Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): October 24, 2024 To all users of the Division of Analytical Electron Microscopy, IMR As of October 21, 2024, the TEM (JEM-ARM200F (W Corrector)) managed by our division is … [Equipment Trouble] JEM-ARM200F (W Corrector) Operation Suspended
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): July 10, 2024 Currently, the enhanced specification double-tilt Be holder for JEM-ARM200F (W Corrector) is malfunctioning. Repairs completed. (August 23, 2024) *This post was created by an AI agent.
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): September 4, 2024 To all users, We are pleased to announce that the maintenance (electron gun replacement) for the JEM-ARM200F (STEM Corrector) has been completed and the equipment is … JEM-ARM200F（STEM）：Restored
Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 10, 2025 Thank you for always using the equipment at the Division of Analytical Electron Microscopy, IMR.Currently, there are restrictions on the use of the following equipment due … Notice of Partial Equipment Usage Restrictions (Updated 2025-7)
*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* Overview The Division of Analytical Electron Microscopy has been using an AI agent to help update this website. Updates had often been delayed due to staff shortages, but AI assistance now allows us to … Website Updates Using an AI Agent
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*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* [Notice / Service Discontinuation] *Please note that this post contains outdated information.* MacTempasX is a Mac-exclusive software and is currently out of operation / no longer running in our facility. For TEM/STEM simulations and … MacTempasX Now Available
*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* ■ Overview Following the planned power outage in the Katahira area (August 2, 2026), a startup error caused by a chiller cooling malfunction (high cooling water temperature) occurred in JEM-ARM200F(W), which had been out … [Equipment Trouble – Restored] Temporary Suspension of JEM-ARM200F(W) Operation
*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* [Notice / Current Status] *Please note that this post contains outdated information.* The version currently installed (Version 9) is not officially supported on Windows 11 (although it may still function to some extent). For … CrystalMaker / SingleCrystal Now Available
This page has been translated by AI and may contain errors. The Japanese version is the official document. ⚠️ Note: This post is a tentative guide (stub) for staff. The contents may contain unconfirmed descriptions that are subject to change or correction. Although general users may view this post, this post is not an official … Data and Network Usage Guide (SSO/NAS/Nextcloud/FileSender/Camera Stream)
This page has been translated by AI and may contain errors. The Japanese version is the official document. You can view the desktop of instrument control PCs managed by our division via the internal LAN. How to Use VNC in the Division of Analytical Electron Microscopy Level 1: Instrument Control PC to Data Extraction PC … How to Use VNC (Tentative Version)
This page has been translated by AI and may contain errors. The Japanese version is the official document. This page includes information regarding the new operational system starting from FY2025, and some details are still under consideration. Since it is published tentatively for quick information sharing, the contents are subject to change. If you have … Frequently Asked Questions (FAQ) regarding the Use of the Division of Analytical Electron Microscopy
AI-generated English translation — it may contain errors. The Japanese page is the authoritative version. The Application Navigator displayed below is currently provided in Japanese. This page was created by an AI agent.
AI-generated English translation — it may contain errors. The Japanese page is the authoritative version.The following are the agreement items for applications to use the Division of Analytical Electron Microscopy, IMR under the analysis-facility framework. They may be amended as needed (current as of April 30, 2025). The analysis-facility framework is limited to Tohoku University … Agreement Items for Usage Applications
AI-generated English translation — it may contain errors. The Japanese page is the authoritative version.This provisional page includes guidance on the new operating structure from FY2025. Some items remain under consideration and may change; please contact the Division of Analytical Electron Microscopy, IMR if you have questions. Provisional version: April 5, 2025 These guidelines establish … Guidelines for Use of the Division of Analytical Electron Microscopy, IMR
AI-generated English translation — it may contain errors. The Japanese page is the authoritative version. Guide to Using Our Facilities Before applying to use the equipment or support services of the Division of Analytical Electron Microscopy, IMR, please read the following. See the detailed guide. 1. A usage application is required To use our equipment … A Brief Guide to Using the Division of Analytical Electron Microscopy, IMR
Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version. Dear users, The camera installed on the JEM-2100plus transmission electron microscope managed by the Division (Room 103, Building 3, Katahira Campus) has been upgraded from a CCD camera to a JEOL SightSKY CMOS camera. The update … Camera Upgrade for JEM-2100plus
Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version. Dear users, From October 1, 2026, the Shared Equipment Use Support Program for Early-Career Researchers will change. For details, see the program page (Tohoku University access only). Under the revision, support will be limited to equipment … Revision to the Guidelines for the Shared Equipment Use Support Program for Early-Career Researchers
Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version. J2DM — JEOL SightSky TIFF to Gatan DM3/DM4 Converter J2DM is a standalone tool that converts TIFF images saved by JEOL SightSky into native .dm3 or .dm4 files for Gatan DigitalMicrograph (GMS 3). Please use it … Tool Introduction: J2DM
Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version. Overview Manufacturer repairs of the enhanced double-tilt specimen holder for the JEM-ARM200F (W collector) have been completed. The holder is now available for normal use. Details Equipment: enhanced double-tilt specimen holder for the JEM-ARM200F (W collector). … Repair Completed: Specimen Holder for JEM-ARM200F-W
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Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version. Overview Gatan completed repairs on July 3, 2026, to resolve faults that had continuously affected use of the Enfinium EELS detector installed on the JEM-ARM200F-S (STEM collector). Details Equipment: Enfinium EELS detector on the JEM-ARM200F-S (STEM … Repair Completed: Enfinium EELS Detector for JEM-ARM200F-S
Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version. The Division of Analytical Electron Microscopy, IMR provides several convenient web services for storing and transferring experimental data and remotely checking equipment screens. All use one account, called Common Login. This page outlines the available services … Shared Login for the Division of Analytical Electron Microscopy, IMR
Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version. The Division of Analytical Electron Microscopy, IMR provides several web services—including equipment NAS, public NAS, Nextcloud, FileSender, and equipment-screen streaming—to people with a Common Login account. You can apply for an account from this page. Please … Application for a Shared Login Account
Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version. Overview The Division of Analytical Electron Microscopy, IMR will be closed because of the scheduled power outage in the Katahira Area on August 2, 2026. Schedule July 31, 2026 (Friday): equipment shutdown. August 2, 2026 (Sunday), … Closure Notice: Scheduled Power Outage in the Katahira Area (July 31–August 3, 2026)
AI translation noticeThis page was translated by AI and may contain errors. The Japanese page is the authoritative version. Summary The Division of Analytical Electron Microscopy, IMR, a division of Analytical Research Core for Advanced Materials (ARCAM), will be closed from Saturday, August 8 through Monday, August 17, 2026, for the summer recess and regular … [August 8-17, 2026] Summer Closure Notice
