Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version.
The contents of this page are old. The current FAQ is Click here.
Q1) I would like to consult about equipment usage (TEM observation/TEM sample preparation), who should I contact?
A. We accept inquiries by phone/email/inquiry form. For more information, please see Contact page.
If you wish to come directly to the office, please contact us in advance.
Q2) Please tell me the reception hours.
A. Technical staff is available from 8:30 to 12:00 and from 13:00 to 17:15 on weekdays. As teachers work at their discretion, their working hours are not fixed, but are generally from 9:00 to 18:00.
In principle, the electron microscope can be used from 10:00 to 17:00 due to the start-up, adjustment, and shutdown of the equipment. If the user is able to complete the startup adjustment and completion work himself/herself, use outside of business hours is possible (individual permission required).
Reservations for machine time can be made online 24 hours a day. (Registration required)
Q3) Please tell me about the usage procedure.
A. Please see here.
Q4) How much does it cost?
A. For the price list, please see here.
Q5) I would like to consult or make a request regarding sample preparation.
A. In our laboratory, we perform sample preparation using ion polishing and FIB. You can also use the polishing machines installed in our room.
It is also possible for users to perform polishing themselves. For first-time users, we will provide polishing instructions. If you are interested, we also accept requests for sample preparation, so please contact us.
Q6) I am new to or new to electron microscopy, is that okay?
A. For those who are inexperienced with operating an electron microscope or for the first time, we will explain the operation method and conduct observations together.
Reference: Training
Q7) Is high-resolution observation and EDS analysis possible?
A. Each can be performed with the following equipment.
- High resolution TEM/TEM-EDS/STEM-EDS: JEM-ARM200F, JEM-2100plus, EM-002B
- High resolution STEM: JEM-ARM200F
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