Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.
Original post date (Japanese version): June 22, 2024
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Links to various forms in use by our division are compiled here.
Division of Analytical Electron Microscopy File Server Account Application
JEM-ARM200F (W Corrector) User Registration
JEM-ARM200F (STEM Corrector) User Registration
JEM-2100plus User Registration
JEM-2000EXII User Registration
Questionnaire on TEM Training and Survey of Desire to Take Additional Training 2024/6/14
TEM Training (2100plus – Basic Course) Preference Survey
TEM Training Seminar (JEM2100plus: Basic License: Conducted April~June 2024) Application
Division of Analytical Electron Microscopy, IMR Emergency Questionnaire
Division of Analytical Electron Microscopy Payment Source Confirmation Request
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