Division of Analytical Electron Microscopy, IMR

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.

Original post date (Japanese version): October 28, 2023

The Division of Analytical Electron Microscopy, IMR is a division of the Analytical Research Core for Advanced Materials (ARCAM), Institute for Materials Research (IMR), Tohoku University, providing technical support for nano/mesoscale microstructural observation, crystal structure analysis, and chemical composition analysis using transmission electron microscopes.

Members

Analytical Research Core for Advanced Materials (ARCAM)

Core DirectorProfessor Eiji Akiyama

Division of Analytical Electron Microscopy, IMR

Assistant ProfessorMakoto NagasakoTohoku University Researcher Profile – Makoto Nagasako
MNagasako · GitHub
Senior Technical StaffVacant
Technical Assistant1 person
ARIM Project Unit(6 people)

History

The Analytical Research Core for Advanced Materials (ARCAM) was established by merging two predecessors: one responsible for chemical analysis and the other responsible for electron microscopy.

1954“Common Analysis Room” established. Responsible for the development and improvement of chemical analysis methods (one of the predecessors of ARCAM, the origin of the current Elemental Analysis Division).
1984“Division of Analytical Electron Microscopy” established. Initially operated only by technical staff (the other predecessor of ARCAM).
1998The Division of Analytical Electron Microscopy came under the umbrella of the Common Analysis Room, and “ARCAM” was established.
2015“Analytical Research Core for Advanced Materials Regulations” enacted. The Elemental Analysis Division and the Division of Analytical Electron Microscopy were separated as formal divisions.
2022Analytical Research Core for Advanced Materials Regulations revised. In conjunction with participation in the Ministry of Education, Culture, Sports, Science and Technology’s “Advanced Research Infrastructure for Materials (ARIM)” project (started in FY2021), the ARIM Project Unit was newly established, organizing into the current three-division structure.
PresentAs a research infrastructure within the institute and university, it supports materials research through contracted elemental analysis of inorganic materials, technical support using transmission electron microscopes, and the development of analytical technologies. As part of its operations, it also participates in the Ministry of Education, Culture, Sports, Science and Technology’s “Advanced Research Infrastructure for Materials (ARIM)” project, providing a place for shared equipment use outside the university.

Organizational Structure

The “Analytical Research Core for Advanced Materials (ARCAM)” is a research support organization established based on the Tohoku University Institute for Materials Research Analytical Research Core for Advanced Materials Regulations, and consists of the following three divisions.

Elemental Analysis Division

Responsible for elemental analysis of materials by ICP optical emission spectrometry, ICP mass spectrometry, atomic absorption spectrometry, gas analysis (carbon, sulfur, oxygen, nitrogen, hydrogen), X-ray fluorescence analysis, etc.

Division of Analytical Electron Microscopy, IMR

Responsible for nano/mesoscale microstructural observation, crystal structure analysis, and chemical composition analysis using transmission electron microscopes.

ARIM Project Unit

Provides a place for shared equipment use for researchers inside and outside the university as an implementing organization of the Ministry of Education, Culture, Sports, Science and Technology’s “Advanced Research Infrastructure for Materials (ARIM)” project.

The operations of the Core are managed by the Core Director (a professor of this institute, 2-year term), and matters related to organization and operation are deliberated by the Steering Committee chaired by the Core Director. For details on eligibility for use, application methods, usage fees, etc. for each division, please see the Usage Guide page.

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