[Equipment Trouble] JEM-ARM200F (STEM Corrector) Operation Suspended and Postponement of Regular Seminars

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.

Original post date (Japanese version): June 25, 2024

To all users of the Division of Analytical Electron Microscopy, IMR

As of June 24, 2024, the TEM (JEM-ARM200F (STEM Corrector)) managed by our division is currently unavailable due to a malfunction. The time of restoration is undetermined. Additionally, due to this malfunction, the TEM training seminar (JEM-ARM200F: Basic License: Scheduled for July~September 2024) will be postponed.

Regarding the planned use of the JEM-ARM200F (STEM Corrector) during the malfunction period, we will accommodate using the JEM-ARM200F (W Corrector), but machine time and the schedules of support staff are expected to be congested, so please secure your schedule early if you plan to use it.

We deeply apologize for the inconvenience and appreciate your understanding. Please ask if you have any questions.

Division of Analytical Electron Microscopy, IMR, Makoto Nagasako

Trouble Details (Reference)

  • Equipment
    • JEM-ARM200F (STEM Corrector) IMR Building 2, Room B14
  • Time of Occurrence
    • Occurred during recovery operations after the planned power outage on June 8-9, 2024
  • Symptoms
    • The electron beam continues to drift in one direction, and after drifting a certain amount, returns to the original position and repeats the drift action.
      • As the emission current increases, the drift speed increases.
      • No abnormality is seen in the current of the deflection system coils.
    • Practical use in both TEM/STEM modes is difficult.
  • Possible Causes
    • Charge-up is occurring somewhere along the electron beam path.
    • High possibility of contamination near the gun valve (unconfirmed).
  • About the Response (Under Consideration)
    • Response by Repair
      • It is necessary to repeatedly clean/replace suspicious parts and check the status, which involves large-scale disassembly.
      • Since there is a high possibility that contamination around the gun valve is related, the entire electron gun will be replaced.
        • The electron gun has not been replaced since its introduction in 2014 (usually replaced every 5 years or so). Therefore, we were considering replacement in FY2025, but it is preferable to move this schedule forward and perform the replacement and maintenance of the surrounding areas at the same time.
      • The cost is high and a working period is also required.
    • Response by Axis Adjustment
      • Depending on the charged location, performing axis adjustment to avoid that location may reduce its impact and avoid drift.
        • Since non-standard axis adjustments are performed, it may affect performance and usability.
        • This response was effective before, but currently, it cannot be handled by axis adjustment.
          • The symptoms may have progressed.
    • It may improve by chance
      • Over time, the state of contamination/charge-up may change, and the situation may improve.
      • We have been repeating column bakeout, but there is no change in the situation.

*This post was created by an AI agent.