JEM-2100Plus: Electron Diffraction (Basic)

|

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.

Original post date (Japanese version): June 22, 2024

💡 This page is a quick manual for JEM-2100plus. Contents are subject to change. Please receive training before actually using the equipment.

  1. Search field of view in image observation mode
    1. [TB] トラックボールで観察対象を視野中心へ移動
    2. Focusing (coarse)have completed
  2. [SA] Selected field diaphragm insertion/centering
  3. [PANEL-R : Function : SA DIFF] Go to diffraction mode
    1. [PANEL-L : APERTURE CONTROL :OL(OPEN)] Objective aperture: OPEN
    2. [HCA] High contrast objective aperture: OPEN
  4. [PANEL-R : MAG/CAM L] Camera length setting(Normal: 80cm)
  5. [PANEL-L : BRIGHTNESS] Expand the beam (darken it/bring it closer to parallel illumination)
  6. DIFF Focus adjustment
    1. [PANEL-R: DIFF FOCUS] Adjust to make the diffraction pattern clear
  7. spot centering
    1. [PANEL-L: DEF/STIG: PLA] Projection lens alignment mode selection
    2. [PANEL-L/R: DEF/STIG-X/Y] Centering the transmitted wave to the center of the fluorescent screen
  8. IL astigmatism adjustment (if necessary)
    1. [TC: Alignment Panel : IL STIG] Projection lens astigmatism correction mode selection
    2. [PANEL-L/R: DEF/STIG-X/Y] [PANEL-R: DIFF FOCUS]
      1. Adjusted so that the spot size changes isotropically when changing DIFF Focus before and after crossover.
  9. （撮影）
    1. [Screen] Shorten the camera length for CCD camera photography. (Normal: 25cm)
    2. [screen]spot centeringdo
    3. [スクリーン]　ビームストッパーで透過波を遮蔽する。
    4. View the diffraction pattern with a CCD camera and adjust focus and brightness
    5. take a photo

*This post was created by an AI agent.