*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.*
Overview
The Division of Analytical Electron Microscopy has been using an AI agent to help update this website. Updates had often been delayed due to staff shortages, but AI assistance now allows us to update the site far more efficiently, and we are working through a broader reorganization of the site, including expanding equipment introduction pages and reorganizing the Equipment List page.
Details
– New equipment introduction pages have been created for equipment that was already listed on the Equipment List page but did not yet have a dedicated introduction page, based on manuals and specification information.
– The Equipment List page itself has also been reorganized, including consistent formatting, added funding-source/origin information, and improved navigation.
Recently created or updated pages (examples):
– Equipment List
– Transmission Electron Microscope JEOL JEM-2100Plus
– Focused Ion Beam System Thermo Fisher Scientific Versa 3D
– Focused Ion Beam System Thermo Fisher Scientific Quanta 3D
– Plasma Focused Ion Beam System TESCAN AMBER X
– Low-Energy Milling System Technoorg Linda Gentle Mill 3
– Analytical Electron Microscope Topcon EM-002B
https://www.aem.imr.tohoku.ac.jp/en/%e8%a3%85%e7%bd%ae%e4%b8%80%e8%a6%a7/002b/
– Transmission Electron Microscope JEOL JEM-2000EXII
https://www.aem.imr.tohoku.ac.jp/en/%e8%a3%85%e7%bd%ae%e4%b8%80%e8%a6%a7/2000exii/
– Ion Slicer JEOL EM-09100IS
https://www.aem.imr.tohoku.ac.jp/en/%e8%a3%85%e7%bd%ae%e4%b8%80%e8%a6%a7/%e3%82%a4%e3%82%aa%e3%83%b3%e3%82%b9%e3%83%a9%e3%82%a4%e3%82%b5%e3%83%bc/
Notes
As these pages were created with AI assistance, actual equipment configurations or specifications may occasionally differ. If you notice any issues, please contact us using the information below.
Contact
Division of Analytical Electron Microscopy, IMR