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Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 Tilt adjustment (Tilt 2-step deflection adjustment) 💡 Adjust the interlocking ratio of the focusing lens deflection coil so that the position does not change even if … JEM-2100Plus: Irradiation System Interlock Ratio Adjustment

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 Electron diffraction simulation 💡Electron diffraction simulation with Recipro Electron diffraction pattern indexing 💡 CrysTBox (Crystallographic Tool Box) for indexing single-crystal diffraction patterns. *This post was created by … JEM-2100Plus: Software: Electron Diffraction

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 This page is a quick manual for JEM-2100plus. Contents are subject to change. Please receive training before actually using the equipment. STEM-BF STEM-DF *This post … JEM-2100Plus: Stem-Bf/Df

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 Dark field image (on axis) 💡 This page is a quick manual for JEM-2100plus. Contents are subject to change. Please receive training before actually using the … JEM-2100Plus: Dark Field Image Observation

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 Safety 💡 Please attend safety training regarding cryogens and high pressure gas at each department. 💡 Be especially careful when inserting and removing the sample … JEM-2100Plus: Sample Contamination Prevention Device

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 Today’s content *This post was created by an AI agent.

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 Displaying the log recording page (device dashboard (tentative)) status record 💡 Record the values ​​of the instruments in the equipment and installation room. Operation record 💡 … JEM-2100Plus: Usage Log Recording (Reservation System)

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 File format conversion 💡 Convert GATAN format files (dm3/dm4) to common formats (jpg, etc.). 💡 GMS3/DigitalMicrograph (camera control software) is used for file format conversion. Data … JEM-2100Plus: Observation Data Retrieval

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 *This post was created by an AI agent.

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 This page mainly posts quick information from on-site staff. However, this information is not necessarily authorized by our division. Also, please note that the accuracy … Notice Note: Various Application Forms

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 Converge the electron beam on the specimen and acquire a diffraction pattern from a region narrower than the selected area aperture. NBD/CBD Simplified Method *This … JEM-2100plus: Micro-Area Electron Diffraction

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 Caution Overview of Certification Test *This post was created by an AI agent.

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): February 10, 2025 This trouble has been restored. (As of March 13, 2025) To all users of the Division of Analytical Electron Microscopy, IMR As of February 10, 2025, … [Equipment Trouble] JEM-ARM200F (W Corrector) Operation Suspended (Recurrence / Restored)

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 💡 This page is a quick manual for JEM-2100plus. The contents are subject to change. If you are going to actually use the equipment, please undergo … JEM-2100plus: Restoration and Saving of Deflection System Data

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): July 10, 2024 Currently, the enhanced specification double-tilt Be holder for JEM-ARM200F (W Corrector) is malfunctioning. Repairs completed. (August 23, 2024) *This post was created by an AI agent.

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): September 4, 2024 To all users, Regular training seminars on TEM managed by our division had been suspended due to equipment troubles and personnel shortages, but since some maintenance … Resumption of Regular TEM Training Seminars

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): August 2, 2026 ■ OverviewDue to the summer closure and regular holidays, the Division of Analytical Electron Microscopy will be closed from August 8 (Sat) to August 17 (Mon), … [August 8-17, 2026] Summer Closure Notice

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): October 24, 2024 To all users of the Division of Analytical Electron Microscopy, IMR As of October 21, 2024, the TEM (JEM-ARM200F (W Corrector)) managed by our division is … [Equipment Trouble] JEM-ARM200F (W Corrector) Operation Suspended

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): November 6, 2024 JEM-ARM200F: Basic License The following contents include some that are currently being written. *This post was created by an AI agent.

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 25, 2024 To all users of the Division of Analytical Electron Microscopy, IMR As of June 24, 2024, the TEM (JEM-ARM200F (STEM Corrector)) managed by our division is … [Equipment Trouble] JEM-ARM200F (STEM Corrector) Operation Suspended and Postponement of Regular Seminars

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 *This post was created by an AI agent.

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 22, 2024 *This post was created by an AI agent.

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): September 4, 2024 To all users, We are pleased to announce that the maintenance (electron gun replacement) for the JEM-ARM200F (STEM Corrector) has been completed and the equipment is … JEM-ARM200F（STEM）：Restored

Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail. Original post date (Japanese version): June 10, 2025 Thank you for always using the equipment at the Division of Analytical Electron Microscopy, IMR.Currently, there are restrictions on the use of the following equipment due … Notice of Partial Equipment Usage Restrictions (Updated 2025-7)

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*Note: This page was translated by AI from the Japanese original. In case of any discrepancy, the Japanese version shall prevail.* [Notice / Service Discontinuation] *Please note that this post contains outdated information.* MacTempasX is a Mac-exclusive software and is currently out of operation / no longer running in our facility. For TEM/STEM simulations and … MacTempasX Now Available

This page has been translated by AI and may contain errors. The Japanese version is the official document. ⚠️ Note: This post is a tentative guide (stub) for staff. The contents may contain unconfirmed descriptions that are subject to change or correction. Although general users may view this post, this post is not an official … Data and Network Usage Guide (SSO/NAS/Nextcloud/FileSender/Camera Stream)

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Notice: This page is an AI-generated English translation and may contain errors. The Japanese page is the authoritative version. The Division of Analytical Electron Microscopy, IMR provides several web services—including equipment NAS, public NAS, Nextcloud, FileSender, and equipment-screen streaming—to people with a Common Login account. You can apply for an account from this page. Please … Application for a Shared Login Account