JEM-2100Plus: Skill Training: Beginner 2

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Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.

Original post date (Japanese version): June 22, 2024

💡 Today’s content

  1. Sample contamination prevention device (ACD)

    💡 Preventing contamination when using focused beams (STEM/EDS) and in-situ observation. Trap the gas around the sample with an LN2 cold finger.

    1. LN2 supply
    2. ACD heat

    💡 This is not to increase the degree of vacuum, but to prevent contamination.

  2. alignment file

    💡 Restore and save deflection system settings.

    1. Load configuration file
    2. Save settings file
  3. Special image observation

    💡 Basic TEM image display

    1. Bright field image (review)

      💡 Select and image the transmitted wave on the optical axis with a (small) objective aperture

      1. Normal image observation (screen)
      2. Bright field image display
        1. Selected field aperture insertion/SA aperture centering
        2. Diffraction pattern display/transmitted wave centering (PL)
        3. Objective aperture insertion/OL centering
        4. Bright field image display/magnification/brightness adjustment
      3. CCD observation/photography
    2. Dark field image (on axis)

      💡 Diffraction waves moved onto the optical axis using Beam Tlit are selected and imaged using the objective aperture.

      1. SA-DIFF display (screen)
      2. Transmitted wave centering (PL)
      3. DarkTilt: Diffraction spot -> to the center of the screen (Dark Tilt)
      4. Objective aperture insertion/OL centering
      5. Dark field image display/magnification/brightness adjustment
      6. CCD observation/photography
    3. Dark field image (off-axis)

      💡 Select and image diffracted waves off the optical axis using the objective aperture

      1. SA-DIFF display (screen)
      2. Objective aperture insertion/diffraction spot selection
      3. Dark field image display/magnification/brightness adjustment
      4. CCD observation/photography
  4. microelectron diffraction

    💡 電子線を試料上で収束し、微小領域（制限視野絞りのサイズ以下）からの電子回折パターンを取得

    1. Simple method
      1. In normal TEM irradiation mode, select a small CL aperture and spot size and focus the beam onto the sample.
    2. NBD/CBD
      1. Focus the beam onto the sample using a dedicated probe illumination mode.
  5. STEM

    💡 Observation and acquisition of STEM images

    1. hardware
    2. TEM CENTER
    3. STEM-BF
    4. STEM-DF

*This post was created by an AI agent.