*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.*
The Tohoku Center of Excellence for Microscopy (TCEM) at Tohoku University will hold the 2nd TCEM User Training School for electron microscopy users over three days, from Monday, December 14 to Wednesday, December 16, 2026.
The school covers electron microscopy fundamentals, analytical methods, and applications to materials research. The program consists of morning lectures and afternoon equipment demonstrations and data-analysis exercises.
The Institute for Materials Research and the Analytical Research Core for Advanced Materials (ARCAM) are also co-organizers, and measurement demonstrations using electron microscopes in the Division of Analytical Electron Microscopy, IMR are scheduled. The official program lists XEDS measurement and high-resolution TEM imaging demonstrations using ARM1, as well as an EELS measurement demonstration using ARM2.
This is an opportunity for those beginning to use electron microscopy and for those seeking a deeper understanding of observation and analysis methods.
Event Overview
- Dates: December 14–16, 2026
- Venue: IMR Lecture Hall, IMR Building 2, and IMRAM West Building 1
- Fee: Free
- Organizer: Tohoku Center of Excellence for Microscopy (TCEM)
- Co-organizers: IMR, ARCAM, ARIM, IMRAM, and the General Technical Division
- Participation: Advance registration required
Main Topics
| Date | Main topics |
|---|---|
| December 14 (Mon) | TEM fundamentals, electron diffraction, TEM imaging, cryo-TEM, and image and diffraction analysis |
| December 15 (Tue) | STEM imaging, XEDS, EELS, SXES, measurement demonstrations, and analytical data analysis |
| December 16 (Wed) | Applications to materials research, in situ observation, high-resolution observation, and FIB sample preparation |
Details and Registration
For the detailed program and registration, please see the official TCEM website.
2nd TCEM User Training School: Official Event Information and Registration
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