お知らせ

*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* ■ Overview The Division of Analytical Electron Microscopy, IMR (Room 1-105) will be closed during the period shown below. ■ Details – Closure period: September 19 (Sat) – September 24 (Thu), 2026 – This … Notice of Temporary Closure (September 19-24, 2026)

*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* In TEM observation, mounting thin-foil specimens prepared by FIB (Focused Ion Beam) onto a TEM holder is one of the most nerve-wracking tasks. If a specimen is accidentally damaged or lost during mounting on … [Facility & Tool Introduction] Safe and Reliable Sample Mounting on TEM Holders: Introducing the Manual Manipulator to Prevent Failure Risks

*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* We have experimentally launched a chatbot (AEM Chatbot Beta) on the official website of the Division of Analytical Electron Microscopy, IMR (https://www.aem.imr.tohoku.ac.jp/) to support website navigation and user inquiries. ■ Overview A chat widget … Notice of Experimental Launch: AEM Chatbot (Beta) on Our Website

*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* This guide explains how to set up and use your Common Login Account (Single Sign-On / SSO) to securely access various services provided by the Division of Analytical Electron Microscopy, IMR, and the Analytical … How to Use the Common Login Account

*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* During an inspection around 8:00 AM on Saturday, August 8, 2026, we confirmed that two Transmission Electron Microscopes (TEMs) in Room 1-105 had completely shut down, along with errors occurring on several other instruments. … [Equipment Trouble] Notice of Equipment Shutdown Due to Lightning Power Fluctuation and Potential Impact on Machine Time After Summer Recess

*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* ■ Overview The Diamond Wire Saw, which had been rendered practically unusable due to abrasive wear on the wire, has been restored to service following a wire replacement completed today. ■ Details – Equipment: … Diamond Wire Saw Service Restored (Wire Replacement Completed)

*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* The Division of Analytical Electron Microscopy, IMR is trialing a new feature called "Equipment Screen Streaming," which lets you view the control PC screens of experimental equipment in real time through your web browser. … Live Streaming of Equipment Screens (Trial Operation)

*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* Overview The Division of Analytical Electron Microscopy has been using an AI agent to help update this website. Updates had often been delayed due to staff shortages, but AI assistance now allows us to … Website Updates Using an AI Agent

*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* ■ Overview Following the planned power outage in the Katahira area (August 2, 2026), a startup error caused by a chiller cooling malfunction (high cooling water temperature) occurred in JEM-ARM200F(W), which had been out … [Equipment Trouble – Restored] Temporary Suspension of JEM-ARM200F(W) Operation

*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* [Notice / Current Status] *Please note that this post contains outdated information.* The version currently installed (Version 9) is not officially supported on Windows 11 (although it may still function to some extent). For … CrystalMaker / SingleCrystal Now Available

Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version. Dear users, From October 1, 2026, the Shared Equipment Use Support Program for Early-Career Researchers will change. For details, see the program page (Tohoku University access only). Under the revision, support will be limited to equipment … Revision to the Guidelines for the Shared Equipment Use Support Program for Early-Career Researchers

Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version. Overview Manufacturer repairs of the enhanced double-tilt specimen holder for the JEM-ARM200F (W collector) have been completed. The holder is now available for normal use. Details Equipment: enhanced double-tilt specimen holder for the JEM-ARM200F (W collector). … Repair Completed: Specimen Holder for JEM-ARM200F-W

Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version. Overview Gatan completed repairs on July 3, 2026, to resolve faults that had continuously affected use of the Enfinium EELS detector installed on the JEM-ARM200F-S (STEM collector). Details Equipment: Enfinium EELS detector on the JEM-ARM200F-S (STEM … Repair Completed: Enfinium EELS Detector for JEM-ARM200F-S

Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version. The Division of Analytical Electron Microscopy, IMR provides several convenient web services for storing and transferring experimental data and remotely checking equipment screens. All use one account, called Common Login. This page outlines the available services … Shared Login for the Division of Analytical Electron Microscopy, IMR

Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version. Overview The Division of Analytical Electron Microscopy, IMR will be closed because of the scheduled power outage in the Katahira Area on August 2, 2026. Schedule July 31, 2026 (Friday): equipment shutdown. August 2, 2026 (Sunday), … Closure Notice: Scheduled Power Outage in the Katahira Area (July 31–August 3, 2026)

AI translation noticeThis page was translated by AI and may contain errors. The Japanese page is the authoritative version. Summary The Division of Analytical Electron Microscopy, IMR, a division of Analytical Research Core for Advanced Materials (ARCAM), will be closed from Saturday, August 8 through Monday, August 17, 2026, for the summer recess and regular … [August 8-17, 2026] Summer Closure Notice