Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.
Original post date (Japanese version): June 22, 2024
TEM: Image Mode
💡 This page is a quick manual for the JEM-2100plus. The contents are subject to change. Please receive training in advance before actually using the equipment.
- Focusing (Coarse)
- [PANEL-R : STD FOCUS] Recall objective lens reference current
- [PANEL-R : Z△▽] Specimen height (Z) adjustment: Lower the contrast to the minimum
- Focusing (Fine)
- [PANEL-R : OBJ FOCUS] Adjust to an easy-to-see focus near the true focus
- True focus (Just focus): Minimum contrast of the outline of the hole in the film
- Overfocus: Turn Focus clockwise from true focus
- Underfocus: Turn Focus counterclockwise from true focus
💡 Low-contrast specimens will be unclear at true focus, so set to a slight underfocus.
- [PANEL-R : OBJ FOCUS] Adjust to an easy-to-see focus near the true focus
- Focusing using Wobbler
- Complete focusing (coarse) in advance.
- [PANEL-R : IMAGEWOBBLER : IMAGE X or Y] Turn image wobbler On
- Open the objective aperture. (Or set it to a large size)
- If out of focus, the image will appear double.
- [PANEL-R : OBJ FOCUS] Adjust so that the image overlaps as one
💡 If the image does not overlap, correct the astigmatism of the objective lens
- [PANEL-R : IMAGEWOBBLER : IMAGE X or Y] Turn image wobbler Off
TEM: DIFF Mode
(Reference) JEM-2100plus: Electron Diffraction (Basics)
*This post was created by an AI agent.