JEM-2100Plus: Dark Field Image Observation

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Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.

Original post date (Japanese version): June 22, 2024

Dark field image (on axis)

💡 This page is a quick manual for JEM-2100plus. Contents are subject to change. Please receive training before actually using the equipment.

  1. Display the statue in the usual way.
    • (Reference) Image observation diffraction (basic) Focus
  2. [PANEL-L: DEF/STIG: BRIGHT TILT] or [TC: Alignment Panel: Deflector: Bright Tilt] Bright field irradiation mode selection
  3. [PANEL-R : Function : SA DIFF] Go to diffraction mode
    1. DIFF display on screen
      • Display DIFF in the usual way. (Reference) Electron diffraction (basic)
    2. Camera length specification
    3. spot centering
    4. DIFF display on camera
    5. Mark the position of the transmitted wave (center of the fluorescent screen)
  4. Preparation (DarkTilt reset)
    1. [TEM Center: Top menu] Control → Illumination System
      1. Illumination System Controller (for JEM Administrators) is displayed.
    2. [TC: Illumination System Controller: Image Field: Dark1~Dark5] Select DarkTilt number
    3. [TC: Alignment Panel: Deflector: Dark Tilt] Select dark field irradiation mode.
    4. [TC: Alignment Panel:Neutralize Selected Alignment]Reset DarkTilt (match BrightTilt)
      • Confirm that the transmitted wave is at the center of the fluorescent screen (mark position)
    5. Reset all necessary DarkTilts.
  5. BeamTiltをメモリ
    1. [TC: Illumination System Controller: Image Field: Dark1~Dark5] Select DarkTilt number
    2. [PANEL-L/R: DEF/STIG-X/Y] Use Beam-Tilt to move the diffraction spot used for imaging to the position of the transmitted wave (center of the fluorescent screen).
    3. Set all necessary DarkTilts.
  6. Insert OL aperture
    1. [TC: Alignment Panel: Deflector: Bright Tilt] Bright field irradiation mode selection
    2. Insert the smallest OL
    3. Center the OL (extend the exposure time if it is difficult to see)
  7. show statue
    1. [PANEL-R : Function : MAG1] Go to image observation mode
      1. [PANEL-L: DEF/STIG: BRIGHT TILT] or [TC: Alignment Panel: Deflector: Bright Tilt] Bright field irradiation mode selection
      2. remove SA
      3. A bright field image is displayed (quite dark at this point)
    2. [PANEL-L: BRIGHTNESS] Focus the beam to a brightness that makes it easy to observe bright-field images
    3. Display image with camera
      1. [GMS : TEM Imaging : View] (Exposure : 0.1sec) Camera insertion/(BF) display
      2. [PANEL-R: DIFF FOCUS] Focusing
    4. [TC: Illumination System Controller: Image Field: Dark1~5] Select DarkTilt number
      1. DF is displayed
  8. photograph
    1. [GMS : TEM Imaging : Capture] (Exposure : 5~10sec)

Dark field image (off-axis)

  1. Display the statue in the usual way.
    • (Reference) Image observation diffraction (basic) Focus
  2. [PANEL-R : Function : SA DIFF] Go to diffraction mode
    • Display DIFF in the usual way. (Reference) Electron diffraction (basic)
  3. Diffraction wave selection
    1. [PANEL-L: BRIGHTNESS] Narrow down the beam to a brightness that makes it easy to observe DIFF.
      1. Also set DIFF Focus
    2. Insert OLA (electric) or HCA (manual)
    3. Choose a small enough aperture (usually the smallest)
    4. Move the aperture to the position of the diffracted wave
  4. show statue
    1. [PANEL-R : Function : MAG1] Go to image observation mode
    2. Remove [SA]
      1. A dark field image is displayed.
    3. [GMS : TEM Imaging : View] (Exposure : ~1sec) Camera insertion/(DF) display
  5. photograph
    1. [GMS : TEM Imaging : Capture] (Exposure : 5~10sec)

*This post was created by an AI agent.