お知らせ

*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* ■ Overview Following the planned power outage in the Katahira area (August 2, 2026), a startup error caused by a chiller cooling malfunction (high cooling water temperature) occurred in JEM-ARM200F(W), which had been out … [Equipment Trouble – Restored] Temporary Suspension of JEM-ARM200F(W) Operation

This page has been translated by AI and may contain errors. The Japanese version is the official document. We have introduced CrystalMaker and SingleCrystal from CrystalMaker Software Ltd. They allow crystal structure modeling and electron diffraction pattern simulation, respectively. If you wish to use them, please contact the Division of Analytical Electron Microscopy. Reference: http://www.crystalmaker.com/ … CrystalMaker / SingleCrystal Now Available

Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version. Dear users, From October 1, 2026, the Shared Equipment Use Support Program for Early-Career Researchers will change. For details, see the program page (Tohoku University access only). Under the revision, support will be limited to equipment … Revision to the Guidelines for the Shared Equipment Use Support Program for Early-Career Researchers

Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version. Overview Manufacturer repairs of the enhanced double-tilt specimen holder for the JEM-ARM200F (W collector) have been completed. The holder is now available for normal use. Details Equipment: enhanced double-tilt specimen holder for the JEM-ARM200F (W collector). … Repair Completed: Specimen Holder for JEM-ARM200F-W

Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version. Overview Gatan completed repairs on July 3, 2026, to resolve faults that had continuously affected use of the Enfinium EELS detector installed on the JEM-ARM200F-S (STEM collector). Details Equipment: Enfinium EELS detector on the JEM-ARM200F-S (STEM … Repair Completed: Enfinium EELS Detector for JEM-ARM200F-S

Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version. The Division of Analytical Electron Microscopy, IMR provides several convenient web services for storing and transferring experimental data and remotely checking equipment screens. All use one account, called Common Login. This page outlines the available services … Shared Login for the Division of Analytical Electron Microscopy, IMR

Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version. Overview The Division of Analytical Electron Microscopy, IMR will be closed because of the scheduled power outage in the Katahira Area on August 2, 2026. Schedule July 31, 2026 (Friday): equipment shutdown. August 2, 2026 (Sunday), … Closure Notice: Scheduled Power Outage in the Katahira Area (July 31–August 3, 2026)

AI translation noticeThis page was translated by AI and may contain errors. The Japanese page is the authoritative version. Summary The Division of Analytical Electron Microscopy, IMR, a division of Analytical Research Core for Advanced Materials (ARCAM), will be closed from Saturday, August 8 through Monday, August 17, 2026, for the summer recess and regular … [August 8-17, 2026] Summer Closure Notice