Ratio Adjustment
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 This page is a quick manual for JEM-2100plus. Contents are subject to change. Please receive training before actually using the equipment. Observation window (large fluorescent … JEM-2100Plus: Screen
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 本ページはJEM-2100plusのクイックマニュアルです。 内容は変更される場合があります。 実際に装置を使用する場合は、事前にトレーニングを受けて下さい。 *This post was created by an AI agent.
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 overview program *This post was created by an AI agent.
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 This page is a quick manual for JEM-2100plus. Contents are subject to change. Please receive training before actually using the equipment. *This post was created … JEM-2100Plus: Electron Diffraction (Basic)
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 Thon’s curve:The phase contrast (granular structure) from amorphous material changes significantly when the amount of defocus is changed. A curve that takes advantage of the fact … JEM-2100Plus: Objective Lens Astigmatism Correction (Fft)
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 *This post was created by an AI agent.
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 Electron diffraction simulation 💡Electron diffraction simulation with Recipro Electron diffraction pattern indexing 💡 CrysTBox (Crystallographic Tool Box) for indexing single-crystal diffraction patterns. *This post was created by … JEM-2100Plus: Software: Electron Diffraction
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 Displaying the log recording page (device dashboard (tentative)) status record 💡 Record the values of the instruments in the equipment and installation room. Operation record 💡 … JEM-2100Plus: Usage Log Recording (Reservation System)
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 File format conversion 💡 Convert GATAN format files (dm3/dm4) to common formats (jpg, etc.). 💡 GMS3/DigitalMicrograph (camera control software) is used for file format conversion. Data … JEM-2100Plus: Observation Data Retrieval
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 Safety 💡 Please attend safety training regarding cryogens and high pressure gas at each department. 💡 Be especially careful when inserting and removing the sample … JEM-2100Plus: Sample Contamination Prevention Device
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 Today’s content *This post was created by an AI agent.
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 Dark field image (on axis) 💡 This page is a quick manual for JEM-2100plus. Contents are subject to change. Please receive training before actually using the … JEM-2100Plus: Dark Field Image Observation
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 This page is a quick manual for JEM-2100plus. Contents are subject to change. Please receive training before actually using the equipment. STEM-BF STEM-DF *This post … JEM-2100Plus: Stem-Bf/Df
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 *This post was created by an AI agent.
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 This page is a quick manual for JEM-2100plus. The contents are subject to change. If you are going to actually use the equipment, please undergo … JEM-2100plus: Restoration and Saving of Deflection System Data
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): February 10, 2025 This trouble has been restored. (As of March 13, 2025) To all users of the Division of Analytical Electron Microscopy, IMR As of February 10, 2025, … [Equipment Trouble] JEM-ARM200F (W Corrector) Operation Suspended (Recurrence / Restored)
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 Converge the electron beam on the specimen and acquire a diffraction pattern from a region narrower than the selected area aperture. NBD/CBD Simplified Method *This … JEM-2100plus: Micro-Area Electron Diffraction
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 Caution Overview of Certification Test *This post was created by an AI agent.
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 This page mainly posts quick information from on-site staff. However, this information is not necessarily authorized by our division. Also, please note that the accuracy … Notice Note: Various Application Forms
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): November 6, 2024 JEM-ARM200F: Basic License The following contents include some that are currently being written. *This post was created by an AI agent.
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 *This post was created by an AI agent.
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 *This post was created by an AI agent.
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 25, 2024 To all users of the Division of Analytical Electron Microscopy, IMR As of June 24, 2024, the TEM (JEM-ARM200F (STEM Corrector)) managed by our division is … [Equipment Trouble] JEM-ARM200F (STEM Corrector) Operation Suspended and Postponement of Regular Seminars
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): August 2, 2026 ■ OverviewDue to the summer closure and regular holidays, the Division of Analytical Electron Microscopy will be closed from August 8 (Sat) to August 17 (Mon), … [August 8-17, 2026] Summer Closure Notice
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): September 4, 2024 To all users, Regular training seminars on TEM managed by our division had been suspended due to equipment troubles and personnel shortages, but since some maintenance … Resumption of Regular TEM Training Seminars
