Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version.
Overview
Gatan completed repairs on July 3, 2026, to resolve faults that had continuously affected use of the Enfinium EELS detector installed on the JEM-ARM200F-S (STEM collector).
Details
- Equipment: Enfinium EELS detector on the JEM-ARM200F-S (STEM collector).
- Resolved: The 2.5 mm aperture could not be inserted. The Analog/Solenoid Board was replaced, and insertion of both the 2.5 mm and 5 mm apertures was confirmed.
- Resolved: An unknown spectrum appeared during Energy Shift. Adjustment at 200 kV and 80 kV confirmed that the abnormal spectrum no longer appears.
- Further point to note: During this work, a Fast Drift Tube (2200 V) error sometimes prevented GMS from starting. The condition may be gradually worsening, although GMS often starts normally. We will continue to monitor it and consider additional maintenance.
If you encounter this issue or have other concerns, please contact the Division of Analytical Electron Microscopy, IMR. We apologize for the inconvenience.
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