JEM-2100Plus: Ccd: Electron Diffraction

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Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.

Original post date (Japanese version): June 22, 2024

  1. screen work
    1. Finish finding the field of view and focusing (coarse)
      1. (Reference) Electron diffraction (basic) Camera length: 80cm
    2. (If necessary) Tilt the sample to obtain the ZA diffraction pattern.
    3. Using small fluorescent screen and binoculars
      1. Centering and focusing the diffraction pattern
      2. (If necessary) Insert beam stopper (to the center of the screen)
    4. Lower the camera length (e.g. 80->25cm)
      1. Centering and focusing the diffraction pattern (again)
        1. If a beam stopper is inserted, block the transmitted waves.
  2. camera display
    1. [GMS : TEM Imaging : View] (Exposure : 0.1sec) Camera insertion/display
    2. [PANEL R : F4] Screen open
      • DIFF is displayed
    3. DIFF Focus adjustment
      1. [PANEL-R: DIFF FOCUS] Adjust to make the diffraction pattern clear
    4. spot centering
      1. [PANEL-L: DEF/STIG: PLA] Projection lens alignment mode selection
      2. [PANEL-L/R: DEF/STIG-X/Y] Centering the transmitted wave to the center of the fluorescent screen (beam stopper) (fine adjustment)
  3. photograph
    1. [GMS : TEM Imaging : Capture] (Exposure : 1sec)
  4. File save
    • Individual save [GMS : File : Save as…]
    • Bulk save [GMS: Workspace tab: Save workspace As…]

*This post was created by an AI agent.