*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.*
The Division of Analytical Electron Microscopy, IMR conducted periodic maintenance and reconfigured the instrument setup for the JEM-002B analytical transmission electron microscope (Topcon EM-002B, Room 1-105) between October 19 and 23, 2026.
Along with replacing consumable parts, auxiliary equipment was streamlined during this maintenance. Please be advised that Energy Dispersive X-ray Spectroscopy (EDS) analysis and Scanning Transmission Electron Microscopy (STEM) observation are no longer available on the JEM-002B. We appreciate your understanding and cooperation.
1. Sputter Ion Pump (SIP) Replacement
To sustain ultra-high vacuum in the microscope column, the sputter ion pump (SIP) was replaced with a new unit as the previous pump reached the end of its operational lifespan. This replacement ensures the long-term integrity and reliability of the ultra-high vacuum pumping system.
2. Decommissioning of EDS Detector and STEM Units
To ensure long-term sustainability and operational efficiency, the following auxiliary units were decommissioned and removed:
- Removal of the EDS Detector:
The installed EDS detector was a liquid-nitrogen-cooled system requiring continuous liquid nitrogen replenishment and rigorous routine management. Considering detection sensitivity constraints and a decline in usage frequency in recent years, the detector was decommissioned. Consequently, EDS point analysis and elemental mapping on the JEM-002B have been discontinued. - Removal of STEM-Related Equipment:
In conjunction with the EDS removal, the STEM control and detection hardware was also removed. Previously, slight electrical noise originating from the STEM circuitry induced minute electron beam vibrations. Decommissioning this hardware eliminated the beam vibration, resulting in improved beam stability during TEM imaging. Please note that STEM imaging is also no longer available.
3. Post-Maintenance Performance Verification
In post-maintenance performance testing, high-quality TEM images were verified. Lattice fringe imaging demonstrated a resolution of approximately 1 Å (0.1 nm).
*Note: The resolution mentioned above represents an empirical result observed during post-maintenance verification and does not revise or constitute a manufacturer-guaranteed baseline resolution specification.
4. Summary of Currently Available Capabilities
Following this reconfiguration, the functional capabilities of the JEM-002B are summarized below:
| Technique / Function | Availability | Notes |
|---|---|---|
| High-Resolution TEM Imaging | Available | ~1 Å lattice imaging confirmed; highly suitable for magnetic materials |
| CCD Digital Image Recording | Available | Acquisition of TEM images and electron diffraction patterns |
| Precession Electron Diffraction (PED) | Available | Acquisition of quasi-kinematical diffraction patterns for structural analysis |
| Selected Area Electron Diffraction (SAED) | Available | Crystallographic orientation and lattice parameter analysis |
| EDS Elemental Analysis (Point / Mapping) | Unavailable | Discontinued due to detector removal |
| STEM Observation (BF / DF) | Unavailable | Discontinued due to hardware removal |
5. Alternative Instruments for EDS Elemental Analysis
Users requiring microarea EDS analysis or elemental mapping in conjunction with TEM observation are encouraged to consider the following EDS-equipped instruments available at our facility:
- JEM-2100Plus: General-purpose 200 kV TEM equipped with an EDS detector (available for self-operation upon obtaining a basic operator license).
- JEM-ARM200F (Double Corrector / STEM Corrector): High-performance analytical instruments supporting high-sensitivity EDS analysis and atomic-resolution STEM imaging.
For detailed specifications, licensing requirements, and application procedures for each instrument, please consult the Equipment List page or individual instrument pages. If you have questions regarding analytical feasibility or specimen suitability, please contact our technical staff.