*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.*
Overview
The JEOL JEM-ARM200F (STEM-Corrector configuration) is a 200 kV Cold Field Emission Gun (Cold-FEG) atomic-resolution scanning transmission electron microscope equipped with a probe spherical aberration corrector for the illumination system.
Featuring a sub-angstrom focused probe, it delivers high S/N ratio atomic-column STEM imaging (HAADF, ABF, BF) and atomic-scale microanalysis using integrated EDS and Gatan Enfinium EELS systems.
Features
- Probe Spherical Aberration Corrector (STEM Cs Corrector): Corrects illumination spherical aberration to form a sub-angstrom electron probe with high beam current, enabling atomic-resolution imaging and elemental mapping.
- Cold Field Emission Gun (Cold-FEG): Provides ultra-high brightness and narrow energy spread, supporting high-resolution Electron Energy Loss Spectroscopy (EELS) and chemical state analysis.
- Atomic-Scale Microanalysis (EDS / EELS): Integrated with high-sensitivity EDS detectors and the Gatan Enfinium EELS system for micro-area chemical composition and electronic structure evaluation.
- Simultaneous Multi-Channel STEM: Simultaneous acquisition of Z-contrast HAADF, light-element sensitive ABF, and bright-field BF STEM images.
Specifications
[Specification Notice]
Actual equipment configurations or specifications may differ from standard manual specifications. Please consult the equipment manager for details regarding current capabilities and conditions of use.
Actual equipment configurations or specifications may differ from standard manual specifications. Please consult the equipment manager for details regarding current capabilities and conditions of use.
| Manufacturer | JEOL Ltd. |
|---|---|
| Model | JEM-ARM200F (STEM-Corrector) |
| Electron Source | Cold Field Emission Gun (Cold-FEG) |
| Accelerating Voltage | 200 kV, 80 kV |
| Cs Corrector | Illumination/Probe Cs Corrector |
| Resolution (200 kV) | STEM-HAADF resolution: 100 pm |
| Max Specimen Tilt | X ±35° / Y ±30° |
| Analytical Capabilities | STEM imaging (HAADF/LAADF/ABF/BF), STEM-EDS elemental analysis, STEM-EELS (Gatan Enfinium) chemical state analysis |
| Location | Room 2-B14 |
Manuals & Guidelines
[Manual (Campus Access Only)]
📄 Gatan Enfinium EELS Owner’s Manual (PDF, campus access only)